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研究生: 王培任
Wang, Pei-ren
論文名稱: 具區塊錫/銀/銅金屬基板之免切割高效率垂直結構氮化鎵系列發光二極體之研製
The fabrication of dicing-free vertical-structured GaN-based high efficient light-emitting diodes with a patterned Sn/Ag/Cu substrate
指導教授: 王水進
Wang, Shui-jinn
學位類別: 碩士
Master
系所名稱: 電機資訊學院 - 微電子工程研究所
Institute of Microelectronics
論文出版年: 2007
畢業學年度: 95
語文別: 中文
論文頁數: 62
中文關鍵詞: 垂直結構免切割發光二極體
外文關鍵詞: vertical-structured, dicing-free, light-emitting diodes
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  • 相對於已商業化以藍寶石基板為主的氮化鎵系列發光二極體,本論文旨在研發高效率之免切割垂直結構金屬基板之氮化鎵系列發光二極體(VM-LED),結合球格陣列構裝(Ball Grid Array Package, BGA)及區塊雷射剝離(Patterned laser lift-off)技術置換藍寶石基板,以解決絕緣的藍寶石基板因散熱不佳、僅已橫向傳導所帶來電流叢聚效應(Current crowding effect)以及兩電極在同一面造成較小發光面積等問題,進而提升光輸出功率以及發光效率,並且克服了金屬基板切割時的剪應力及金屬噴濺所造成元件漏電問題。再者,為了提升區塊錫/銀/銅金屬基板上保留雷射剝離後磊晶的完整性,適度將元件剝離尺寸小於區塊錫/銀/銅金屬基板可大幅提升剝離後磊晶完整的良率,經實驗結果證實,VM-LED元件亦可得到相當於整面電鍍金屬基板之發光效率的增加。
    另外,使用乾蝕刻(Dry-etching)-電感耦合電漿(ICP)與化學蝕刻(Chemical etching)-氫氧化鉀(KOH)溶液進行n-GaN表面處理之垂直元件製作,由實驗結果顯示,以24 mil元件來比較,在120 mA工作電流條件下,傳統橫向結構LED的Vf值為3.83V,Sn/Ag/Cu金屬基板垂直結構LED的Vf值為3.17 V,降低了0.66V。光輸出功率(ΔLOP / LOP)比傳統元件高出169%。而在電流20~120mA範圍間,串聯電阻值也降低了57%。

    In this study, a dicing-free substrate technology using solder-balls with pattern laser lift-off technique to simplified both fabrication and packaging process for GaN-based LEDs is reported and demonstrated. In conjunction with keeping the size of epilayer smaller than that of Sn/Ag/Cu substrate, a considerable improvement in yield and device performance were shown. As compared to conventional GaN-based light-emitting diodes (LEDs) with sapphire substrate (abbreviated as regular LEDs), Vertical-structured metallic-substrate LEDs (abbreviated as VM-LEDs) show the superiority in better thermal conductivity , less current crowding effect, and 32% larger emission area than that of regular LEDs for a chip size of 600 μm.
    To further improve the contact characteristics and light extraction of VM-LED, a surface treatment on n-GaN, employing dry-etching by inductive coupled plasma (ICP) and wet-etching by KOH solution, has also been made. As is evident from the experimental results, VM-LEDs with the proposed substrate technology was found to have a 57% lower serial resistance, a 0.66 V drop in forward voltage and an increase in light output power (Lop) by 169% at 120 mA compared with regular LEDs.

