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研究生: 劉芝華
Liu, Chih-Hua
論文名稱: 以自旋幫浦機制探討氧化鋅之自旋擴散長度
Study of Spin Diffusion Length in ZnO via Spin Pumping Mechanism
指導教授: 黃榮俊
Huang, J. C. A.
學位類別: 碩士
Master
系所名稱: 理學院 - 物理學系
Department of Physics
論文出版年: 2016
畢業學年度: 104
語文別: 中文
論文頁數: 53
中文關鍵詞: 釔鐵石榴石氧化鋅自旋幫浦反轉自旋霍爾效應自旋擴散長度
外文關鍵詞: YIG, ZnO, spin pumping, inverse spin hall effect, spin diffusion length
相關次數: 點閱:80下載:4
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  • 以脈衝雷射鍍膜儀成長Pt/ZnO/YIG三層薄膜結構,並以RHEED、XRD、AFM檢測薄膜品質,再將該三層薄膜應用至自旋幫浦系統中,並量測其產生之反轉自旋霍爾效應電壓。將此電壓訊號及鐵磁共振訊號一併討論,並與Pt/YIG雙層薄膜量測出之反轉自旋霍爾效應電壓比較,可利用模型推演出氧化鋅之自旋擴散長度,該模型特色為周全考慮於同樣條件下成長之薄膜可能存在樣品差異性。而推導出之氧化鋅自旋擴散長度為1.01~6.77 nm,並由實驗結果得知氧化鋅之自旋擴散長度可藉由改變氧化鋅之成長氧壓以調控。

    Study of Spin Diffusion Length in ZnO via Spin Pumping Mechanism

    Author : Chih-Hua Liu
    Advisor : J. C. A. Huang
    Department of Physics, National Chen Kung University

    SUMMARY

    Spin diffusion length λ stands for the characteristic length which spin current maintains its original spin state. λ of heavy spin orbital coupling material such as Platinum, Tantalum etc. are known and are about just few nanometers. If we are able to realize λ of other materials that are longer than few nanometers, then we can utilize the material as a transmission layer and transport spin current through it. ZnO is a promising semiconductor with wide band gap and large exciton binding energy. Besides, it is transparent, costs less and can be widely applied. Therefore, we would like to discuss the spin diffusion length of ZnO. In this work, our sample preparation are YIG(Y3Fe5O12)/ZnO/Pt trilayer with different thickness of ZnO(0, 2, 4, 10, 40 nm). Through comparing the inverse spin hall effect voltage of YIG/Pt and YIG/ZnO/Pt generated by spin pumping, one can derive the spin diffusion length of ZnO.

    Key words:YIG, ZnO, spin pumping, spin diffusion length

    INTRODUCTION

    Spin current possesses a lot more benefits than charge current such as lower energy consuming, higher storage of quantum information and faster velocity. The spin pumping mechanism enables spin current generation from ferromagnetic resonance of ferromagnetic layer and injection into normal metal. Due to the strong spin-orbit coupling of normal metal, the spin current will be converted into charge current, which is so-called inverse spin hall effect. Spin transport has been studied intensively since the spintronic had been developed. Through inserting a layer into FM/NM bilayer, the transmission properties of the middle layer might be studied by spin pumping.
    One of the transmission properties is the spin diffusion length, which stands for the characteristic length that spin current maintains its original spin state. The spin diffusion length might be the key to other transmission properties. Therefore, discussing spin diffusion length might reveal more information of spin current transmission. ZnO is a promising semiconductor with wide band gap and high optical transmittance, besides its carrier concentration can be tuned easily through defect or oxygen vacancies. For industrial use, ZnO is a perfect material since it is low cost and eco-friendly. From above, we know that ZnO could be applied in multiple ways. Since no one has ever discussed the spin diffusion length of ZnO through spin pumping. I think it would be an important event if we find out the spin diffusion length of ZnO.

