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研究生: 陳宣珽
Chen, Hsuan-Ting
論文名稱: B添加對改善Sn-1.5Ag-0.7Cu低銀無鉛銲料性能之研究
Effect of Boron Addition on Property Improvement of Low Silver Lead-free Solder of Sn-1.5Ag-0.7Cu
指導教授: 李驊登
Lee, Hwa-Teng
學位類別: 碩士
Master
系所名稱: 工學院 - 機械工程學系
Department of Mechanical Engineering
論文出版年: 2020
畢業學年度: 108
語文別: 中文
論文頁數: 124
中文關鍵詞: SAC157低銀無鉛銲料Boron添加散佈強化高溫熱儲存IMC層
外文關鍵詞: Low-silver lead-free solder, B addition, Dispersion Strengthening, high temperature heat storage, IMC layer
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  • 本研究旨在探討B添加量在0.015 wt.%、0.020 wt.%、0.025 wt.%時,對低銀無鉛銲料Sn-1.5Ag-0.7Cu (SAC157)之顯微組織、固液相區間、硬度、強度,及銲料延性等機械性質的影響,研究並觀察高溫熱儲存在150℃,225小時下之銲料及銲點性能變化,並與未添加B之SAC157銲料比較。
    研究結果中發現,添加B銲料之固液相區間會微幅上升,而在顯微組織變化中SAC157銲料添加B對組織有細化之效果,銲料之共晶組織由鬆散狀變為緻密網狀結構,並在高溫熱儲存下仍能保持原有結構。而在掃描式電子顯微鏡(SEM)觀察下,發現B顆粒散佈於初析β-Sn與共晶組織內部,使共晶組織中金屬間化合物Ag3Sn型貌由分散之大板片狀轉變為緻密之細長條狀,且有抑制Cu6Sn5生長之功效,使共晶組織組成變為以Ag3Sn為主,而在0.025 wt.%B添加下組織型變則趨於穩定,整體散佈強化效果有所提升。而觀察熱儲存前後銲點之IMC層形貌與厚度變化,發現B添加具有減緩IMC層中Cu6Sn5晶粒粗大效果,使IMC表面趨於平坦且厚度降低,並在熱儲存過程中降低原子擴散速率,及抑制IMC層成長,使銲點抗熱性提升。
    在硬度觀察中,整體銲料硬度由較軟之初析β-Sn所主導,隨B添加量上升使金屬間化合物散佈強化效果提高而有硬度提高之趨勢,熱儲存晶粒粗大現象被抑制減緩而使硬度下降幅度趨緩。在銲點剪切試驗中亦發現B添加能使銲點延性、韌性提高,使銲點之可靠度提升。
    綜合以上實驗結果,SAC157銲料添加B可改善銲料之顯微組織,使金屬間化合物之散佈強化效果提升,進而強化銲料之硬度、延展性,及韌性等機械性質,使銲點之可靠度進一步提升。

    This study tried to figure out the difference when the boron addition amount is 0.015 wt.%, 0.020 wt.%, and 0.025 wt.% on microstructure, microhardness, strength, ductility, and temperature gap between solidus and liquidus point of Low Silver Lead-free Solder of Sn-1.5Ag-0.7Cu(SAC157). Observed the differences in solder properties through the high temperature heat storage test (150 C, 225 hours).
    The phase transition temperatures of the B added solder will increase slightly, and the addition of boron in SAC157 solder has the effect of refining the structure, and the eutectic structure of the solder changes from loose to net-work structure. Under the Scanning Electron Microscope(SEM) observation, it was found that the boron particles were dispersed in the primary β-Sn and the eutectic structure, so that the morphology of the intermetallic compound Ag3Sn in the eutectic structure changed from a dispersed large plate to a dense one. And the structure change tends to be stable with the addition of 0.025 wt.% B, and the overall dispersion strengthening effect is improved. After thermal storage, it is found that the addition of boron has the effect of slowing down the coarsening of Cu6Sn5 grains in the IMC layer, making the IMC surface smooth, and reducing the atomic diffusion rate during thermal storage, so that the heat resistance of the solder joint is improved. In the Vickers hardness test, the overall solder hardness is dominated by the softer primary β-Sn. As the amount of boron increases, the dispersion strengthening effect increases and the hardness increases. With boron particle suppress the grain growth, the hardness decrease slow down after thermal storage. In the shear test, it was also found that the addition of boron can improve the ductility and toughness of the solder joint, and improve the reliability of the solder joint.
    Based on the above experimental results, the addition of boron in SAC157 solder can improve the microstructure of the solder, enhance the dispersion strengthening effect, and then strengthen the mechanical properties of the solder, such as hardness, ductility, toughness, and further enhance the reliability of the solder joint.

