| 研究生: |
鄭諭燦 Jeng, Yu-Tsan |
|---|---|
| 論文名稱: |
共路徑外差干涉儀順序量測雙折射晶體光學參數之設計與研究 Sequential Measurements for the Optical Parameters of the Birefringent Materials by Using a New Common-Path Heterodyne Interferometer |
| 指導教授: |
羅裕龍
Lo, Yu-Lung |
| 學位類別: |
碩士 Master |
| 系所名稱: |
工學院 - 機械工程學系 Department of Mechanical Engineering |
| 論文出版年: | 2005 |
| 畢業學年度: | 93 |
| 語文別: | 英文 |
| 論文頁數: | 99 |
| 中文關鍵詞: | 共路徑外差干涉儀,主軸,相位延遲,階數 |
| 外文關鍵詞: | Order, Heterodyne Polariscope, Principal Axis, Birefringence |
| 相關次數: | 點閱:84 下載:4 |
| 分享至: |
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由於科技不斷提升,因此對產品品質的要求也愈來愈嚴格,然而產品品質的監控則有賴於高精確度和多功能量測儀器的發展。在近代光學科技中雙折射晶體是一種最常見的光學元件之一諸如波片、雙折射稜鏡、液晶…等等。一般而言,其光學參數包含有主軸角度、相位遲延、折射率及厚度…性等參數,這些參數在光學工業上及生物醫學上均佔有相當程度上的地位,然而能精確地解析出其光學參數對於應用上是相當重要的。
因此本實驗將提出一共路徑外差干涉儀利用順序量測的方式搭配鎖相放大器,用其精密量測技術監控相位變化再配合簡易的光訊號處理,來進行光學元件的主軸角度、相位遲延、階數、厚度及尋常光與非尋常光折射率等參數的測量。因為此量測技術是運用共路徑外差干涉術(Common-Path Heterodyne Interferometer),可避免週期性誤差且對於雜訊免疫力及靈敏度的提高也有很大的幫助,所以有高精密度的量測優勢。
此外本文分別利用多階四分之一波片和水平排列相列型液晶為待測物,均證實了此系統對於具雙折射性物質的可行性,且有直接容易的訊號處理、簡潔的光學架構及不受光強擾動影響…等特點。
To measure the complete optical parameters of linear birefringence materials, a new heterodyne polariscope with sequential measurement method is proposed. In this study, a multiple-order crystalline quartz quarter-waveplate used as a test sample is measured by two sequential setups.
The proposed method has average absolute errors of and 0.15 % with respect to the principal axis angle and the phase retardation. The order, thickness and refractive indices also have a good agreement with the known sample data. On the other hand, in order to validate the functions of the measuring system, a homogeneous alignment liquid crystal cell is utilized as a sample for the system, too.
As compared to its conventional counterparts, the proposed heterodyne polariscope has a more compact setup, simpler in signal process and especially in multi-function measurements.
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