| 研究生: |
徐銘鴻 Hsu, Ming-Hung |
|---|---|
| 論文名稱: |
液晶顯示器產品電子元件可靠度預估方法與試驗之研究 A Study of Reliability Prediction and Evaluation of TFT- LCD Display Products |
| 指導教授: |
蕭飛賓
Hsaio, Fei-Bin |
| 學位類別: |
碩士 Master |
| 系所名稱: |
工學院 - 工程管理碩士在職專班 Engineering Management Graduate Program(on-the-job class) |
| 論文出版年: | 2008 |
| 畢業學年度: | 96 |
| 語文別: | 中文 |
| 論文頁數: | 120 |
| 中文關鍵詞: | 失效率 、MTBF 、可靠度預估 、TFT-LCD 、Relex 、逐次抽樣計畫 |
| 外文關鍵詞: | failure rate, Reliability predicts, MTBF, TFT-LCD, Sequential Test |
| 相關次數: | 點閱:243 下載:9 |
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政府目前推動兩兆雙星計劃,一項是半導體產業另一項是光電產業,以TFT-LCD平面顯示器產業投資金額最大,目前台灣已經是全球第二大輸出國,液晶平面顯示器具有輕、薄、省電與環保低輻射優點漸漸取代以映像管為主的CRT螢幕。目前市場上,對於平面顯示器產品的需求與日俱增,其種類包含桌上型PC顯示器、液晶電視等,提昇顯示器產品可靠度,對消費者而言可以獲得良好的產品品質,進而提昇產品的競爭力。本研究分為可靠度預估與可靠度試驗計劃等部分,可靠度試驗計劃運用逐次抽樣方法證明產品經過使用一段時間後,探討其失效率是否達到業者所要求之壽命水準,及其初始設計時所要求之品質標準。
研究中,蒐集產品電子元件參數,運用美軍軍規MIL-HDBK-217F與美國商業標準Bellcore,以可靠度分析軟體Relex預估失效率。並以上述預估結果作為逐次抽樣計畫中生產者預期達到的MTBF 值,建立允/拒收準則。於產線採取產品樣本進行測試,以瞭解其品質水準。
最後,可靠度試驗環境試驗分別以高/低溫儲存,高/低溫操作、冷熱衝擊、振動、落下等試驗進行,探討產品在特定使用環境下,所能承受之應力及破壞模式。綜合上述,本研究提供產品利用系統工程方式在設計與生產階段得知產品壽命範圍,以確保可靠度,應當有相當的助益。
Recently, the Taiwan Government has formulated the big national projects called “Two Trillion/ Twin star Industries Development Plan” which includes Semiconductor and Flat-panel industries that estimates to share the most national investment in next few years. Taiwan now proclaimed to be the second most important export country in the world. As the TFT-LCD display has the advantages of slightness, thinness, power-saving ability and low radiation to environment, it has a great potential to replace the CRT display in the future market. Due to the technology development, a gradual strong demand for flat display products like TFT-LCD has increased year by year. Those products include desktop PC monitor and LCD TV. Therefore, it is important to enable consumers to get better quality of products and improve the competitiveness of products of TFT-LCD by promoting the product reliability, especially their electronic products using the Sequential Test in evaluating the reliability to validate if the failure rate can meet the lifespan of products and demand by customers and also the standard quality of product set in the beginning of the design plan.
This thesis, first collects the parameters of electronic product elements and then evaluate their failure rates with the analysis of software Relex according to MIL-HDBK-217F and American Business standard - Bellcore method. The electronic component collection employs the Bellcore method to analyze the fail rates, and these data are compared with the results from the Sequential Test to check whether the expected MTBF data is met. The criteria for product life are also create to reach the optimal reliability level.
Finally, the various reliability test methods such as high/low temperature storage/operation, thermal shock, vibration, and drop tests, etc are also conducted. These are the exercises to further investigate the product reliability. The system engineers can provide the product life on the design and manufacture step to obtain the life time, which is helpful for the LCD products to conduct the reliability prediction and testing in the future.
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網站部份
1.奇美電子公司網站:www.cmo.com.tw
2.友達光電公司網站:www.auo.com
3.三星電子公司網站:www.samsung.com/sec
4.環境與可靠度試驗網站:140.109.57.68/envweb/
5.displayserch研究機構:www.displaysearch.com
6.皮托科技公司網站:www.pitotech.com.tw