研究生: |
徐崇益 Hsu, Chung-Yi |
---|---|
論文名稱: |
探討Alq3蒸鍍條件對光電特性之影響 Opto-Electrical Characteristics of Alq3 Deposited by Thermal Evaporation |
指導教授: |
黃守仁
Whang, Thou-Jen 蘇炎坤 Su, Yan-Kuin |
學位類別: |
碩士 Master |
系所名稱: |
理學院 - 化學系碩士在職專班 Department of Chemistry (on the job class) |
論文出版年: | 2003 |
畢業學年度: | 91 |
語文別: | 中文 |
論文頁數: | 138 |
中文關鍵詞: | 電子傳送層 、有機發光二極體 |
外文關鍵詞: | Alq3, OLED, ETL |
相關次數: | 點閱:41 下載:1 |
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光激發光會產生消弭現象,是受環境參數所影響,當用來表現材料 Alq3 [ Tris ( 8-hydroxy quinoline ) aluminum ( Ⅲ ) ] 特性時,更能呈現材料的特徵性能。利用單一材料鍍層去獲得光激發光對參數變異,例如;承載基板、鍍層厚度、時間因素以及氧化受潮環境差異下之影響。
本實驗主要目的,在於因實驗環境影響之考量,需在材料特性以及蒸鍍條件變異時,探討鍍層薄膜的均勻性和分子排列堆疊方式,對元件光電效能影響做一探討。
製作單異質界面雙層結構元件,因蒸鍍參數變異之由,使得元件之電特性產生變化而加以探究,參數設定在可進行蒸鍍之真空下,當電洞傳送層 NPB 材料厚度 400 Å 、電子傳送層 Alq3 材料厚度 300 Å 之組合,蒸鍍速率控制在 ~2 Å/s 以及鍍層界面加溫控制在 60℃ ,時間 20 min 所製成之元件,有較佳的電特性效果顯現。
Photoluminescence quenching of Alq3 [Tris ( 8-hydroxy quinoline ) aluminum (Ⅲ)] is seriously affected by many parameters including substrate material, layer thickness, storage time, and humidity et al. In this study, we have demonstrated device performance affected by film uniformity, atomic arrangement, material characteristics, and evaporation parameters. The optimal evaporation rate is 2 Å/s, and substrate heated at 60°C for 20 min when interface between deposited layers, and the thickness of NPB layer and Alq3 layer in the single hetero-junction device are 400 Å and 300 Å respectively.
(1) E. N. Harvey, “History of Luminescence”, The American Philosophical Society, Philadelphia, USA (1957)
(2) D. C. Freeman, Jr. and C. E. White, J. Am. Chem. Soc. 78, 2678 (1956)
(3) C. W. Tang and S. A. Vanslyke, Appl. Phys. Lett. 51, 913 (1987)
(4) K. Mori, Y. Sakaguchi, Y. I. Ketsu, and J. Suzuki, Displays 22, 43 (2001)
(5) O. Prache, Displsys 22, 49 (2001)
(6) A. A. Shoustikov, Y. You, and M. E. Thompson, IEEE J. Sel. Topics In Quan. Eelc. 4, 3 (1998)
(7) M. W. Shin, H. C. Lee, J. G. Lee, Y. Kim, Y. Y. Jung, and S. Kim, Thin Solid Films 358, 187 (2000)
(8) Z. Popovic, C. P. Tripp, N. X. Hu, and A. M. Hor. Appl. Phys. Lett. 72, 2642 (1998)
(9) F. Papadimitrakopoulos, X. M. Zhang, D. L. Thomsen, and K. A. Higginson, Chem. Mater. 8, 1363 (1996)
(10) K. A. Higginson, X. M. Zhang, and F. Papadimitrakopoulos. Chem. Mater. 10, 1017 (1998)
(11) M. Brinkmann, G. Gadret, M. Muccini, C. Taliani, N. Masciocchi, and A. Sironi, J. Am. Chem. Soc. 122, 5147 (2000)
(12) D. Zheng, H. Li, Y. Wang, and F. Zhang, App. Surf. Sci. 183, 165 (2001)
(13) C. Schmitz, P. Posch, M. Thelakkat, and H. W. Schmidt, Macromol. Symp. 154, 209 (2000)
(14) L. F. Cheng, L. S. Liao, W. Y. Lai, X. H. Sun, N. B. Wong, C. S. Lee, and S. T. Lee, Chem. Phys. Lett. 319, 418 (2000)
(15) K. Yamashita, J. Futenma, T. Mori, and T. Mizutani, Synth. Metal. 111, 47 (2000)
(16) J. R. Sheats, Science, 273, 884 (1996)
(17) Bernard Valeur, “Molecular Fluorescence”, Wiley-VCH Verlag GmbH, Federal Republic of Germany (2001)
(18) (a) J. R. Lakowicz, “Principles of Fluorescence Spectroscopy”, Center for Fluorescence Spectroscopy, Baltimore, MD,USA (1983) (b) M. A. Robbins, “Collector's Book of Fluorescent Minerals”, Fluorescent Mineral Society, USA (1983)
(19) B. G. Streetman, and S. Banerjee, “Solid state electronic devices”, Prentice Hall, Upper Saddle River, N.J. (2000)
(20) 史屈里特曼、班納濟、吳孟奇,”半導體元件”,台灣東華書 局,台北市 (2000)
(21) 李嗣涔、管傑雄、孫台平,“半導體元件物理”,三民書局,台北市 (1995)
(22) ( a ) E. M.. Conwell, “Electroluminescent Materials, Devices, and Large-Screen Displays”, The International Society for Optical Engineering, USA (1993)
( b ) A. H. Kitai, “Solid State Luminescence”, Chapman & Hall, USA (1993)
( c ) J. I. Pankove, “Electroluminescence”, Springer Verlag, USA (1977).
