在原子力顯微鏡的應用上，半接觸式比起其他操作模式有更好的解析度，而微小的作用力也降低對樣本表面破壞的可能性。本研究以半接觸式不容易傷害樣本、造成樣本變形的優點下，發展半接觸式量測樣本的機械性質之方法，經由單次掃描所獲得的相位差資訊與力學模型需要的表面能參數，即可計算樣本的楊氏係數。為了驗證方法正確性，本研究以兩種材料： (1)聚苯乙烯和(2)PC-12類神經細胞作為實驗的樣本。由結果顯示，兩種樣本量測出的楊氏係數之數量級皆與文獻相符，成功建立半接觸式在樣本的力學性質評估之應用方法。

In the applications of atomic force microscopy, the tapping mode has better resolution than the other measurement modes, and the gentle tapping force on the sample surface can reduce the possibility of sample damage. The goal of this study is to develop a tapping mode method to estimate the distribution of mechanical properties of biological materials. By a single scan and based on a mechanical model of the probe driven by the non-conservative force from the intermittent contact force, the Young's modulus of the sample can be calculated from the phase signals and the surface energy due to the adhesion of cell to the probe. Two material samples, namely, polystyrene and PC-12 neuron-like cells are employed to verify the applicability of the method. The results revealed that orders of the magnitude of Young’s modulus of these two samples are consistent with the literature, which indicated that a new method for estimating the distribution of mechanical properties of biological materials is established.

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