| 研究生: |
方怡平 Fang, Yi-Ping |
|---|---|
| 論文名稱: |
利用3-D FEM分析水分對RCP疊合封裝體之等效應變影響 The Effect of Moisture on the Equivalent Strain for the Redistributed Chip Package through the 3-D Finite Element Analysis |
| 指導教授: |
陳榮盛
Chen, Rong-Sheng |
| 學位類別: |
碩士 Master |
| 系所名稱: |
工學院 - 工程科學系 Department of Engineering Science |
| 論文出版年: | 2014 |
| 畢業學年度: | 102 |
| 語文別: | 中文 |
| 論文頁數: | 124 |
| 中文關鍵詞: | 再分配晶片封裝技術 、等效應變 、有限元素分析 |
| 外文關鍵詞: | Redistributed Chip Package, The Equivalent Strain, Finite Element Analysis |
| 相關次數: | 點閱:84 下載:3 |
| 分享至: |
| 查詢本校圖書館目錄 查詢臺灣博碩士論文知識加值系統 勘誤回報 |
濕氣的存在,為近年來的研究的主題,當有水分殘存在封裝體內可能會導致在回焊過程中,材料之間產生爆米花現象而導致脫層,故透過有限元素分析能夠模擬整個過程。
本文之RCP疊合封裝體係由上方超薄型細間距球柵陣列封裝體(VFBGA)經RCP多佈線層技術與下方球閘陣列封裝體(SPBGA)疊合而成。其分析方法採用ANSYS12.0有限元素軟體針對RCP疊合封裝體進行模擬分析,首先在JEDEC規範下給予不同吸濕溫度條件30oC/60%RH與85oC/60%RH,並觀察在回焊過程中,預測封裝體中的溼度分布與去濕後的殘存水分。其次,進行不同的吸濕濕度條件85oC/60%RH與85oC/85%RH,並與先前的結果作比較,以探討不同濕度與不同溫度下對於水分擴散的影響。最後,進行差異分析RCP疊合封裝體之封膠材料之楊氏模數、熱膨脹係數與吸水膨脹係數對於結構之影響,同時可了解各因子對於結構的敏感度。其結果顯示熱膨脹係數為影響結構等效應變最大,其值為0.051476,但敏感度則以吸水膨脹係數較高可達11.3%。
In recent years, the moisture in the package has become the essential issue for research. The residual moisture always leads to the popcorn failure and then interfacial delamination within materials in the reflow process. Hence, the entire process of the package is simulated by finite element analysis.
In this paper, the RCP with PoP (Package on Package) package is constructed by stacking the upper very fine pitch ball grid array (VFBGA) with RCP’s multiple redistribution layers technology on the lower stack package ball grid array (SPBGA). First of all, ANSYS, the finite element software is adopted for simulation analysis. Based on JEDEC, the RCP with PoP model is subject to two conditions, 30oC/60%RH and 85oC/60%RH in the moisture absorption process. In the reflow process, to the moisture distribution and residual moisture with moisture desorption are predicted. Secondly, the different conditions of moisture absorption, 85oC/60%RH and 85oC/85%RH, are subjected to compare with previous results and investigate the effect of different relative humidity and temperature on the moisture diffusion. Finally, the variance analysis is conducted to investigate the impacts of the CTE, Young’s modulus and coefficient of moisture expansion of underfill of RCP with PoP package on the structure. Meanwhile, the sensibility of various parameters for the package is recognized. The results indicate the CTE of underfill on the Von Mises Strain for package is largest and the value is 0.051476. However, the high sensitivity of each parameter for the package is the coefficient of moisture expansion of underfill, and the value is 11.3%.