    中文摘要 I 英文摘要 III 誌謝 V 目錄 Vl 表目錄 VIII 圖目錄 IX 第一章 簡介 1 1-1 高功率GaN-基LEDs之發展 1 1-2 研究動機 4 第二章 基板轉換技術 7 2-1 金屬基板製程 7 2-1-1 晶元鍵合 8 2-1-2 電鍍 13 2-2 藍寶石基板雷射剝離技術 19 2-2-1 準分子雷射系統 24 2-2-2 整面剝離技術 28 2-2-3 區塊剝離技術 30 第三章 區塊Sn/Ag/Cu焊球金屬基板高功率GaN基垂直結構 LED之元件製作 34 3-1 Sn/Ag/Cu焊球金屬基板 34 3-1-1 Sn/Ag/Cu焊球介紹 34 3-2 附著層及高反射層之使用 36 3-3 錫系合金焊球之金屬擴散行為 37 3-4 阻障層及潤濕層之使用 39 3-5 ICP乾蝕刻 40 3-6 KOH濕蝕刻 43 3-7 區塊Sn/Ag/Cu金屬基板元件製作 44 第四章 實驗結果與分析討論 48 4-1 區塊Sn/Ag/Cu金屬基板實驗結果 48 4-2 Sn/Ag/Cu金屬基板垂直結構與傳統橫向結構LED 光電特性比較 51 4-3 有、無阻障層結構Sn/Ag/Cu金屬基板垂直結構LED 光電特性比較 53 第五章 結論 57 參考文獻 59 自傳 62 表目錄 表1-1 ThinGaN LEDs、Flip-chip LEDs與SiC基板LEDs 發光效率比較 6 表2-1 電鍍鎳製程溶液配方 17 表2-2 電鍍時間與電鍍鎳厚度之關係 17 表2-3 電鍍鎳鍍層缺陷及解決方式 18 表2-4 常見準分子雷射種類與技術資料摘要 26 表2-5 PS-2000型準分子雷射加工機規格 26 表4-1 垂直結構24 mil-LED與傳統橫向結構LED之I – V 特性比較 55 圖目錄 圖1-1 LED與其他光源的亮度發展趨勢與預期成果的比較 2 圖1-2 未來LED照明應用趨勢 3 圖1-3 覆晶結構(Flip-chip) LED 5 圖1-4 具Sn/Ag/Cu金屬基板之垂直結構LED示意圖 6 圖2-1 晶元鍵合技術的種類 9 圖2-2 玻璃介質鍵合 12 圖2-3 電鍍系統外觀 16 圖2-4 脈衝雷射能量與各材料間能隙示意圖 20 圖2-5 雷射剝離加工之反應分佈圖 21 圖2-6 氮化鎵熱分解加工示意圖 22 圖2-7 雷射剝離製程示意圖 23 圖2-8 PS-2000型準分子雷射加工機架構 27 圖2-9 雷射剝離前試片整體結構 28 圖2-10 (a)剝離後的2吋金屬基板磊晶晶圓實際正面圖(b)光學 顯微鏡下實際放大圖 29 圖2-11 雷射區塊剝離(Patterned LLO)氮化鎵薄膜示意圖 31 圖2-12 區塊大小1 mm × 1 mm,切割道200 μm之試片 32 圖2-13 (a)區塊大小1 mm × 1 mm,切割道100 μm之試片 (b)區塊大小1 mm × 1 mm,切割道1 mm之試片 32 圖2-14 使用雷射能量密度為850 mJ/cm2之KrF雷射進行雷射 剝離實驗後之氮化鎵薄膜表面AFM(a)2-D圖(b)3-D圖 33 圖3-1 (a) Sn-4Ag-0.5Cu(wt.%)(b) Sn-3Ag-0.5Cu(wt.%)錫球 迴焊後比較圖 35 圖3-2 無阻障層金屬的元件結構示意圖 37 圖3-3 錫金屬穿透金屬接觸層示意圖 38 圖3-4 實際結構的SEM側視圖 38 圖3-5 雷射剝離後之試片結構圖 41 圖3-6 元件製作流程 46 圖3-7 錫球迴焊曲線圖 47 圖4-1 24 mil元件LLO後磊晶的正面OM圖 49 圖4-2 區塊大小1 mm × 1 mm,切割道90 μm之Sn/Ag/Cu焊 球金屬基板的OM正視圖 49 圖4-3 Sn/Ag/Cu焊球金屬基板的SEM側視圖 50 圖4-4 有、無阻障層垂直結構LED的I – V特性比較圖 51 圖4-5 使用Sn/Ag/Cu基板技術之元件主波長與電流相依特性 52 圖4-6 (a)傳統橫向結構LED與(b) 垂直結構LED 53 圖4-7 傳統橫向結構、垂直結構LED的I – V特性比較圖 55 圖4-8 傳統橫向結構、垂直結構LED的L– I特性比較圖 56

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