    總目錄 摘要 I EXTENDED ABSTRACT II 致謝 VI 總目錄 VII 表目錄 IX 圖目錄 X 第一章 前言 1 1-1 前言 1 1-2 研究動機與目的 4 第二章 文獻回顧 7 2-1 電子封裝技術簡介 7 2-2無鉛銲料發展 10 2-3二元無鉛銲料 10 2-3-1 Sn-Ag 無鉛銲料 11 2-3-2 Sn-Cu 無鉛銲料 13 2-3-3 Sn-X 無鉛銲料 14 2-4 三元無鉛銲料 16 2-4-1 Sn-Ag-Cu無鉛銲料 16 2-4-2 Sn-Ag-Ni無鉛銲料 18 2-4-3 Sn-Ag-Sb無鉛銲料 20 2-5 四元無鉛銲料 21 2-5-1 Sn-Ag-Cu-X 無鉛銲料 21 2-5-2 Sn-Ag-Cu-B 無鉛銲料 24 第三章 實驗步驟與方法 29 3-1 實驗規劃 29 3-2 試件製備 31 3-2-1銲料熔煉 31 3-2-2 金相試件 35 3-2-3 剪切、IMC層試件 35 3-3實驗內容 40 第四章 研究結果與討論 45 4-1 CU-B合金金相與成份分析 45 4-2 添加B對銲料素材微結構之影響 51 4-2-1 高溫熱儲存前金相微結構 51 4-2-2 高溫熱儲存後金相 71 4-3 添加B對銲料固液區間之影響 84 4-4 添加B對銲料硬度之影響 87 4-4-1熱儲存前銲料硬度變化 87 4-4-2 熱儲存前後對銲料硬度之影響 91 4-5 添加B對銲料IMC層成長之影響 94 4-6 銲點剪切強度與斷口分析 100 4-7 綜合討論 110 第五章 結論 113 第六章 未來研究方向 114 參考文獻 115 表目錄 表1-1 2020年4月國際金屬價格[9] 3 表1-2實驗選用之銲料代號與成分比例(WT.%) 6 表2-1 常見添加元素對銲料性質影響 23 表3-1 金屬元素物理性質 32 表3-2 助銲劑成分表 36 表4-1 各銲點IMC層厚度及其變化 97 圖目錄 圖1-1 近20年國際AG價格波動 3 圖2-1 CBGA封裝結構示意圖 9 圖2-2 PBGA封裝結構示意圖 9 圖2-3 倒裝銲鍵合式 載帶型球柵陣列(TBGA) 9 圖2-4 引線鍵合式 載帶型球柵陣列(TBGA) 9 圖2-5 SN-AG二元相圖 12 圖2-6 抗拉強度與IMC層之關係 13 圖2-7 CU-SN二元相圖 14 圖2-8 SN-SB二元相圖 15 圖2-9 SN-ZN二元相圖 16 圖2-10 SN-AG-CU三元合金相圖 18 圖2-11 SN-AG-NI三元合金相圖 19 圖2-12 SN-AG-SB三元相圖 20 圖2-13 高速拉伸破斷面之IMC層晶粒 26 圖2-14 SAC105-0.05NI於不同B添加量之IMC層形貌 26 圖2-15 B添加於銲料中產生之四角柱狀B化合物 27 圖2-16 在不同B添加量之銲料顯微組織形貌 28 圖3-1 實驗規劃流程圖 30 圖3-2 NI-B二元相圖 32 圖3-3 B-AG二元相圖 (上) B-CU二元相圖 (下) 33 圖3-4 CU-B合金亞共晶區相圖彙整 34 圖3-5熔煉完滾軋後之CU-B合金 34 圖3-6 於模具中放入錫片及其油浴完成之錫球示意圖 37 圖3-7 製備完成之錫球 38 圖3-8 線切割機台 ACCUTEX GE-32S 38 圖3-9 VLS 4.60雷射加工機 39 圖3-10 迴銲製備步驟之簡圖 39 圖3-11 實際單點搭接迴銲之配置 40 圖3-12 LEITZ METALLUX3 立式顯微鏡 42 圖3-13 HITACHI熱場效型高解析場發射型掃描式電子顯微鏡 42 圖3-14 VICKERS微硬度機(AKASHI MVK-H11) 43 圖3-15 SHIMADZU AG-I 5KN 微負荷材料試驗機 44 圖3-16 試件夾持實際示意圖 44 圖4-1 本實驗製備2.5 WT.%B之CU-B合金金相(附圖為原始B顆粒大小)(200X) 47 圖4-2 本實驗製備2.5 WT.