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研究生: 王威達
Wang, Wei-Da
論文名稱: 利用退火硫化鋅/銅銦鎵二硒形成銅銦鎵二硒同質pn接面之研究
Study of CuIn1-xGaxSe2 Homojunction Formation by Annealing ZnS/CIGS Thin Films
指導教授: 彭洞清
Perng, Dung-Ching
學位類別: 碩士
Master
系所名稱: 電機資訊學院 - 微電子工程研究所
Institute of Microelectronics
論文出版年: 2011
畢業學年度: 100
語文別: 中文
論文頁數: 75
中文關鍵詞: ZnS擴散CIGS同質接面銅銦鎵二硒
外文關鍵詞: ZnS diffuse, CIGS homojunction, CuIn1-xGaxSe2
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  • 傳統CIGS薄膜太陽能電池使用CdS緩衝層,以ZnS為緩衝層材料取代CdS可避免環境汙染,並探討ZnS緩衝層與CIGS薄膜太陽能電池之研究。故本論文討論ZnS緩衝層利用退火方式,使Zn原子擴散進入CIGS吸收層表面,以形成CIGS同質pn接面,因同質pn接面製作之薄膜太陽能電池可減少接面載子復合及提高電池效率。
    首先,將清洗過的ITO基板上濺鍍銅銦鎵(CuInGa)先驅物,並以兩階段硒化溫度法完成p型CIGS吸收層,接著利用化學水浴法成長ZnS緩衝層,經過真空退火使Zn擴散進入CIGS吸收層,使其表面轉換為n型CIGS,藉此形成同質結構之pn接面,然後分析其接面特性及擴散情形;其中,變化參數為ZnS退火溫度與時間。
    硒化完成後之CIGS薄膜以SEM觀察其表面型態、以EDS分析材料比例、以GIXRD判定化合物材料、以α-step來分析厚度、以四點探針測量片電阻、以熱探針判定半導體pn導電型式,並以I-V量測觀察其pn接面特性。最後, ZnS/p-CIGS薄膜以300oC,20分鐘退火可成功的形成CIGS同質pn接面。

    Because of Cd is a highly toxic material, ZnS thin film has been proposed as the buffer layer for CIGS solar cell to replace CdS for addressing its environmental concerns. In this thesis, ZnS deposited on CuIn1-xGaxSe2(CIGS)thin film followed by vacuum annealing is studied. Zn diffusion into the p-type CIGS layer to form a thin n-type CIGS layer, and therefore CIGS p-n homojunction, was investigated. Solar cells fabricated with a homojunction will have a lower recombination rate at the junction and therefore better conversion efficiency.
    First, CuInGa precursors were co-sputtering deposited on a cleaned ITO substrate followed by a two-step selenization to form a p-type CIGS film. A ZnS film was then deposited onto the p-type CIGS film by chemical bath deposition technique. Through various vacuum annealing conditions, whether the diffusion of Zn into the skin layer of the p-type CIGS film can transform to an n-type CIGS film was investigated.
    Surface of the CIGS thin film was observed by scanning electron microscope, composition of the film was analyzed by X-ray energy dispersive spectroscopy, and grazing incidence X-ray diffraction was used for phase identification of the films, film’s thickness was measured by a α-step film profilometer, sheet resistance of the film was measured by a four-point probe, a hot-probe technique was used to identify film’s conduction polarity, and I-V measurements were used to analyze the characteristics of the junction after the Zn diffusion. A CIGS homojunction has been successfully formed by annealing ZnS/CIGS films with 300 oC at duration of 20 minutes.

    中文摘要 I 英文摘要 III 誌謝 V 目錄 VI 表目錄 X 圖目錄 XI 第一章 緒論 1 1.1 前言 1 1.2 太陽能電池種類介紹 2 1.3 研究動機 8 第二章 太陽能電池簡介 9 2.1 太陽光譜和大氣質量 9 2.2 太陽能電池工作原理 12 2.2.1 太陽能電池的等效電路 13 2.2.1 短路電流和開路電壓 14 2.2.2 串聯電阻與並聯電組 14 2.2.3 轉換效率 15 2.3 I-III-VI 族半導體 18 2.3.1 銅銦二硒(CuInSe2) 21 2.3.2 銅銦鎵二硒(CuIn1-xGaxSe2,CIGS) 24 2.4 CIGS 薄膜太陽能電池結構簡介 25 2.4.1 含鈉玻璃基板 26 2.4.2 鉬金屬背電極 27 2.4.3 銅銦鎵二硒吸收層 27 2.4.4 硫化鋅緩衝層 27 2.4.5 純質氧化鋅層 28 2.4.6 透明導電氧化層 28 2.4.7 鎳/鋁金屬前電極 29 2.5 同質接面與異質接面 29 第三章 實驗過程 32 3.1 實驗流程 32 3.1.1 接面結構圖 33 3.1.2 ITO 基板清洗處理 33 3.1.3 濺鍍銅銦鎵金屬先驅物 33 3.1.4 兩階段硒化法 34 3.1.5 氰化鉀清洗 34 3.1.6 化學水浴法沉積硫化鋅薄膜 35 3.2 實驗材料與藥品規格 37 3.3 實驗設備 38 3.3.1 濺鍍設備 38 3.3.2 硒化設備 40 3.3.3 蒸鍍設備(真空退火設備)41 3.4 分析設備 43 3.5.1 掃描式電子顯微鏡(SEM)43 3.5.2 能量分散光譜儀(EDS) 45 3.5.3 X 光繞射儀(XRD) 46 3.5.4 熱探針測試(Hot-probe) 49 3.5.5 四點探針量測(Four-point probe) 50 3.5.6 電流-電壓特性量測(I-V measurements) 51 第四章 結果與討論 52 4.1 濺鍍銅銦鎵金屬先驅物 52 4.2 兩階段硒化法形成之銅銦鎵二硒薄膜 53 4.2.1 第一階段低溫硒化 53 4.2.2 第二階段高溫硒化 54 4.3 氰化鉀清洗 57 4.4 化學水浴法硫化鋅薄膜改善 59 4.5 硫化鋅擴散進入銅銦鎵二硒之探討 61 4.5.1 SEM 分析 61 4.5.2 EDS 縱深分佈 63 4.5.3 GIXRD 分析 64 4.5.4 四點探針與熱探針分析 67 4.5.5 電流-電壓特性量測 69 第五章 結論 70 5.1 CBD-ZnS/CIGS 擴散探討 70 5.2 未來研發方向 71 參考文獻 72

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