| 研究生: |
吳堃嘉 Wu, Kun-Jia |
|---|---|
| 論文名稱: |
多產品有限儲存容量半導體製造網路之最佳化派遣策略 Optimal Dispatching Policies for Semiconductor Manufacturing Networks with Multiple Products and Finite Storage Capacities |
| 指導教授: |
張珏庭
Chang, Chuei-Tin |
| 學位類別: |
碩士 Master |
| 系所名稱: |
工學院 - 化學工程學系 Department of Chemical Engineering |
| 論文出版年: | 2011 |
| 畢業學年度: | 99 |
| 語文別: | 中文 |
| 論文頁數: | 161 |
| 中文關鍵詞: | 半導體製造 、等候理論 、派遣策略 、EWMA 、混整數非線性規劃 、數值模擬 |
| 外文關鍵詞: | semiconductor manufacturing, queuing theory, dispatching policy, EWMA, MINLP, numerical simulation |
| 相關次數: | 點閱:146 下載:1 |
| 分享至: |
| 查詢本校圖書館目錄 查詢臺灣博碩士論文知識加值系統 勘誤回報 |
半導體製造工業一個資本與技術密集的產業,隨著特徵尺寸的縮小及晶圓半徑的增加,為了提升產出良率以及增加設備效率,精密的控制方法就顯得有其必要。
在本研究中我們將半導體製造程序視為多階段多M/M/1/K機台的等候網路,各類不同產品在每一階段中可依指定比例分配派送至各機台中處理,而每一機台的製程配方依EWMA控制策略逐批調整。根據這些假設我們發展出混整數非線性規劃模型來決定可達成最大化製程能力以及最小化系統時間的最佳化派遣策略,並成功的利用數值模擬方法驗證此派遣模式的合理性。我們也在不同案例研究中討論輸入產品及機台干擾對輸出產品品質的效應,並且建議應避免的控制器調整參數範圍,同時也探討了不同操作參數影響系統時間的效應,結果顯示平均抵達速率、流失機率上限及排隊容量除了影響平均系統時間也影響流失機率。
Semiconductor manufacturing industry is a capital and technology-intensive industry. As feature sizes shrink and wafer sizes increase, intricate control methods are needed to improve the product quality and tools utilization of any production process.
In this thesis, the semiconductor manufacturing process is treated as multiple M/M/1/K queuing systems operated in a network, and different products can be routed to tools in each stage. It is assumed that the exponentially-weighed-moving- average (EWMA) controller is implemented in each tool to adjust the process recipe from run to run. Based on these assumptions, a mixed integer nonlinear programming model (MINLP) is formulated to determine the optimal dispatching (routing) policies for maximizing process capability or minimizing average system time. Numerical simulation procedure is also devised to confirm the validity of the resulting dispatching model. The simulation results show that the predictions of this model are reasonable. Moreover, the impacts of changing noises of product and tool for product quality are investigated in case studies and the safe range of parameters values are suggested in the thesis. The impacts of changing parameters values for operating efficiency are also investigated. Both the expected system time and also the loss probability can be shown to be dependent upon average arrival rate, loss probability limit and queueing capability.
Ai, B. Private Communications, Huazhong University of Science and Technology, Wuhan, China, 2009.
Baez Senties, O., Azzaro-Pantel, C., Pibouleau, L. & Domenech, S. Multiobjective scheduling for semiconductor manufacturing plants. Comput. Chem. Eng. 34 (2010) 555-566.
Bhaskaran, K. & Pinedo, M. In Handbook of Industrial Engineering, edited by G. Salvendy. 1992 (John Wiley: New York, NY).
Blackstone, J. H., Phillips, D. T. & Hogg, G. L. A state-of-the-art survey of dispatching rules for manufacturing job shop operations. Int. J. Prod. Res., 1982, 20, 27–45.
Bolch, G., Greiner, S., Meer, H., Trivedi, K. S. Queueing Networks and Markov Chains: Modeling and Performance Evaluation with Computer Science Applications. WILEY-INTERSCIENCE, 2006.
Box, G. E. P., Jenkins, G. M. & Reinsel, G. Time Series Analysis Forecasting And Control(3rd Ed.). Prentice-Hall, 1994.
Cassandras, C. G. & Lafortune, S. Introduction To Discrete Event System. Kluwer Academic. 1999.
Choi J. Y. & Reveliotis, S. Relative value function approximation for the capacitated re-entrant line scheduling problem. IEEE Trans. Autom. Sci. Eng., vol. 2, no. 3, pp. 285–299, Jul. 2005.
Dabbas, R. M., Chen, H. N. & Fowler J. W. et al., A combined dispatching criteria approach to scheduling semiconductor manufacturing systems. Comput. Ind. Eng., vol. 39, no. 3–4, pp. 307–324, Apr. 2001.
Dabbas, R. M. & Fowler, J. W. A new scheduling approach using combined dispatching criteria in wafer fabs. IEEE Trans. Semiconduct. Manufact., vol. 16, no. 3, pp. 501–510, Aug. 2003.
Del Castillo, E., Statistical Process Adjustment for Quality Control. John-Wiley & Sons. New York, 2002.
