簡易檢索 / 詳目顯示

研究生: 杜和達
Tu, Ho-Da
論文名稱: 微型光學式自動對焦系統之模組化設計與提升其對焦精度及速度之影像處理法
Modular Design of Miniaturized Optical Autofocusing System and an Image Processing Method to Improve its Autofocusing Accuracy and Speed
指導教授: 劉建聖
Liu , Chien-Sheng
學位類別: 碩士
Master
系所名稱: 工學院 - 機械工程學系
Department of Mechanical Engineering
論文出版年: 2021
畢業學年度: 109
語文別: 中文
論文頁數: 106
中文關鍵詞: 雷射自動對焦顯微鏡橢圓尋邊演算法補償即時檢測小型化模組化
外文關鍵詞: laser, autofocusing, microscope, ellipse edge finding, algorithm, compensation, real-time detection, miniaturization, modularization
相關次數: 點閱:102下載:0
分享至:
查詢本校圖書館目錄 查詢臺灣博碩士論文知識加值系統 勘誤回報
  • 目前光學式自動對焦模組在光斑的影像處理部分常會遇到因為系統組裝誤差、環境雜訊等因素,使得無法用簡單的尋圓方法來描述光斑之各種資訊,而本實驗室之自動對焦技術雖已有數年之研究基礎,然而卻有系統架構龐大、控制程式無法整合等缺點。
    本論文以既有的自動對焦架構為基礎,開發出一套能夠快速計算出光斑理想橢圓中心及有效補償因各種誤差造成的對焦特徵曲線不夠線性的演算法,利用這個演算法,無論是長行程或是短行程的自動對焦架構之精度及速度均能有效提升,最佳精度可低至1 μm以下。
    本論文亦基於方便操作、簡明扼要與美觀等產品化的因素重新編寫使用者介面,結合新提出的演算法,開發出一套整合馬達控制、自動對焦與即時監測的控制軟體。最後再將光路整合至一110 mm × 80 mm × 80 mm方盒結構中,完成系統光路模組化,為產品化鋪路。

    At present, the image processing part of optical autofocus modules often have various factors, which make it impossible to describe the image information of the semi (elliptical) circular speckle with a simple circle-finding method. Although lots of domestic institutions have been researching in optical autofocusing field for several years, there are disadvantages such as huge system architecture and difficulty in integrating system control programs.
    This thesis has developed a set of algorithms that can quickly calculate the ideal ellipse center of the spot and effectively compensate the linearity of the focusing characteristic curve. By using the proposed algorithms, the autofocusing accuracy and speed can be effectively improved, and the best accuracy can be as low as 1 μm.
    In addition, the user interface has been rewritten from the user's point of view, combined with the newly proposed algorithm and a set of control software that integrates motor control, autofocus and real-time monitoring has been developed. Finally, the optical system has been miniaturized into a 110 mm × 80 mm × 80 mm box to complete the system modularization, paving the way for future productization.

    摘要         I ABSTRACT         II 致謝         X 目錄         XI 圖目錄         XIII 表目錄         XVI 第一章 緒論         1 1-1 研究背景       1 1-2 研究動機與目的       2 1-3 論文架構       3 第二章 文獻回顧       4 2-1 影像式自動對焦文獻回顧     4 2-2 光學式自動對焦文獻回顧     10 2-3 橢圓擬合演算法與技術之文獻回顧   27 第三章 基礎理論       31 3-1 三角測距法       31 3-2 影像處理       35 3-3 橢圓相關數學公式       39 3-4 小結          40 第四章 系統架構及量測方法     41 4-1 元件介紹       41 4-2 雷射自動對焦系統     44 4-3 離焦距離與方向之判讀     46 4-4 特徵曲線與自動聚焦流程     47 4-5 同軸視覺即時影像系統     49 第五章 實驗原始數據與演算法   50 5-1 實驗架構       50 5-2 橢圓光斑補償演算法     52 5-2 長行程對焦光斑影像資訊之原始數據 54 5-3 短行程對焦光斑影像資訊之原始數據 60 5-4 數據補償演算法       64 5-5 小結         69 第六章 實驗結果及討論     70 6-1 系統控制程式介面     70 6-2 長行程自動對焦量測結果     72 6-3 短行程自動對焦量測結果     74 第七章 光路系統小型化設計與驗證   82 7-1 光路小型化設計及模擬     83 7-2 模組結構設計       84 7-3 自動對焦模組組裝     86 7-4 自動對焦測試       86 7-5 精度驗證       88 第八章 結論與未來規劃     90 8-1 結論         90 8-2 未來規劃       91 8-3 總結與未來展望       95 參考文獻         96

    [1] H. S. Liao, G. T. Huang, H. D. Tu, T. H. Lin, and E. T. Hwu, "A novel method for quantitative height measurement based on an astigmatic optical profilometer," Measurement Science and Technology, vol. 29, no. 10, 2018.
