本研究之目的為透過觀察機械性質、電磁性質及微結構探討通電對Invar 36合金可能造成的性質變化與其機制。實驗所施加的直流電流密度為8000~18000 A/cm2，通電時間為1~8小時，並在關閉電源前以液態氮急速冷卻保留當下試片之微結構以利後續分析。實驗結果顯示經通電處理後材料的繞射峰積分面積皆有明顯下降之現象，電子背向散射繞射分析(EBSD)結果顯示晶粒大小並無明顯變化、雙晶結構逐漸減少，再者，退火後的立方晶(Cube)型織構{001}<100>也在通電後逐漸消失，轉變成含有Copper {112}<111>、S {123}<634>、Brass {110}<112>織構分量(Texture component)的銅(Copper)型織構；利用四點探針和超導量子干涉儀(SQUID)分析觀察到試片電阻率和磁滯損失皆有隨電流密度提升而增加之趨勢。推測通電所形成的電子風力使材料內部產生差排，另外差排在通電後可能藉由滑移造成織構轉變(Texture transition)，Invar 36的高疊差能特性在通電提供額外能量後造成雙晶逐漸消失，上述原因於繞射上造成繞射峰強度明顯降低、電阻率及磁滯損失增加，但由於通電後晶粒大小無明顯改變、差排密度變化幅度不大，機械性質並無顯著變化。

This study investigated the mechanism of the microstructure and properties variation on Invar 36 under current stressing. The Invar 36 strip specimens were subjected to 8000~18000 A/cm2 direct current stressing for 1~8 hours and then immersed in liquid nitrogen prior to stopping the electric current. The purpose of quench is to avoid the influence of residual Joule heat on microstructure.

The results show that XRD peak intensity would decrease after current stressing. EBSD analysis indicated that the texture transited from Cube texture {001}<100> to Copper texture, the twin structure disappeared and the grain size did not have an obvious variation. Besides, according to KAM (Kernel Average Misorientation) analysis, dislocations would form during current stressing treatment. The texture transition behavior may be ascribed to the dislocation slip induced by electron flow. On the other hand, the high stacking fault energy of Invar 36 may cause the disappearance of twin structure.

The variation in microstructure may affect the properties of Invar 36. First, the electrical resistivity increased as current density increased, the maximum variation was 10.1%. The variation of coercive force was nearly negligible, however maximum variation in hysteresis loss was 10.9% after current stressing. Finally, the mechanical property analysis showed that the variation in microhardness was less than 5%.

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