[1] Chhabra, N., "Freescales Redistributed Chip Packaging (RCP) Ready for Production", Freescale Semiconductor, 2010
[2] Richard L. Shook, Timothy R. Conrad, Solder Member, V. Srirama Sastry, and David B. Steele, “Diffusion Model to Derate Moisture Sensitive Surface Mount IC’s for Factory Use Conditions”, IEEE
[3] Richard L. Shook, Brian T. Vaccaro, and Daniel L. Gerlach, “Method for Equivalent Acceleration of JEDEC/IPC Moisture Sensitivity Levels”IEEE98CH36137. 36th Annual lnternational Reliability Physics Symposium, Reno, Nevada,1998
[4] R. L. Shook, D. L. Gerlach, and B. T. Vaccaro, “Moisture Blocking Planes and Their Effect on Reflow Performance in Achieving Reliable Pb-free Assembly Capability for PBGAs” IEEE Electronic Components and Technology Conference,2001
[5] Jesse E. Galloway and Barry M. Miles, “Moisture Absorption and Desorption Predictions for Plastic Ball Grid Array Package” IEEE Transactions on components, packaging, and manufacturing technology-part A, Vol.20, NO.3, September 1997。
[6] E. H. Wong, K. C. Chan, T. B. Lim, T. F. Lam, “Non-Fickian Moisture Properties Characterisation and Diffusion Modeling for Electronic Package" IEEE Electronic Components and Technology Conference, 1999。
[7] E. H. Wong, S. W. Koh, K. H. Lee, R. Raioo, “Advanced Moisture Diffusion Modeling & Characterisation for Electronic Packaging” IEEE Electronics Packaging Technology Conference, 2002。
[8] E. H. Wong, S. W. Koh, K. H. Lee, R. Raioo, “Comprehensive Treatment of Moisture Induced Failure-Recent Advances” IEEE Transactions on electrons packing manufacturing, vol,25 No.3,July 20022。IEEE Transactions on electrons packing manufacturing, vol,25 No.3,July 2002
[9] Xuejun Fan, Jie-Hua Zhao, “Moisture diffusion and integrated stress analysis in encapsulated microelectronics devices” 2011 12th International Conference
[10] 許育驣,”指紋辨識器濕熱結構耦合分析暨可靠度設計”,義守大學機械與自動化工程學系碩士畢業論文, 2006
[11] 許峰瑞,“微機電製程壓力感測器之熱-濕-壓-固耦合與可靠度分析”,義守大學機械與自動化工程學系碩士畢業論文, 2010
[12] Hsu Hsiang-Chen, Chu Li-Ming, Fu Shen-Li,“Hygro-Thermo-Vapor Pressure Coupled Model on Premold QFN COMS Image Sensor” Advanced Science Letters, vol. 4, no. 6-7, pp. 1981-1987, 2011.06
[13] Ming-Han Tsai, Feng-Jui Hsu, Meng-Chieh Weng, Hsiang-Chen Hsu, “Advanced Moisture Diffusion Model and Hygrop-thermo-Mechanical Design for Filp Chip BGA package”, Proceeding of International Conference on Electronics Packaging Technology and High Density Package (ICEPT-HDP), pp.1113-1118, Peijing, China, 2009.08
[14] G.Wolff “Polymer Matrix Composites: Moisture Effects and Dimensional Stability” International Encyclopedia of Composites, Vol. 4, pp 279~323, VCH Publishers, New York, 1991
[15] Irving H. Shames, Francis A. Cozzarelli ”Elastic and Inelastic Stress Analysis” Revised Printing, Taylor&France. U.S.A 1997
[16] J.N. Reddy, An Introduction to The Finite Element Method, McGraw-Hill, New York, 1993
[17] Peter Kohnme Ph.D, “Shape Funtions” Ansys, Inc Theory Release 5.7, CH.12, pp. 403-404, March 2001
[18] 余家杰, “電子元件散熱片研究規劃”, 元智大學老人福祉中心, 2002
[19] Lionel Brits, ‘”Euler angles”, 2008
[20] IPC JEDEC J-STD-020D-01, “Moisture/Reflow Sensitivity Classification for Nonhermetic Solid State Surface Mount Devices”, JEDEC, March 2008.
[21] 林逸倫, "基因遺傳演算法進行RCP疊合封裝體疲勞壽命之區間式最佳化分析",國立成功大學工程科學系碩士畢業論文,2013