    [2] Z. F. Zhang, Q. B. Feng, Z. Gao, C. F. Kuang, C. Fei, Z. Li, and J. Y. Ding, "A new laser displacement sensor based on triangulation for gauge real-time measurement," Optics & Laser Technology, vol. 40, no. 2, pp. 252-255, 2008.
    [3] C. S. Liu, P. D. Lin, P. H. Lin, S. S. Ke, Y. H. Chang, and J. B. Horng, "Design and Characterization of Miniature Auto-Focusing Voice Coil Motor Actuator for Cell Phone Camera Applications," IEEE Transactions on Magnetics, vol. 45, no. 1, pp. 155-159, 2009.
    [4] C. S. Liu, S. S. Ko, and P. D. Lin, "Experimental Characterization of High-Performance Miniature Auto-Focusing VCM Actuator," IEEE Transactions on Magnetics, vol. 47, no. 4, pp. 738-745, 2011.
    [5] H. Asher, L. Dodin, and P. Mulholland, "Improved design for an auto-focus range-finder," Journal of Scientific Instruments, 1960.
    [6] L. Baxter, J. DeYoung, S. George, and W. A. Shurcliff, "New Principle for Focusing a High-Power Microscope and Means for Accomplishing the Focusing Automatically and with Great Accuracy," Journal of the Optical Society of America, 1956.
    [7] 江昇鴻, "Design and analysis of novel optics-based autofocusing microscope," M.S. thesis, Dept. Mechanical Engineering, National Central University, 2013.
    [8] 楊駿億, "Comparison of dual-confocal and knife’s center of gravity methods for optical autofocusing systems," M.S. thesis, Dept. Mechanical Engineering, National Central University, 2016.
    [9] C. S. Liu, P. H. Hu, and Y. C. Lin, "Design and experimental validation of novel optics-based autofocusing microscope," Applied Physics B, vol. 109, no. 2, pp. 259-268, 2012.
    [10] C. S. Liu and S. H. Jiang, "A novel laser displacement sensor with improved robustness toward geometrical fluctuations of the laser beam," Measurement Science and Technology, vol. 24, no. 10, 2013.
    [11] C. S. Liu and S. H. Jiang, "Design and experimental validation of novel enhanced-performance autofocusing microscope," Applied Physics B, vol. 117, no. 4, pp. 1161-1171, 2014.
    [12] C. S. Liu and S. H. Jiang, "Precise autofocusing microscope with rapid response," Optics and Lasers in Engineering, vol. 66, pp. 294-300, 2015.
    [13] C. S. Liu and K. W. Lin, "Numerical and experimental characterization of reducing geometrical fluctuations of laser beam based on rotating optical diffuser," Optical Engineering, vol. 53, no. 12, 2014.
    [14] C. S. Liu, Y. C. Lin, and P. H. Hu, "Design and characterization of precise laser-based autofocusing microscope with reduced geometrical fluctuations," Microsystem Technologies, vol. 19, no. 11, pp. 1717-1724, 2013.
