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研究生: 林文欽
lin, wen-chin
論文名稱: 利用不同深度圖案化基板及側壁蝕刻方式增加氮化鎵藍光發光二極體光輸出功率之研究
Light output power enhancement of GaN-based Light Emitting Diodes with sidewall undercut and different depth of pattern sapphire substrates
指導教授: 賴韋志
Lai, Wei-Chi
學位類別: 碩士
Master
系所名稱: 理學院 - 光電科學與工程研究所
Institute of Electro-Optical Science and Engineering
論文出版年: 2010
畢業學年度: 98
語文別: 中文
論文頁數: 73
中文關鍵詞: 發光二極體氮化鎵圖案化基板磷酸與硫酸(2:3)側壁蝕刻
外文關鍵詞: LED, GaN, PSS, H3PO4 and H2SO4 (2:3), Sidewall undercut
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  • 本論文中首先探討不同深度圖案化基板(Pattern Sapphire Substrate , PSS)對發光二極體光電特性之影響,其中圖案化基板為圓錐狀,圓錐高度分別為1.2μm、1.4μm及1.7μm。從元件電性而言,平面基板LED(Conventional LED)與不同深度之PSS LED其順向導通電壓都約在3.8V左右,而逆向偏壓下不同深度之PSS LED相較於Conventional LED有較小的漏電流;在光性方面,深度為1.2μm、1.4μm及1.7μm之PSS LED與Conventional LED比較,其光輸出功率依序有著47.03%、51.49%與54.7%的提升。
      其次將側壁蝕刻方式運用於不同深度之PSS LED,探討其光電特性。實驗所使用的蝕刻溶液是由磷酸與硫酸(2:3)混合調配,分別蝕刻5分鐘及20分鐘。在光特性方面,不同深度PSS LED經由側壁蝕刻5分鐘及20分鐘之光輸出功率皆比未經蝕刻之光輸出功率較高,提升約3%及8%的增加量。因此,我們結合圖案化基板與側壁蝕刻技術,可以得到光輸出功率有最大達68%的增加量。此外亦利用光學模擬軟體對這些結構進行模擬,而模擬的結果與實驗結果一致。

    In the study, we first studied the electrical and optical characteristics of light emitting diode(LED) with different heights of cone shaped patterned sapphire substrate(PSS), which is cone-like shape. The heights of the cone-like shape are 1.2μm, 1.4μm and 1.7μm for the study. Adopting the PSS in LEDs, we achieved a smaller reverse leakage current due to the crystal quality improvement. Under 20mA current injection, the output powers are 5.94mW, 6.12mw and 6.25mW for the LEDs with PSS heights of 1.2μm, 1.4μm and 1.7μm, respectively. In other words, the 20mA-output powers of LEDs with 1.2μm, 1.4μm and 1.7μm heights cone shaped PSS could be improved by magnitude of approximately 47.03%, 51.49% and 54.7% respectively, compares with those of the conventional LED.
    We demonstrated the also side-wall undercut on the LEDs with different heights of PSS. In our experiment, the etching solution was mixed by H3PO4 and H2SO4 (2:3), and etched LEDs for 5min and 20min. Under 20mA current injection, the LEDs with 5min and 20min undercut etching can be improved by magnitudes of approximately about 3% and 8%, respectively, compared with the non-etching LEDs. As a result, we could get 68% enhancement for combination of PSS and side-wall undercut techniques.

    摘要 I Abstract II 誌謝 III 目錄 IV 表目錄 VII 圖目錄 VIII 第一章 序論 1 1.背景 1 2.研究動機與目的 2 參考文獻 4 第二章 理論基礎與量測系統 5 2.1 理論基礎 5 2.1.1 發光二極體(Light Emitting Diodes , LEDs)原理 5 2.1.2 光萃取效率(Light extraction efficiency) 7 2.1.3 氮化鎵薄膜生長於圖案化基板(Patterned sapphire Substrate , PSS) 8 2.1.4 乾式及濕式蝕刻原理 9 2.2 量測系統 10 2.2.1 電流與電壓(I-V)量測系統 10 2.2.2 發光二極體光輸出功率(Output power)量測系統 10 2.2.3 發光二極體二維光強度影像分佈量測系統 11 2.2.4 掃描式電子顯微鏡(Scanning Electron Microscopy , SEM )量測系統 12 參考文獻 20 第三章 具有不同深度圖案化基板之發光二極體製程與光電特性之研究 23 3.1 氮化鎵膜成長於不同深度圖案化基板之製程 23 3.1.1 氧化銦錫(Indium Tin Oxide , ITO)透明導電層(Transparent Contact Layer , TCL)之製程 23 3.1.2 發光二極體黃光製程 24 3.1.3 濕蝕刻(Wet etching)及高台蝕刻(Mesa etching) 26 3.1.4 熱處理(Thermal annealing)製程 27 3.1.5 蒸鍍p-n 金屬電極 28 3.2 具有不同深度圖案化基板之發光二極體光電特性之研究 30 3.2.1 具有不同深度圖案化基板之發光二極體電特性之研究 31 3.2.1 具有不同深度圖案化基板之發光二極體光特性之研究 31 3.3 具有不同深度圖案化基板之發光二極體光學模擬 33 3.3.1 針對實驗組進行光學模擬之探討 33 3.3.2 不同深度圖案化基板之出光強度探討 34 參考文獻 35 第四章 側壁蝕刻方式運用在發光二極體製程與光電特性之研究 44 4.1 利用側壁蝕刻(sidewall undercut)方式運用在不同深度圖案化基板之製程 44 4.2 利用側壁蝕刻方式運用於不同深度圖案化基板之發光二極體光電特性之研究 46 4.2.1 利用側壁蝕刻方式運用於不同深度圖案化基板之發光二極體電特性之研究 47 4.2.2 利用側壁蝕刻方式運用於不同深度圖案化基板之發光二極體光特性之研究 48 4.3 利用側壁蝕刻方式運用於不同深度圖案化基板之發光二極體光學模擬之探討 50 參考文獻 52 第五章 結論與未來展望 70 5.1 結論 70 5.2 未來展望 72

    第一章
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    第二章
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    第三章
    [1] Y.K.Su, J.J.Chen, C.L.Lin, S.M.Chen, W.L.Li c, C.C.Kao, “Pattern-size dependence of characteristics of nitride-based LEDs grown on patterned sapphire substrates,” Journal of Crystal Growth., vol. 311 pp.2973–2976 2009.
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    [3] Zhiyuan Yang, Tongjun Yu, Sen Mu, Zhizhong Chen, and Guoyi Zhang, “A precise ray tracing simulation model for GaN based light emitting diodes,”Phys. Status Solidi C, vol. 10,pp. 1002, 2010.
    第四章
    [1] 謝奇勳, “成長於圖案化藍寶石基板之氮化鎵發光二極體特性分析”, 國立中央大學電機工程研究所, 2007.

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