%B之CU-B合金金相(1000X) 47 圖4-3 WALD等人製作不同成分比例之CU-B合金金相 48 圖4-4 本實驗室林君所熔煉之CU-B合金金相 48 圖4-7 各研究中CU-B金相對應之相圖內B濃度大小 49 圖4-8 B-SN二元相圖、B-AG二元相圖 50 圖4-9 SAC157之冷卻路徑示意圖 55 圖4-10 本實驗所製備之各銲料素材顯微組織 56 圖4-11 針對共晶組織量測其分佈範圍及著色處理後影像 57 圖4-12 IMAGEJ影像量測分析量測結果示意圖 57 圖4-13 B添加對各銲料中共晶組織的面積分率的變化 58 圖4-14 SEM下深腐蝕後之SAC157顯微組織形貌與各項EDS分析 59 圖4-15 SEM下深腐蝕後之SAC-15B顯微組織形貌與各項EDS分析 60 圖4-16 SAC-15B中AG3SN之小板片狀與細長條狀形貌 61 圖4-17 SAC-15B中AG3SN以平行或交叉排列於共晶組織中 61 圖4-18 SAC-15B共晶組織中CU6SN5形貌 62 圖4-19 SAC-15B中CU6SN5組織EDS分析 62 圖4-20 SEM下深腐蝕後之SAC-20B顯微組織形貌與各項EDS分析 63 圖4-21 SAC-20B共晶組織形貌(4000X) 64 圖4-22 SEM下深腐蝕後之SAC-25B顯微組織形貌與各項EDS分析 65 圖4-23 SAC-25B中共晶組織內緻密之AG3SN排列 66 圖4-24 SAC-25B中AG3SN之整體形貌與其成分分析 66 圖4-25 SAC-25B共晶組織內部在高倍率下發現細小含B之白色顆粒 67 圖4-26 SAC-25B初析Β-SN內部在高倍率下發現含B顆粒 68 圖4-27 SAC-25B EDS MAPPING 69 圖4-28 利用半定量方式計算AG3SN厚度與AG3SN之間間距 70 圖4-29 本實驗所製備之各銲料素材顯微組織熱儲存前後比較 74 (左:熱儲存前、右:熱儲存後) 74 圖4-30 於100X放大倍率下,量測銲料晶粒尺寸示意圖 75 圖4-31 不同B添加量銲料平均晶粒尺寸與晶粒度計算 75 圖4-32 經225小時熱儲存SEM下深腐蝕後之SAC157顯微組織形貌與各項EDS分析 76 圖4-33 經225小時熱儲存之SAC157 EDS MAPPING 77 圖4-34 經225小時熱儲存SEM下深腐蝕後之SAC-15B顯微組織形貌與各項EDS分析 78 圖4-35(A) 經225小時熱儲存SEM下深腐蝕後之SAC-20B顯微組織形貌與EDS分析 79 圖4-35(B) 經225小時熱儲存SEM高倍率下深腐蝕後之SAC-20B共晶組織中 AG3SN形貌與EDS分析 80 圖4-36(A) 經225小時熱儲存SEM下深腐蝕後之SAC-25B顯微組織形貌 81 與各項EDS分析 81 圖4-36(B) 經225小時熱儲存SEM高倍率下深腐蝕後之SAC-25B共晶組織中 AG3SN形貌與EDS分析 82 圖4-37 TANG等人於銲料中晶界處發現奈米MN顆粒具有抑制晶粒成長效果 83 圖4-38 本研究所製備之各銲料DSC曲線 85 圖4-39 各銲料之固液相區間溫度曲線圖 86 圖4-40 熱儲存前Β-SN與共晶組織在不同B添加量下之硬度變化圖 88 圖4-41 熱儲存前整體組織在不同B添加量下之硬度變化圖 89 圖4-42 本實驗室歷年梁君[23]、林君[25],及本研究B添加之銲料研究Β-SN與共晶組織在不同B添加量下之硬度變化圖(熱儲存前) 90 圖4-43 150℃熱儲存前後各B添加量之Β-SN與共晶組織硬度變化圖 92 圖4-44 150℃ 225HRS熱儲存前後各B添加量之整體組織硬度變化圖 93 圖4-45 以影像分析軟體IMAGEJ來量測IMC厚度變化示意圖 96 圖4-46 SEM下各參數之銲點IMC層型貌 97 圖4-47 於225 HRS熱儲存後之SAC157之IMC層中生成CU3SN 98 圖4-48 熱儲存前後IMC厚度變化迴歸分析圖 99 圖4-49 各參數剪切曲線分布範圍 102 圖4-50 各參數範圍內上下限平均曲線比較 103 圖4-51 各銲料之強度與延伸量統計圖表 104 圖4-52 剪切曲線下面積計算示意圖 105 圖4-53 銲點吸收之能量與計算後韌性變化 105 圖4-54 各參數銲點剪切試驗破斷剖面圖 106 圖4-55 SAC157銲點剪切試驗銲點破斷剖面放大圖 106 圖4-56 SAC157銲點剪切試驗銲點破斷剖面及其EDS分析 107 圖4-57 各參數之銲點剪切破斷型貌 108 圖4-58 高倍率下各參數銲點剪切破斷型貌 109

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