    [15] C. S. Liu, R. C. Song, and S. J. Fu, "Design of a laser-based autofocusing microscope for a sample with a transparent boundary layer," Applied Physics B, vol. 125, no. 11, 2019.
    [16] C. S. Liu, Z. Y. Wang, and Y. C. Chang, "Design and characterization of high-performance autofocusing microscope with zoom in/out functions," Applied Physics B, vol. 121, no. 1, pp. 69-80, 2015.
    [17] K. Koh, "Autofocus method using dual aperture and color filters," Journal of Electronic Imaging, vol. 20, no. 3, 2011.
    [18] S. Lee, J. Y. Lee, W. Yang, and D. Y. Kim, "Autofocusing and edge detection schemes in cell volume measurements with quantitative phase microscopy," Optics Express, vol. 17, no. 8, pp. 6476-6486, 2009.
    [19] P. Langehanenberg, B. Kemper, D. Dirksen, and G. von Bally, "Autofocusing in digital holographic phase contrast microscopy on pure phase objects for live cell imaging," Applied Optics, vol. 47, no. 19, pp. D176-82, Jul 1 2008.
    [20] T. Kim and T. C. Poon, "Autofocusing in optical scanning holography," Applied Optics, vol. 48, no. 34, pp. H153-9, 2009.
    [21] S. Schaefer, S. A. Boehm, and K. J. Chau, "Automated, portable, low-cost bright-field and fluorescence microscope with autofocus and autoscanning capabilities," Applied Optics, vol. 51, no. 14, pp. 2581-8, May 10 2012.
    [22] M. Yamana, N. Nagasawa, H. Konishi, and Y. Takahama, "Automatic focal-point sensing apparatus sensing high and low magnification," U.S. Patent 5 245 173, Sep. 14, 1993.
    [23] S. J. Abdullah, "Error-based autofocus system using image feedback in a liquid-filled diaphragm lens," Optical Engineering, vol. 48, no. 12, 2009.
    [24] C.-H. Chen and T.-L. Feng, "Fast 3D shape recovery of a rough mechanical component from real time passive autofocus system," The International Journal of Advanced Manufacturing Technology, vol. 34, no. 9-10, pp. 944-957, 2006.
    [25] G. Fu, Y. Cao, and M. Lu, "A fast auto-focusing method of microscopic imaging based on an improved MCS algorithm," Journal of Innovative Optical Health Sciences, vol. 08, no. 05, 2015.
    [26] J. A´lvarez-Borrego, "Fast autofocus algorithm for automated microscopes," Optical Engineering, vol. 44, no. 6, 2005.
    [27] J. Jeon, I. Yoon, D. Kim, J. Lee, and J. Paik, "Fully digital auto-focusing system with automatic focusing region selection and point spread function estimation," IEEE Transactions on Consumer Electronics, vol. 56, no. 3, pp. 1204-1210, 2010.
    [28] H. Oku, M. Ishikawa, Theodorus, and K. Hashimoto, "High-speed autofocusing of a cell using diffraction patterns," Optics Express, vol. 14, no. 9, pp. 3952-3960, 2006.
    [29] M. Moscaritolo, H. Jampel, F. Knezevich, and R. Zeimer, "An image based auto-focusing algorithm for digital fundus photography," IEEE Transactions on Medical Imaging, vol. 28, no. 11, pp. 1703-7, 2009.
    [30] S. L. Brazdilova and M. Kozubek, "Information content analysis in automated microscopy imaging using an adaptive autofocus algorithm for multimodal functions," Journal Microscopy, vol. 236, no. 3, pp. 194-202, 2009.
    [31] Y. Liron, Y. Paran, N. G. Zatorsky, B. Geiger, and Z. Kam, "Laser autofocusing system for high-resolution cell biological imaging," Journal Microscopy, vol. 221, no. Pt 2, pp. 145-51, 2006.
    [32] E. F. Wright, D. M. Wells, A. P. French, C. Howells, and N. M. Everitt, "A low-cost automated focusing system for time-lapse microscopy," Measurement Science and Technology, vol. 20, no. 2, 2009.