Firth, S. K., Campbell, W. J., Toprac, A. & Edgar, T. F. Just-in-time adaptive disturbance estimation for run-to-run control of semiconductor processes. IEEE Trans. Semicond. Manuf. 19 (2006) 298–315.
Ko, H. H., Kim, J., Kim, S. S. & Baek, J. G.. Dispatching rule for non-identical parallel machine with sequence-dependent setups and quality restrictions. Comput. Ind. Eng. 59 (2010) 448-457.
Kutanoglu, E. & Sabuncuoglu, I. An analysis of heuristics in a dynamic job shop with weighted tardiness objectives. Int. J. Prod. Res., 1999, 37, 165–187.
Lee, R. Uzsoy, C. & Martin-Vega, L. A review of production planning and scheduling models in the semiconductor industry, part II: Shop floor control. IIE Trans. Scheduling Logistics, vol. 26, no. 5, pp. 44–55, Sept. 1994.
Lee, Y. H. & Kim, T. Manufacturing cycle time reduction using balance control in the semiconductor fabrication line. Production Planning Control, vol. 13, no. 6, pp. 529–540, Sept. 2002.
Ma, M. D., Chang, C. C., Wong, D. S. H.& Jang, S. S. Identification of tool and product effects in a mixed product and parallel tool environment. Journal of Process Control. 2008.
May, G. S. & Spanos, C. J. Fundamentals Of Semiconductor Manufacturing And Process Control. John Wiley & Sons. 2006.
Mittler, M. & Schoemig, A. K. Comparison of dispatching rules for semiconductor manufacturing using large facility model. in Proc. 1999 Winter Simulation Conf., Phoenix, AZ, 1999, pp. 709–713.
Morrison, J., Janakiram, M. & Kumar, P. R. A comparative study of scheduling policies at Motorola fabs, in Proceedings of the International Conference on Semiconductor Manufacturing Operational Modeling and Simulation. San Francisco, 1999, pp. 51–56.
Moyne, J. Run-to-Run Control in Semiconductor Manufacturing. CRC Press, Florida, 2001.
Olkin, Ingram., Gleser, Leon J. & Derman, Cyrus., Probability Models And Applications. New York, 1980.
Pasadyn, A. J. & Edgar, T. F., Observability and state estimation for multiple product control in semiconductor manufacturing. IEEE Trans. Semicond. Manuf. 18 (2005) 592–604.
Patel, N. S. & Jenkins, S. T. Adaptive optimization of run-to-run controllers: the EWMA example. IEEE Trans. Semicond. Manuf., vol. 13, pp. 97-107, 2000.
Pierce, N. G. & Yurtsever, T. Dynamic dispatch and graphical monitoring system, in Proceedings of the International Conference on Semiconductor Manufacturing Operational Modeling and Simulation, San Francisco. 1999, pp. 57–61.
Qu, P. & Mason, S. J. Metaheuristic scheduling of 300-mm lots containing multiple orders. IEEE Trans. Semiconduct. Manufact., vol. 18, no. 4, pp. 633–643, Nov. 2005.
Raghu, T. S. & Rajendran, C. An efficient dynamic dispatching rule for scheduling in a job shop. Int. J. Prod. Econ., 1993, 32, 301–313.
Rajendran, C. & Holthaus, O. A comparative study of dispatching rules in dynamic flowshops and jobshops. Eur. J. Op. Res., 1999, 116, 156–170.
Sachs, E., Hu, A. & Ingolfsson, A. Run by run process control: combining SPC and feedback control, IEEE Trans. Semicont. Manuf., vol. 8, pp. 26-43, 1995.
Smith, T. H. & Boning, D. S. Artificial neural network exponentially weighted moving average controller for semiconductor processes, J. Vacuum Science Tech., vol. 15, pp. 236-239, 1997.
Tseng, S. T., Yeh, A. B., Tsung, F. & Chan, Y. Y. A study of variable EWMA controller. IEEE Trans. Semicond. Manuf., vol. 16, pp. 633-643, 2003.
Wang, Zuntong., Wu, Qidi. & Qiao, Fei. A Lot Dispatching Strategy Integrating WIP Management and Wafer Start Control. IEEE Trans. Autom. Sci. Eng., vol. 4, no. 4, pp. 579–583, Jul. 2007.
Wein, L. M. Scheduling semiconductor wafer fabrication. IEEE Trans. On Semiconductor Manufacturing. vol. 1, no. 3, pp. 115–130, Aug. 1988.
Wu, M. F., Lin, W. K., Ho, C. L., Wong, D. S. H., Jang, S. S., Zheng, Y. & Jain, A. A Feed-Forward/Feedback Run-to-Run Control of a Mixed Product Process: Simulation and Experimental Studies. Ind. Eng. Chem. Res. 2007, 46, 6963-6970.
Wu, M. F., Lin, C. H., Wong, D. S. H., Jang, S. S. & Tseng, S. S. Performance Analysis of EWMA Controllers Subject to Metrology Delay. IEEE Trans. On Semiconductor Manufacturing. vol. 21, no. 3, pp. 413–425, Aug. 2008.
Zheng, Y., Lin, Q. H., Wong, D. S. H., Jang, S. S. & Hui, K. Stability and performance analysis of mixed product run-to-run control. J. Process. Control 16 (2006) 431–443.