    MATERIAL AND METHODS

    In our study, it requires Pt/YIG bilayer and Pt/ZnO/YIG trilayer samples. First, we grow these samples in-situ in pulsed laser deposition. The growth parameters of these materials including temperature, laser energy, repetition, oxygen pressure are 860℃, 1.412 J/cm2, 5 Hz, 10-1 torr for YIG respectively. For ZnO, the parameters are 600℃, 1 J/cm2, 2 Hz, 10-7 torr. Finally, we grow Pt at room temperature with laser energy 4.68 J/cm2 and in ultrahigh vacuum chamber. Then confirm the crystal quality by RHEED, XRD and AFM. After checking the quality, we place our samples in spin pumping system and measured the inverse spin hall effect voltage. Through comparing the voltage of bilayer and trilayer samples and considering the sample difference due to slightly difference of operation, we define the sample difference factor
    f=(V_ISHE (d_ZnO))/(V_ISHE (d_ZnO=0)) (R_Pt (R_Pt^'+R_ZnO))/(R_Pt^' R_ZnO ) L/L' (tanh⁡(d_Pt/(2λ_Pt )))/(tanh⁡((d_Pt^')/(2λ_Pt ))) (J_S1^0)/J_S1^0',
    and we assume that the spin current density injected from YIG to ZnO J_s1^0 decays exponentially while transmit through ZnO. Therefore the spin current density at the Pt/ZnO interface J_s2^0 is equal to J_s1^0 exp⁡(-d_ZnO⁄λ_ZnO ). Combining the sample difference factor f and the concept of spin current density decay, we are able to derive the spin diffusion length of ZnO though the equation below

    Here,V_ISHE (d_ZnO) is ISHE voltage of trilayer, ,V_ISHE (d_ZnO=0) is ISHE voltage of bilayer, R_Pt is the resistance of Pt, of bilayer, R_Pt' is the resistance of Pt of trilayer R_ZnO is the resistance of ZnO, L is the length of bilayer, L' is the length of trilayer, d_Pt is the thickness of Pt, λ_Pt is the spin diffusion length of Pt, J_S1^0' is spin current density injected from YIG to ZnO in trilayer sample and J_S1^0' is the spin current density injected from YIG to Pt in bilayer sample. In Eqn. (1), the spin current density J_s1^0,J_s1^0' could be calculated by the ferromagnetic resonance result. For the spin diffusion length of Pt, we utilize the result derived by E. Saitoh and his group, and its spin diffusion length is 7.7±0.3 nm.

    RESULT AND DISCUSSION

    After growing thin film, we have to check the crystal quality and surface morphology through RHEED, XRD and AFM. Figure 1 shows the RHEED pattern, XRD and AFM of YIG. In Figure 1., one can see that the thin film is really high quality and the roughness Rq of the YIG surface is 0.331 nm.

    Figure 1. (a) RHEED pattern (b) XRD spectra (c) AFM of YIG
    Also, the quality of ZnO must be confirmed. Therefore, the RHEED, XRD and AFM result is shown in Figure 2. In Figure 2., the RHEED pattern shows great crystal structure for ZnO growing on YIG. The XRD spectra shows there is no other crystal orientation except ZnO(0001) when ZnO grows on YIG, and the AFM roughness Rq is 0.575 nm.

    Figure 2. (a) RHEED pattern on YIG (b) XRD spectra on YIG and Al2O3 (c) AFM of ZnO
    samples with different ZnO thickness (2, 4, 10, 40 nm). We place all these samples into our spin pumping system, and measure the FMR spectra and ISHE voltage. We find out that only the ISHE voltage of the sample Pt/ZnO(2 nm)/YIG can be measured. Figure 3. shows the ISHE voltage of the Pt/ZnO(2 nm)/YIG sample under multiple microwave frequency and multiple microwave power. In Figure 1(a) one can obviously see the symmetric signal in positive and negative magnetic field, and Figure 1(b) shows the linear dependent relation between microwave power and ISHE voltage.
    Figure 3 (a) ISHE voltage under different mw frequency (b) ISHE voltage under different mw power
    We compare the voltage of this sample with Pt/YIG sample ISHE voltage and calculate the sample difference factor for both samples. Finally, we derive the spin diffusion length of ZnO under different frequency. Table 1. shows derived spin diffusion length of ZnO under different microwave frequency. Then we take average and get the average value of ZnO spin diffusion length is λ_ZnO=1.4163±0.08 nm .
    Frequency (GHz) 2 3 4 5 Average
    λZnO (nm) 1.51 1.38 1.54 1.33 1.42±0.08
    Table 1. Spin diffusion length under different mw frequency
    In addition to the spin diffusion length of pure ZnO grown in 10-7 torr oxygen atmosphere, we discuss the spin diffusion length of ZnO which is doped with other elements and which is grown in higher oxygen atmosphere. Table 2. shows the comparison between pure ZnO grown in 10-7- torr and ZnO with dopant. In Table 2. we can see that the spin diffusion length of ZnO:Al and ZnO:Bi both decrease. We speculate that the spin diffusion length of ZnO:Al decrease due to the carrier concentration increase. In ZnO:Bi sample, the spin diffusion length decrease due to strong spin-orbit coupling probably.
    Material ZnO ZnO:Al 3% ZnO:Bi 5%
    λZnO (nm) 1.42±0.08 1.11±0.24 1.01±0.24
    Table 2. Spin diffusion length of ZnO with dopant
    Table 3. shows the comparison between the spin diffusion length of ZnO grown in different oxygen pressure. In Table 3. the spin diffusion length of ZnO which is grown in 10-2 torr oxygen pressure is the highest. From this result we realize that spin diffusion length could be tuned by growing in higher oxygen atmosphere. However, the spin diffusion length of the one grown in 10-5 torr is the lowest. We speculate that 600℃ might not be the most suitable growth temperature when the thin films are grown in 10-5 torr.
    Material ZnO (10-7 torr) ZnO (10-5 torr) ZnO (10-2 torr)
    λZnO (nm) 1.42±0.08 1.21±0.15 6.77±2.82
    Table 3. Spin diffusion length of ZnO grown in different O2 pressure
    Later, we will keep investigate the factors that affect the transmission properties by discussing the spin diffusion length of ZnO with other dopants or the spin diffusion length of other semiconductors.