    [33] H. C. Chang, T. M. Shih, N. Z. Chen, and N. W. Pu, "A microscope system based on bevel-axial method auto-focus," Optics and Lasers in Engineering, vol. 47, no. 5, pp. 547-551, 2009.
    [34] K. A. Serrels, E. Ramsay, R. J. Warburton, and D. T. Reid, "Nanoscale optical microscopy in the vectorial focusing regime," Nature Photonics, vol. 2, no. 5, pp. 311-314, 2008.
    [35] S. Yousefi, M. Rahman, and N. Kehtarnavaz, "A new auto-focus sharpness function for digital and smart-phone cameras," IEEE Transactions on Consumer Electronics, vol. 57, no. 3, pp. 1003-1009, 2011.
    [36] C. W. Chiu, P. C. P. Chao, and D. Y. Wu, "Optimal Design of Magnetically Actuated Optical Image Stabilizer Mechanism for Cameras in Mobile Phones via Genetic Algorithm," IEEE Transactions on Magnetics, vol. 43, no. 6, pp. 2582-2584, 2007.
    [37] C. Y. Chen, R. C. Hwang, and Y. J. Chen, "A passive auto-focus camera control system," Applied Soft Computing, vol. 10, no. 1, pp. 296-303, 2010.
    [38] J. H. Lee, Y. S. Kim, S. R. Kim, I. H. Lee, and H. J. Pahk, "Real-time application of critical dimension measurement of TFT-LCD pattern using a newly proposed 2D image-processing algorithm," Optics and Lasers in Engineering, vol. 46, no. 7, pp. 558-569, 2008.
    [39] J. Liu, Y. X. Zhao, C. Guo, W. S. Zhao, Y. T. Zhang, C. L. Guo, and H. Y. Li "Robust autofocusing method for multi-wavelength lensless imaging," Optics Express, vol. 27, no. 17, pp. 23814-23829, 2019.
    [40] S. Yazdanfar, K. B. Kenny, K. Tasimi, A. D. Corwin, E. L. Dixon, and R. J. Filkins, "Simple and robust image-based autofocusing for digital microscopy," Optics Express, vol. 16, no. 12, pp. 8670-7, 2008.
    [41] R. M. Wasserman, K. W. Atherton, and P. G. Gladnick, "Systems and methods for rapidly automatically focusing a machine vision inspection system," European Patent 1 763 221 A1, 2004.
    [42] 賴律臻, "差動式疊紋自動對焦系統," M.S. thesis, Dept. Mechanical Engineering, National Central University, 2011.
    [43] J. Y. Lee, Y. H. Wang, L. J. Lai, Y. J. Lin, and Y. H. Chang, "Development of an auto-focus system based on the moiré method," Measurement, vol. 44, no. 10, pp. 1793-1800, 2011.
    [44] S. Kim, J. Na, M. J. Kim, and B. H. Lee, "Simultaneous measurement of refractive index and thickness by combining low-coherence interferometry and confocal optics," Optics Express, vol. 16, no. 8, pp. 5516-26, 2008.
    [45] M. Haruna, M. Ohmi, T. Mitsuyama, H. Tajiri, H. Maruyama, and M. Hashimoto, "Simultaneous measurement of the phase and group indices and the thickness of transparent plates by low-coherence interferometry," Optics Letters, vol. 23, no. 12, pp. 966-968, 1998.
    [46] T. Fukano and I. Yamaguchi, "Simultaneous measurement of thicknesses and refractive indices of multiple layers by a low-coherence confocal interference microscope," Optics Letters, vol. 21, no. 23, pp. 1942-4, 1996.
    [47] W. V. Sorin and D. F. Gray, "Simultaneous Thickness and Group Index Measurement Using Optical Low-Coherence Reflectometry," IEEE Photonics Technology Letters, vol. 4, no. 1, pp. 105-107, 1992.
