近年來由於科技發展不斷進步，目前已有許多領域檢測的設備大多採用非接觸式的自動光學檢測，逐漸取代傳統人工的檢測。使用自動光學檢測技術，不但可降低人工檢驗的負擔與人為疏失，更可以提高檢測速度與可靠性。因此，本研究參考主動式自動對焦之原理並利用單晶片微處理器開發出一套自動化光學對焦系統。
本研究的主動式光學對焦系統主要是先藉由雷射光打在待測物表面，將反射的雷射光訊號，透過透鏡成像在線性影像感測器，而線性影像感測器所接受到的雷射光訊號便是顯微鏡與待測面的失焦誤差訊號，其後失焦誤差訊號經由單晶片 (single chip )的聚焦曲線分析來輸出相對位移量，並藉此相對位移量進一步調整與控制步進馬達使載物平臺作相對比例之位移，以實現自動化對焦技術。
最後，本研究成功利用一個單晶片來實現自動對焦，而且在失焦範圍為±100μm內的待測物，其對焦速度大都可在0.3秒完成。因此，希望未來可以開發出低成本，高效率的自動對焦系統並應用在工業上的檢測設備。

The development of technology is progressing in recent years, the non-contact-type automatic optical inspection is used for measure system instead of visual inspection in widely fields. The automatic optical inspection (AOI) can offer precise, high-speed, and reliable characteristics. Thus, we developed an optical auto-focus system by using single chip microprocessor.
In this study, we used the laser beam to focus at the workpiece surface, and the laser beam was reflected in a linear image sensor. The linear image sensor received the defocus error signal which is the distance between microscope and workpiece. A defocus error signal was processed by S-curve of the single chip microprocessor, and then the stage was adjusted for the change of reflected light position by the stepper motor.
Finally, the study was accomplished a touch panel auto-focus system by a single chip microprocessor and the result of experiments shows that it takes about 0.3 seconds to focus the object with ±100μm defocus range. It is hoped that the results of the study can develop a low-cost, compact, high performance automatic optical inspection applied to the industrial detective applications.

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