光學同調斷層掃描（Optical Coherence Tomography）是一個新穎的光學造影技術。其以麥克森干涉儀作為系統的主要架構，並且使用低同調光源對未知樣品進行非侵入成像的內部結構探測。其不僅在生物醫學上有相當程度的發展，而在工業領域上的材料檢測亦是。並且，由於其所需設備價格較低，因此其具有開發的潛力。
在傳統時間領域光學斷層掃描技術（TD-OCT）的分析中，其可利用一個可移動的平台來改變參考端的光學長度，來獲得參考端與未知樣品端間的干涉情形，並進而分析而得到未知樣品內部的結構資訊。而隨著OCT的發展，其所探討的物質愈來愈複雜，所需要求得的物質參數愈來愈多。因此極化性光學同調斷層掃描技術（Polarization Sensitive OCT，PS-OCT）被發展出來，其利用反射回來的光源極化改變情形來分析未知樣品的各個光學參數。但其可能只獲得某些參數而或是需要多次性的掃描與分析來獲得所求參數。
而在論文中，我們將提出兩項改善的OCT技術。利用極化光源與光學光路上的設計，使我們能經由一次性的掃描而獲得物質的各項參數，像是物質的厚度、折射率、雙折射特性、相位延遲跟主軸放置角度。以及利用FDOCT與TDOCT同步性快速測量未知參數的單折射物質的折射率以及厚度之間的比較與差異性等。

Optical coherence tomography (OCT) is a novel technique of optical imaging. It utilizes the Michelson interferometer for the main structure of the system, and the low coherence light source to detect the unknown sample of internal structure with non-invasive imaging. OCT has a considerable degree of development not only on biomedical but also in the field of material testing industry. Because of the low price of the equipment, it has potential for development.
In the convention time domain OCT, it utilizes the movable stage to scan the unknown sample which we want to know the internal structure and changes the optical path length of reference arm to obtain the interfered signals from the interference of the sample arm and the movable reference arm. As the OCT develops, the sample we detected is more and more complex, and the more parameters of the sample we need. Therefore, polarization sensitive optical coherence tomography (PS-OCT) was developed, it used the change of polarization of incident light to analyze the optical parameters of the unknown sample, but it only could acquire some parameters in one scan or took more times to scan the sample to obtain more parameters.
In this study, we propose an improved OCT method by designing the system structure and using the polarized light to get more parameters of the unknown sample by one scan, such as thickness, refractive index, birefringence, phase delay and the axial orientation. And we design another system to simultaneous measure the refractive index and the thickness of unknown sample by FDOCT and TDOCT. Finally we compare the superiority between FDOCT and TDOCT analysis.

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