    [48] J. Na, H. Y. Choi, E. S. Choi, C. Lee, and B. H. Lee, "Self-referenced spectral interferometry for simultaneous measurements of thickness and refractive index," Applied Optics, vol. 48, no. 13, pp. 2461-7, 2009.
    [49] G. Coppola, P. Ferraro, M. Iodice, and S. De Nicola, "Method for measuring the refractive index and the thickness of transparent plates with a lateral-shear, wavelength-scanning interferometer," Applied Optics, vol. 42, no. 19, pp. 3882-7, 2003.
    [50] J. Park, J. Bae, J. Jin, J. A. Kim, and J. W. Kim, "Vibration-insensitive measurements of the thickness profile of large glass panels," Optics Express, vol. 23, no. 26, pp. 32941-9, 2015.
    [51] C. Moreno-Hernandez, D. Monzon-Hernandez, I. Hernandez-Romano, and J. Villatoro, "Single tapered fiber tip for simultaneous measurements of thickness, refractive index and distance to a sample," Optics Express, vol. 23, no. 17, pp. 22141-8, 2015.
    [52] S. C. Zilio, "Simultaneous thickness and group index measurement with a single arm low-coherence interferometer," Optics Express, vol. 22, no. 22, pp. 27392-7, 2014.
    [53] P. Balling, P. Mašika, P. Křen, and M. Doležal, "Length and refractive index measurement by Fourier transform interferometry and frequency comb spectroscopy," Measurement Science and Technology, vol. 23, no. 9, 2012.
    [54] T. Anna, V. Srivastava, D. S. Mehta, and a. C. Shakher, "High-resolution full-field optical coherence microscopy using a Mirau interferometer for the quantitative imaging of biological cells," Applied Optics, vol. 50, no. 34, pp. 6343-6351, 2011.
    [55] S. Ozharar, D. Akcan, and L. Arda, "Determination of the refractive index and the thickness of double side coated thin films," Journal of Optoelectronics and Advanced Materials, vol. 18, no. 1-2, pp. 65-69, 2016.
    [56] R. Swanepoel, "Determination of the thickness and optical constants of amorphous silicon," Journal of Physics E: Scientific Instruments, vol. 16, no. 12, pp. 1214-1222, 1983.
    [57] T. Pisarkiewicz, A. Czapla, and H. Czternastek, "Influence of Thickness Inhomogeneity on the Determination of Optical-Constants of Amorphous-Silicon Thin-Films," Applied Surface Science, vol. 65-6, pp. 511-514, 1993.
    [58] Y.-S. Hsieh, Y.-J. Lu, and Y.-S. Chang, "快速橢偏單層膜計算模組開發," 儀科新知, pp. 40-48, 2012.
    [59] D. Pristinski, V. Kozlovskaya, and S. A. Sukhishvili, "Determination of film thickness and refractive index in one measurement of phase-modulated ellipsometry," Journal of the Optical Society of America. A, Optics, image science, and vision, vol. 23, no. 10, pp. 2639-44, 2006.
    [60] A. Evmenova, V. Odarych, M. Vuichyk, and F. Sizov, "Ellipsometric Analysis of Cadmium Telluride Films’ Structure," Advances in Materials Science and Engineering, vol. 2015, pp. 1-11, 2015.
    [61] M. Muth, R. P. Schmid, and K. Schnitzlein, "Ellipsometric study of molecular orientations of Thermomyces lanuginosus lipase at the air-water interface by simultaneous determination of refractive index and thickness," Colloids and Surfaces B: Biointerfaces, vol. 140, pp. 60-66, 2016.
    [62] C. Chou, H.-K. Teng, C.-J. Yu, and H.-S. Huang, "Polarization modulation imaging ellipsometry for thin film thickness measurement," Optics Communications, vol. 273, no. 1, pp. 74-83, 2007.
    [63] S. Srisuwan, C. Sirisathitkul, and S. Danworaphong, "Validiation of Photometric Ellipsometry for Refractive Index and Thickness Measurements," Mapan, vol. 30, no. 1, pp. 31-36, 2014.
