在此研究中，作者提出ㄧ套新的方法來量測扭轉向列型液晶盒之主軸角度、扭轉角、厚度和預傾角，特別是在預傾角方面，可以量測到液晶盒內預傾角的分佈，這個方法是以偏光量測系統為基礎然後結合以穆勒矩陣偏光儀、史托克參數法和基因演算法。在本研究中，使用扭轉向列型液晶盒數學模型來進行誤差分析，藉此測試演算模型的可行性以及穩定性。誤差分析結果顯示在主軸角度部分有0.006°誤差、在扭轉角部分有0.311°誤差、在厚度部分有0.00001μm誤差。
用此新型量測方法量測測試片的結果分別顯示主軸角度為86.979°、扭轉角為90.534°、厚度為10.886μm，預傾角分佈圖亦成功地被逆運算出來。

In this study, the author presents a new approach to determine the azimuthal angle, twist angle, cell gap and pretilt angle of the TNLC cell, especially the inner distributions of tilt angle inside the TNLC cell. This method is based upon the polarization measurement system that combines the Muller-matrix-based polarimeter, the Stokes Parameter Method and Genetic Algorithm. The mathematical model of TNLC cell is used in the simulation process of error analysis so as to test the feasibility and stability of algorithm model. The simulation results with error of equipment accuracy indicate that the error value of the azimuthal angle is 0.006°, the error value of the twist angle is 0.311° and the error value of thickness is 0.00001μm.
The experimental results shows that the extracted values of the azimuthal angle, twist angle, and thickness are , and d=10.886μm, respectively. The extracted pretilt angle distribution is extracted successfully by the new measurement system.

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