(23) B. Hu, N. Zhang, and F. E. Karasz, J. Appl. Phys. 83, 11, 6002 (1998)
(24) C. Adachi, T. Tsutsui, and S. Saito, Appl. Phys. Lett. , 55, 15, 1489 (1989)
(25) D. Zhao, W. Li, Z. Hong, X. Liu, C. Liang, and D. Zhao, J. of Luminescence, 82, 105 (1999)
(26) I.G. Scheblykina, V.I. Arkhipovb, M.V. der Auweraer, and F.D. Schryver, Helvetica Chimica Acta. 84, 3622 (2001)
(27) M. Pope, J. Chem. Phys. 38, 2042 (1963)
(28) Miyaura, N. Suzuki, A. Chem. Rev. 95 2457 (1995)
(29) ( a ) Toshihide, Y. Masakazu, and N. Yasuyuki, Tetrahedron Lett. 39, 2367 (1998)
( b ) N. Miyaura, T. Yanagi, and A. Suzuki, Synth Commun. 11, 513 (1981)
(30) 顧鴻壽,”光電有機電激發光顯示器技術與應用”,新文京開發出 版社,台北縣 (2001)
(31) G. Mueller, Electroluminescence I, Semiconductors and Semimetals V64, Harcomt Science & Technology, San Diego, USA (2000)
(32) G. Mueller, ElectroluminescenceⅡ, Semiconductors and Semimetals V65, Harcomt Science & Technology, San Diego, USA (2000)
(33) ITO, Indium-Tin Oxide for Optical Coatings, http:// www.cerac.com
(34) J. C. Lapp, Technology Group, Corning Inc., Corning, NY 14831. Invited paper presented at IS&T/SPIE’s 9th Annual Symposium, EI’97, February 9-14 1997.
(35) ( a ) 3M Meeting and Presentation Solutions: Technical Support for Transparency Film, http://www.3m.com
( b ) Polyethylene Terephthalate - PET, http://www.dow.com
(36) 伍秀菁、汪若文、林美吟,”真空技術與應用”,行政院國家科學委員會精密儀器發展中心,新竹市 (2002)
(37) UV/VIS Instrumentation – Diode Array Spectrophotometer , http://www.chemistry.nmsu.edu/
(38) ( a ) 謝詠芬、何快容,材料分析技術在積體電路製程中之應用, http://140.114.18.41/micro/
( b ) Nikon Microscopy, http://www.microscopyu.com
(39) Molecular Expressions Microscopy Primer : Digital Imaging in Optical Microscopy, http://micro.magnet.fsu.edu
(40) Ophir Optronics – Photodiode heads for laser power meter – laser energy meter, http://www.ophiropt.com/
(41) ( a ) Microelectronic Devices and Circuits Prof. J. A. Alamo , Device Characterization Project - DC I-V characteristics of pn diode, http://web.mit.edu/
( b ) Operating Manual : HP 4155B Semiconductor Parameter Analyzer, http://inca.kaist.ac.kr
(42) Y. T. Tao, K. Pandian, and W. C. Lee, J. Am. Chem. Soc. 22, 7072 (2000)
(43)C. Hosokawa, H. Tokailin, H. Higashi, and T. Kusumoto, Appl. Phys. Lett. 60, 10 1220 (1992)
(44) ( a ) C. S. Lee, S. T. Lee, and L. S. Hung, Appl. Phys. Lett. 80, 19, 3641 (2002)
( b ) I-Min Chan, Tsung-Yi Hsu, and Franklin C. Hong, Appl. Phys .Lett. 81, 10, 1899 (2002)
( c ) D. Grozea, A. Turak, X. D. Feng, and Z. H. Lu, Appl. Phys. Lett. 81, 17, 3173 (2002)
( d ) C. W. Chen, T. Y. Cho, and C. C. Wu, Appl. Phys. Lett. 81, 9, 1570 (2002)
(45)( a ) F. Liang, L. Wang, D. Ma, and F. Wang, Appl. Phys. Lett. 81, 1, 4 (2002)
( b ) A. N. Krasnov, Appl. Phys. Lett. 80, 20, 3853 (2002)
( c ) C. Trattnig, and A. Pogantsch, Appl. Phys. Lett. 81, 22, 4269 (2002)
( d ) C. H. Chuen, and Y. T. Tao, Appl. Phys. Lett. 81, 24, 4499 (2002)
(46)( a ) V. Savvate, Z. C. Esterlit, and J. W. Aylot, Appl. Phys. Lett. 81, 24, 4652 (2002)
( b ) B. Chu, D. Fan, W. L. Li, Z. R. Hong, and R. G. Li, Appl. Phys. Lett. 81, 1, 10 (2002)