| 研究生: |
黃雅伶 Huang, Ya-Ling |
|---|---|
| 論文名稱: |
用懲罰比率修正的製程能力指標 The Modifications of Process Capability Index Based on The Penalty Ratio |
| 指導教授: |
呂金河
Leu, Ching-Ho |
| 學位類別: |
碩士 Master |
| 系所名稱: |
管理學院 - 統計學系 Department of Statistics |
| 論文出版年: | 2004 |
| 畢業學年度: | 92 |
| 語文別: | 中文 |
| 論文頁數: | 109 |
| 中文關鍵詞: | 不對稱規格 、對稱規格 、均方差 、懲罰比率 、偏量 |
| 外文關鍵詞: | symmetrical specificat, MSE, bias, penalty ratio |
| 相關次數: | 點閱:56 下載:2 |
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近年來,製程能力指標(Process Capability Index)已經非常廣泛地應用於品質管理上。製程能力指標用來表示製造過程中所產出產品的能力的優劣,在實際應用上,仍以傳統上的Cp與Cpk指標最為常用。但此些指標仍有一些缺失處,尤其是在不對稱規最為明顯。本文以偏移量與容差(tolerance)之比產生的懲罰比率來修正常見的指標Cp與Cpk,因此提出了六個新指標。文內探討這些新指標的估計式及其統計性質,並因此修正估計式找出偏量與均方差較小的估計方法。結果顯示無論在對稱規格或不對稱規格下,新指標的表現比較不會傾向極端且能反映出真實的製程能力。
In recent, Process Capability Index (PCI) has already used in the quality management extensively. The value of PCI can use to decide the capability of the production fit in with the process specifications. In real world, the most popular indices are Cp and Cpk. But these indices still have some defects, especially in asymmetrical specifications. We take a penalty ratio from the ratio of the shift to tolerance to modify the Cp index and Cpk index. We therefore bring up six new indices. The estimators of the new indices and their statistical properties are discussed. We find that the naive estimator can be modified such that the new estimator has smaller bias and MSE. It shows the performances of the new indices don’t tend to extreme and can reflect the real process capability under the symmetrical or asymmetrical specification.
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