在此，為激發奈米粒子陣列結構的表面電漿子，我們使用全反射的方式來進行，經由電場區域性的強化，增強了奈米粒子陣列上螢分子的訊號。在製程中利用穩定可控的變因條件，改變其尺寸與間距間的大小，也嘗試使用不同的螢光劑來探其之間的差異和螢光訊號增強之影響。
傳統的全反射螢光顯微鏡，是利用入射光源大於臨界角度時發生全反射，在其穿透介質中產生的一消逝波來藉以激發在逝波範圍內(約數百奈米)的螢光分子並激發出欲觀察之訊號。因此解析度可達至奈米等級的效果，且螢光影像具有非常低的雜訊背景。
在應用上，擷取於細胞體的動態影像時，其螢光訊號仍須被增強。故以降低偵測極限來得到更強的螢光訊號，於此我們結合TIRFM與奈米銀粒子陣列的氧化鋁薄膜來作為量測螢光分子的基板，藉由消逝波激發的局域性表面電漿共振來增強螢光分子的訊號。

In this thesis, we produce the anodic aluminum oxide (AAO) film which has highly order nanopores inserted by Ag nanoparticels with high filling ratio using the electrochemical deposition with a stable DC voltage. The absorption spectra of Ag/AAO films are measured, and the visible absorption peak, 405 nm, is observed. The major reason of absorption peak is local surface plasmon induced by the Ag nanoparticles on the surface of Ag/AAO film. The surface plasmons (SPs) are also excited by Ag nanoparticles by total internal refection fluorescence (TIRF) technique. The fluorescence signals can be enhanced by the localized electric field. In our experimental processes, the sizes and pitches of AAO samples can be controlled under a stable experimental condition. Therefore, their optical properties are suitable to investigate the fluorescence signals with different fluorescence reagents.
The fluorescence signals caused by the evanescent wave are measured by the traditional total internal reflection fluorescence microscope (TIRFM) when the angle of incident light is more than the critical angle. The evanescent range is about several hundred nanometers which reach nano-scale resolution, and the fluorescence images have low background noise.
In our samples applied on lived cells, we also need to enhance the fluorescence images. When localized surface plasmon resonance (LSPR) excited by evanescent wave, the detection limit decreases and the fluorescence signals are enhanced by the Ag/AAO films using the total internal reflection fluorescence microscope (TIRFM) combined.

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