| 研究生: |
梁金條 Liang, Jin-Tiao |
|---|---|
| 論文名稱: |
利用田口方法分析對WLCSP含UBM厚度與錫球形狀之最佳化分析 Optimal Design of UBM Thickness and Solder Shape for WLCSP by Taguchi Method |
| 指導教授: |
陳榮盛
Chen, Rong-Sheng |
| 學位類別: |
碩士 Master |
| 系所名稱: |
工學院 - 工程科學系 Department of Engineering Science |
| 論文出版年: | 2005 |
| 畢業學年度: | 93 |
| 語文別: | 中文 |
| 論文頁數: | 198 |
| 中文關鍵詞: | WLCSP 、田口 、UBM 、最佳化 |
| 外文關鍵詞: | WLCSP, Taguchi, UBM, Optimal |
| 相關次數: | 點閱:65 下載:2 |
| 分享至: |
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中 文 摘 要
晶圓級封裝形式(Wafer Level Chip Scale Package,WLCSP),由於其具有高效能、高功率與高密度等優點,已逐漸成為未來發展的趨勢。雖然WLCSP構裝體之電子訊號I/O密度得以提升,但其可靠度卻降低。然而影響構裝體可靠度的原因良多,其中又以錫球為主要之關鍵。
本文利用Surface Evolver建構非罩幕定界分析模型模擬含多層金屬薄膜的錫球進行分析,即引用Chen混合型態之模型觀點,將介於錫球與晶片間之多層金屬薄膜材料考慮於模型中。本文採用95.5Sn3.8Ag0.7Cu無鉛錫球含UBM材料之WLCSP構裝體,先利用Surface Evolver預測錫球迴焊後之形狀,再利用ANSYS 7.0有限元素分析軟體建立二維及三維模型,以瞭解構裝體在受溫度循環負荷下之變形、錫球應力應變及遲滯曲線等機械行為之變化情形,並將等效潛變應變範圍值於修正之Coffin-Manson計算公式中,以預估構裝體之疲勞壽命。然而本文之模型與劉振中原始模型的差異為劉振中原始模型之錫球外形曲線為一任意圓弧,而本文利用Surface Evolver軟體預測錫球迴焊後之形狀,並將所求得之外形曲線於ANSYS建構模型,並與劉振中之原始模型進行比較與差異分析。
其次,本文探討多層金屬薄膜厚度、錫球墊半徑與錫球體積等單一控制因子的變動對WLCSP構裝體可靠度之影響。隨後,配合田口品質工程方法探討各控制因子間之互動對構裝體可靠度之影響。並根據模擬結果製作回應表、回應圖,及進行變異數分析以判斷何項控制因子之影響最為顯著,以找出最佳之水準組合,及有效提升構裝體之可靠度。
透過本文之完成,希望能提供業界對無鉛錫球含多層金屬薄膜材料之WLCSP構裝體的應用有更深一層的認識,以期降低WLCSP構裝體的成本與提高構裝體的可靠度,並縮短開發時間,提升產品的競爭力。
The Wafer Level Chip Scale Package (WLCSP) has increasingly been becoming popular, because it has some advantages, such as high power, high efficiency and high density. Though WLCSP electronic signal (I/O density) can be improved, the reliability reduces. Among affecting factors of package reliability, solder joints are considered as the main keys.
This study uses Surface Evolver to construct Non-Solder Mask Defined model, and ANSYS for simulation. The Chen model of mixing type is adopted to analyze solder joints with under bump metallurgy (UBM), which is between the solder joint and the chip. This paper focuses on 95.5Sn3.8Ag0.7Cu lead-free solder joints with UBM in a WLCSP. First, utilize Surface Evolver to predict the solder joint shape after reflow, and then use finite element analysis ANSYS 7.0 to build up two-dimensional and three-dimensional models under thermal cycling to investigate deformations of entire package, and changes of stress-strain hysterisis curve for solder joints. Then the accumulated equivalent creep strain puts into modified Coffin-Manson formula to calculate the fatigue life of WLCSP. The model in this study is different from Liu’s model. In Liu’s model, the meridian arc of solder joint is arbitrarily taken, but in this study, Surface Evolver is utilized to predict the post-reflow solder joint shape before putting it into ANSYS for further simulation. The comparison between these two models is also introduced.
Additionally, the variations of UBM thickness, solder pad radius and solder volume are made to observe their effects on WLCSP reliability. Finally, Taguchi Method is introduced to find optimal control factors for WLCSP reliability. According to the results, the factor response table, graphs are made to seek the most significant control factor and the optimal level set to improve WLCSP reliability.
The complication of this study could give manufacturers some suggestions for the application of lead-free UBM solder joint, hopefully cutting cost, enhancing WLCSP reliability, and shortening manufacturing period, and improving the cutting edge of the products.
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