    [64] D. K. Cohen, W. H. Gee, M. Ludeke, and J. Lewkowicz, "Automatic Focus Control - the Astigmatic Lens Approach," Applied Optics, vol. 23, no. 4, pp. 565-570, 1984.
    [65] W. Y. Hsu, C. S. Lee, P. J. Chen, N. T. Chen, F. Z. Chen, Z. R. Yu, C. H. Kuo and C. H. Hwang, "Development of the fast astigmatic auto-focus microscope system," Measurement Science and Technology, vol. 20, no. 4, 2009.
    [66] C. H. Liu, C. C. Liu, and W. C. Huang, "Application of astigmatic method and snell’s law on the thickness and refractive index measurement of a transparent plate," Microsystem Technologies, vol. 19, no. 11, pp. 1761-1766, 2013.
    [67] C. H. Liu, S. C. Yeh, and H. L. Huang, "Thickness measurement system for transparent plates using dual digital versatile disc (DVD) pickups," Applied Optics, vol. 49, no. 4, pp. 637-643, 2010.
    [68] H. G. Rhee, D. I. Kim, and Y. W. Lee, "Realization and performance evaluation of high speed autofocusing for direct laser lithography," Review of Scientific Instruments, vol. 80, no. 7, p. 073103, 2009.
    [69] W. J. Smith, Modern Optical Engineering - The Design of Optical Systems, 3rd ed., McGraw-Hill Education, 2007.
    [70] J. Zhang, R. Ding, X. Yan, L. Li, and Z. Han, "Application of the astigmatic method to the thickness measurement of glass substrates," Applied Optics, vol. 47, pp. 3968-3972, 2008.
    [71] J. A. Kim, J. W. Kim, T. B. Eom, J. Jin, and C. S. Kang, "Vibration-insensitive measurement of thickness variation of glass panels using double-slit interferometry," Optics Express, vol. 22, no. 6, pp. 6486-94, 2014.
    [72] Y. Fujimoto, H. Endo, T. Yoneyama, and Y. Amano, "Focus detecting device for an optical apparatus," U. S. Patent 6 649 893 B2, 2003.
    [73] S. J. Lee and D. Y. Chang, "A laser sensor with multiple detectors for freeform surface digitization," The International Journal of Advanced Manufacturing Technology, vol. 31, no. 11-12, pp. 1181-1190, 2006.
    [74] B. X. Cao, P. L. Hoang, S. Ahn, H. Kang, J. Kim, and J. Noh, "High-Speed Focus Inspection System Using a Position-Sensitive Detector," Sensors, vol. 17, no. 12, 2017.
    [75] 平田和也, 原口康史, and シグマ光機株式会社, "フォーカス調整装置及び方法 Focus adjustment device and method," Japan Patent 2012-113174 A, 2012.
    [76] Y. Wang, L. Qiu, W. Zhao, M. Song, and Z. Li, "Broad wavelength range infrared lens refractive index measurement using confocal tomography," Optics Express, vol. 25, no. 23, 2017.
    [77] J. F. Wang, M. Yang, L. Yang, Y. Zhang, J. Yuan, Q. Liu, X. H. Hou, and L. Fu, "A Confocal Endoscope for Cellular Imaging," Engineering, vol. 1, no. 3, pp. 351-360, 2015.
    [78] J. Poris, "Dual spot confocal displacement sensor," U. S. Patent 6 657 216 B1, 2003.
    [79] Y. H. Wang, P. H. Hu, Y. C. Lin, S. S. Ke, Y. H. Chang, C. S. Liu, and J. B. Horng, "Dual-confocal auto-focus sensing system in ultrafast laser application," IEEE Sensors Journal, pp. 486-489, 2010.
    [80] L. C. Chen, D. T. Nguyen, and Y. W. Chang, "Precise optical surface profilometry using innovative chromatic differential confocal microscopy," Optics Letters, vol. 41, no. 24, pp. 5660-5663, 2016.
