本研究是以分子束磊晶方式，利用Al2O3基板並以Mo為緩衝層成長Fe磊晶薄膜。藉著改變不同基板及Fe磊晶薄膜的厚度來觀察不同成長條件對異向性的影響。利用磁光柯爾效應儀(MOKE)及震盪樣品磁性量測儀(VSM)來量測樣品的磁性，並使用M(H)模擬軟體來決定各異向性常數值。我們可以得知由於表面與塊材的競爭，導致其磁異向性與厚度有相當的關係。

We sturdy magnetic anisotropy in Fe films epitaxially grown on Al2O3 substrates using Mo seed layers. By varying substrates and thickness of Fe films, we examine how they affect the anisotropy. Using Magneto-Optical Kerr Effect (MOKE) and Vibrating Sample Magnetometer (VSM) we identify the magnetic property. The anisotropy constants have been determined by M(H) simulation.
We can know that the competition between surface and volume magnetic anisotropy may induce a dramatic thinkness dependence of the anisotropy.

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