| 研究生: |
李文宏 Lee, Wen-Hung |
|---|---|
| 論文名稱: |
IC封裝材料對模具正向及剪向黏著力量之研究 A Study of Mold Adhesion in Shear and Normal Directions for EMC |
| 指導教授: |
李輝煌
Lee, Huei-Huang |
| 學位類別: |
碩士 Master |
| 系所名稱: |
工學院 - 工程科學系 Department of Engineering Science |
| 論文出版年: | 2005 |
| 畢業學年度: | 93 |
| 語文別: | 中文 |
| 論文頁數: | 113 |
| 中文關鍵詞: | 田口方法 、黏著效應 、封膠材料 |
| 外文關鍵詞: | EMC, Adhesion Effects, Taguchi's method |
| 相關次數: | 點閱:106 下載:5 |
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電子IC構裝封膠製程中,封膠材料(EMC;Epoxy Molding Compound)在成型過程中會與IC模具表面產生黏著的現象,稱之為黏著效應(Adhesion Effects);而此黏著效應對於脫模作業過程會有所影響,甚至可能會造成封膠失敗、可靠度不佳與生產良率降低等結果。所以如何在不影響現有模具設計前提下,能夠藉由適當的表面處理以及鍍膜選擇,來有效改善封裝生產線產能,是目前產業界及研究單位所重視的主題。
本研究成功發展出正向與剪向複合黏著力測試系統,並針對不同表面鍍層,執行環保封膠材料(Green Compound)製程參數建立與效益評估此黏著力量,用來量測膠體與模具表面之間的正向與剪向模具沾黏效應。配合田口氏實驗設計法,針對影響IC封裝模具與塑料膠體間黏著力可控制之重要製程參數進行因子效應的評估。此外,藉由正向與剪向黏著力量變化的趨勢,希望可以找出黏著效應發生的原因,確實掌握清模時機,進而增加效益,解決IC封裝過程模具沾黏問題。
In IC packaging, when epoxy molding compound(EMC)is filling the mold cavity and cured in the mold, adhesion effects occurs in the interface between mold surface, substrate, leadframe and EMC. Adhesive effects cause many problems, which may influence the ejection process of the molding, and then cause the package fails, such as wire cut off, lower the yield rate and reliability etc. To get rid of these problems, how to improve the mold design and make suitable surface treatments and specimen coating and improve products yield rate are the main issues for packaging.
This research designs and fabricates an automatic EMC normal and shear composite adhesion force test instrument that will in-situ measure the shear and normal bonding strength between mold surface and EMC. Several important parameters that affect the strength in IC packaging process will also be discussed in this research. A series of experiments were done by using the EMC normal and shear bonding strength tester with the help of Taguchi’s method, one can judge what parameters are important to reduce the magnitude of normal and shear bonding strength between EMC and mold surface.
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