本研究基於史托克參數法及繆勒矩陣量測垂直向列型液晶盒之偏極光學特性，並藉以推算液晶盒的物理參數，包含厚度、預傾角、以及主軸方向。因液晶本身依其排列模式會產生不同的光學異相性及旋光性，利用瓊斯矩陣建立光學模型，再轉換為繆勒矩陣後即可模擬特定偏極光經液晶盒樣本後的偏極態改變。本研究分析其物理參數與光學參數的關聯性後，可以設計並建立一套反推液晶盒物理參數的實驗架構及演算法。相較於基因演算法，此方法具有較高的可靠性以及簡便的演算流程，且可以得到唯一解。
經模擬及實驗驗證，本研究所開發的演算法可以反推垂直向列型液晶之厚度、預傾角、以及主軸方向。而誤差及環境造成的影響也以程式模擬分析，可作為實際設計專用機台時的參考。

In this study, a method is proposed for determining the cell gap, pretilt angle and azimuth angle of vertical alignment liquid crystal devices (VA-LCDs), which is base on Jones matrix and Stokes parameters method. Because VA-LCD is both a linear birefringence and circular birefringence material, we can measure the output Stokes parameters with specific polarization state incidence and determine the physical parameters of VA-LCD samples. This study also analysis the relation between the physical parameters and the Stokes vectors, and design an effective algorithm by using iterative method. Compare with the genetic algorithm, iterative method can solve the variables faster.
The accuracy of algorithm has been confirmed by simulations, and the errors are also determined in this study. These achievements can help us to design similar systems.

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池弘偉，全場式光學外差干涉儀應用於量測雙折射晶體光學參數之設計與研究，國立成功大學機械工程研究所碩士論文，2005.