石墨烯，一種厚度只有一到數原子層的材料，且具有特殊的光學、力學及電學特性，所以在研發新式的奈米元件上具有很高的應用潛力，是近年來最熱門的薄膜材料。為了瞭解石墨烯的各項特性，科學家們利用許多量測技術去探討石墨烯，其中又以拉曼光譜是特別重要的工具，因為石墨烯的拉曼光譜可以用來探討石墨烯的特性、層數……等等。在本論文中，首先，將會介紹石墨烯以及懸掛式石墨烯的拉曼光譜。接著，由於石墨烯的拉曼訊號十分微弱，我們利用表面電漿增強的技術來增強拉曼訊號，為了瞭解石墨烯與金屬奈米粒子的關係或著金屬奈米粒子與金屬奈米粒子之間的關係，我們利用近場光學模式下的探針加強式拉曼光譜的技術來探討。最後，石墨烯上應變或應力是一種重要的特性，因此，如何量測及探索石墨烯上未知的應變或應力是一個重要的科學問題。我們利用偏振拉曼光譜來探索石墨烯固有的應變或應力，藉由不同的激發光源來量測與比較之外，還有利用表面電漿增強的技術來增強拉曼訊號來增加量測的效率。而根據上述的研究，我們相信對於石墨烯在光學上或電子元件上的應用會更有幫助。

Graphene is the thin material with one to several atomic layers. Graphene is one of the most popular membranous films with great potential on fabricating new types of nanodevices because of its unique optical, mechanical, and electrical properties. Scientists have utilized many detection techniques to investigate the electronic or optical characteristics of graphene. Among these, Raman spectroscopy is the most important tool. Because of the Raman spectrum of graphene can be used to explore the properties of graphene and the few layers of graphene. In this thesis, the Raman spectroscopy of graphene and suspended graphene will be introduced first. Then, we used the technique of surface enhanced Raman scattering (SERS) to enhance the Raman signal. In order to realize the relationship between graphene and metal nanoparticles or metal nanoparticle and metal nanoparticle, we use the tip-enhanced Raman scattering (TERS) to observe the phenomenon. Previous studies provided insufficient information in strain or stress on graphene. We measured the strain or stress on graphene by using the polarized Raman spectroscopy to compare different excited sources, and using the SERS to enhance measurement efficiency. The results of present study provided very useful information of graphene in application of optical and electrical devices.

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