    [81] W. C. Kuo, Y. K. Bou, and C. M. Lai, "Simultaneous measurement of refractive index and thickness of transparent material by dual-beam confocal microscopy," Measurement Science and Technology, vol. 24, no. 7, 2013.
    [82] T. Boettcher, M. Gronle, and W. Osten, "Multi-layer topography measurement using a new hybrid single-shot technique: Chromatic Confocal Coherence Tomography (CCCT)," Optics Express, vol. 25, no. 9, pp. 10204-10213, 2017.
    [83] G. Min, J. W. Kim, W. J. Choi, and B. H. Lee, "Numerical correction of distorted images in full-field optical coherence tomography," Measurement Science and Technology, vol. 23, no. 3, 2012.
    [84] G. Min, W. J. Choi, J. W. Kim, and B. H. Lee, "Refractive index measurements of multiple layers using numerical refocusing in FF-OCT," Optics Express, vol. 21, no. 24, pp. 29955-67, 2013.
    [85] J. Yao, J. Huang, P. Meemon, M. Ponting, and J. P. Rolland, "Simultaneous estimation of thickness and refractive index of layered gradient refractive index optics using a hybrid confocal-scan swept-source optical coherence tomography system," Optics Express, vol. 23, no. 23, pp. 30149-64, 2015.
    [86] T. Boettcher, M. Gronle, and W. Osten, "Single-shot multilayer measurement by chromatic confocal coherence tomography," SPIE Conference Proceedings 10329, Optical Measurement Systems for Industrial Inspection X, pp. 103290K, 2017.
    [87] R. C. Gonzalez, R. E. Woods, and S. L. Eddins, Digital Image Processing Using MATLAB. Pearson Prentice Hall, 2004.
    [88] Y. Fujishiro, T. Furukawa, and S. Maruo, "Simple autofocusing method by image processing using transmission images for large-scale two-photon lithography," Optics Express, vol. 28, no. 8, pp. 12342-12351, 2020.
    [89] J. P. Crooks, S. E. Bohndiek, C. D. Arvanitis, R. Speller, H. XingLiang, E. G. Villani, M. Towrie, and R. Turchetta, "A CMOS Image Sensor With In-Pixel ADC, Timestamp, and Sparse Readout," IEEE Sensors Journal, vol. 9, no. 1, pp. 20-28, 2009.
    [90] A. Spivak, A. Belenky, and O. Yadid-Pecht, "Very Sensitive Low-Noise Active-Reset CMOS Image Sensor With In-Pixel ADC," IEEE Transactions on Circuits and Systems II: Express Briefs, vol. 63, no. 10, pp. 939-943, 2016.
    [91] D. S. Barwick, "Very fast best-fit circular and elliptical boundaries by chord data," IEEE Trans Pattern Anal Mach Intell, vol. 31, no. 6, pp. 1147-52, 2009.
    [92] W. Y. Hsu, "Automatic Compensation for Defects of Laser Reflective Patterns in Optics-Based Auto-Focusing Microscopes," IEEE Sensors Journal, vol. 20, no. 4, pp. 2034-2044, 2020.
    [93] K. R. Spring and M. W. Davidson. "Infinity Optical Systems." [Online]. Available: https://www.olympus-lifescience.com/en/microscope-resource/primer/anatomy/infinityintro/
    [94] Wise Device INC. "Auto Focus Sensors." [Online]. Available: https://www.wdidevice.com/products/
    [95] 黃家麟, "自動對焦系統、方法及影像檢測儀器," Taiwan Patent I607253 B, 2017.
    [96] H. Pinkard, Z. Phillips, A. Babakhani, D. A. Fletcher, and L. Waller, "Deep learning for single-shot autofocus microscopy," Optica, vol. 6, no. 6, 2019.

    無法下載圖示 校內:2026-10-13公開
    校外:2026-10-13公開
    電子論文尚未授權公開,紙本請查館藏目錄
    QR CODE