    CONCLUSION

    In our study, we successfully measure the ISHE voltage in Pt/ZnO/YIG trilayers an build a model to derive the spin diffusion length of ZnO, which is 1.42±0.08 nm for pure ZnO grown in 10-7 torr oxygen pressure. Besides, we find out that the spin diffusion length could be tuned by changing oxygen pressure. We think that the transmission properties might be affected by carrier concentration, band gap, resistance and so on. It’s quite interesting and worth for us to discuss deeply.

    摘要 II Abstract III 誌謝 VIII 圖目錄 XI 表目錄 XIV 第一章、緒論 1 1-1前言 1 1-2 自旋幫浦機制之文獻回顧 3 1-3橫向式自旋流傳輸之文獻回顧 7 1-4縱向式自旋流傳輸之文獻回顧 9 1-5 研究動機 13 第二章、相關理論介紹 14 2-1氧化鋅之特性(Zinc oxide,ZnO)[19] 14 2-1-1 氧化鋅簡介 14 2-1-2氧化鋅晶格結構 14 2-1-3氧化鋅薄膜 15 2-2釔鐵石榴石之特性(Yttrium iron garnet,YIG)[20, 21] 15 2-3自旋霍爾效應(Spin hall effect) 17 2-4反轉自旋霍爾效應(Inverse spin hall effect)[11, 13] 18 2-5自旋幫浦(Spin pumping)[23] 19 第三章、儀器介紹與實驗步驟 22 3-1脈衝雷射沉積儀(Pulsed Laser Deposition)[25] 22 3-2 反射高能電子繞射儀(RHEED)[25] 24 3-3 原子力顯微鏡(Atomic Force Microscopy,AFM)[26] 26 3-4 超導量子干涉儀(Superconducting Quantum Interference Device Vibrating Sample Magnetometer, SQUID-VSM)[27] 30 3-5 X光薄膜繞射儀(X-Ray Diffractometer)[27] 31 3-6 霍爾效應電性量測(Hall measurement) 32 3-7 自旋幫浦系統(Spin Pumping System)[23] 32 3-8實驗流程 34 3-8-1基板處理: 34 3-8-2靶材製作: 35 3-8-3薄膜成長: 36 3-8-4自旋幫浦系統量測 36 第四章、實驗結果與討論 37 4-1 釔鐵石榴石、氧化鋅、白金三層薄膜結構 37 4-1-1 釔鐵石榴石(YIG)結構及表面粗糙度分析 37 4-1-2 氧化鋅(ZnO)結構、表面分析及電性分析 40 4-2 Pt/ZnO/YIG三層樣品結構分析 41 4-3 Pt/ZnO/YIG三層樣品膜厚分析 43 4-4 Pt/ZnO/YIG三層樣品之自旋幫浦量測 43 4-5氧化鋅自旋擴散長度計算 44 4-6氧化鋅成長氧壓對於自旋擴散長度之影響 47 4-7摻雜元素對氧化鋅自旋擴散長度之改變 48 第五章、結論 50 參考文獻 51

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