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研究生: 許宏旭
Hsu, Hung-Hsu
論文名稱: 印刷電路板之低速衝擊研究
Analysis of Printed Circuit Board Subjected to Low Velocity Drop Impact Loading
指導教授: 鄭泗滄
Cheng, Shi-Chang
學位類別: 碩士
Master
系所名稱: 工學院 - 航空太空工程學系
Department of Aeronautics & Astronautics
論文出版年: 2004
畢業學年度: 92
語文別: 中文
論文頁數: 109
中文關鍵詞: 錫膏錫球掉落試驗衝擊回銲
外文關鍵詞: reflow, drop test, solder ball, impact, solder paste
相關次數: 點閱:77下載:5
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  •   近年來由於電子構裝技術皆朝向高精密度之趨勢發展,因而造就了電子產品之微小化與輕量化。相對地,電子產品之可靠性就顯得日漸重要,亦成為日後設計時之首要重點工作。本研究主要是針對掉落試驗對電子構裝元件之影響,並以理論與實驗進行相互之驗證,而找出最佳之錫球成分配比,提高電子構裝產品之可靠性。
      針對可攜帶式電子構裝產品,常因人為疏忽或搬運時而掉落地面,使得電子構裝產品因衝擊之影響,而造成內部元件之損壞或失效。因此,本文主要是根據JEDEC之標準衝擊規範,而進行電子構裝元件之掉落試驗。實驗方面,將電子構裝元件固定於衝壓模具上,且於落錘試驗機台上自由落下,再測其衝擊之響應。而數值分析方面,則以商用數值模擬軟體LS-DYNA3D進行數值模擬,並與實驗結果相互驗證,進行電子構裝元件之可靠性評估。本文結合理論與實驗之驗證,對於電子構裝元件之掉落試驗,提供一有效之設計與分析模式。

      In recent years, the electronic products become tiny and slight due to the high packaging density for today’s electronic devices. The reliability of electronic products is getting more and more important, and become a first point of design section. This thesis focus on the response of electronic products under drop test and find the best compositive percentage of solder ball to increase the product reliability.
      The failure of such electronic devices usually results from the drops onto the ground during the shipping processes or under user’s application. This study is according to the Impact Method of JEDEC Standard to proceed the drop test of component. Both the experiment and numerical analysis were conduced in this thesis. In experiment part, the component of electronic devices is fixed on a mold, then dropped from Drop -Weight Impact Tower and measured the response of shock. In numerical analysis, LS-DYNA3D is used to do the simulation. The result of experiment and simulation are compared to estimate the reliability of electronic products. It is useful for the construction of the methodology of designing and analysis mode for drop test.

    目 錄 簽名頁 授權書 簽署人須知 誌謝 中文摘要 英文摘要 目錄 I 表目錄 III 圖目錄 IV 第一章 緒論 1-1 研究動機與目的 1 1-2 文獻回顧 3 1-3 研究方法 5 第二章 基礎理論 2-1 JEDEC標準衝擊規範之介紹 7 2-2 衝擊理論 9 第三章 實驗試片、設備與程序 3-1 實驗試片的製作 14 3-1-1 Ultra CSP簡介 14 3-1-1-1 Ultra CSP與WLCSP之差異 15 3-1-1-2 Ultra CSP與WLCSP之製程技術比較 15 3-1-2 實驗試片之簡介 16 3-1-3 實驗試片之製作流程 17 3-1-3-1 實驗用晶片介紹 17 3-1-3-2 實驗用測試板介紹 17 3-1-3-3 表面黏著技術(SMT)所需設備之介紹 18 3-1-3-4 表面黏著技術之作業流程介紹 20 3-2 實驗設備之介紹 24 3-2-1 實驗儀器 24 3-2-2 衝擊模具組之設計概述 27 3-3 實驗程序 28 3-3-1 掉落試驗之程序 28 3-3-2 失效模式之判定 30 3-3-2-1 紅染劑試驗(Dye Penetrant Experiment) 31 3-3-2-2 拉力試驗(Pull Test) 32 第四章 數值方法與討論 4-1 數值模擬之方法簡介 33 4-2 有限元素之模型建構 34 4-3 有限元素之組成定律 35 4-4 數值分析之結果討論 37 第五章 實驗結果與討論 5-1 失效模式之定義 41 5-2 失效原因之探討 43 第六章 綜合結論與建議 6-1 結論 48 6-2 未來工作與建議 49 參考文獻 50 附表 53 附圖 63

    參考文獻

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