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研究生: 彭政展
Peng, Cheng-Chan
論文名稱: 超高真空離子束沉積碳/矽奈米複合薄膜之機械性質與微結構檢測之研究
A Study on the Inspection of Mechanical Properties and Microstructure of C/Si nanocomposite films by UHV Ion Beam Sputterig
指導教授: 鍾震桂
Chung, Chen-Kuei
學位類別: 碩士
Master
系所名稱: 工學院 - 機械工程學系
Department of Mechanical Engineering
論文出版年: 2006
畢業學年度: 94
語文別: 中文
論文頁數: 104
中文關鍵詞: 殘留應力奈米壓痕器矽化矽奈米顆粒
外文關鍵詞: residual stress, nanoindentation, SiC nano-particles
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  • 論 文 摘 要
    本論文主要採超高真空離子束濺鍍(Ion Beam Sputtering, IBS)法與奈米壓痕技術(Nano-indentation)進行矽、碳、矽/碳/矽奈米複合薄膜的成長與機械性質檢測研究,探討製程參數、退火溫度及材料微結構變化,對於機械性質之影響,建立最佳化複合薄膜製程參數組合與複合膜之層數、厚度與機械性質的關係。
    在雙層結構中,碳膜臨界厚度達100 nm時,碳/矽複合強度會大於原本類鑽碳,矽的成份也同時抑制沉積類鑽碳薄膜因晶格扭曲造成的變形。矽在應變率小的情況下,介面處反向拉扯碳原子的活動,限制類鑽碳膜變形的擴張,所以矽膜的總厚度越厚,抑制類鑽碳薄膜變形的效果就越佳。
    當退火溫度達750℃時,非晶碳膜與多晶矽完全反應,SiC微粒高密度析出,矽膜夾層的厚度,依然是熱穩定性與SiC析出密度與粒徑的關鍵。當上層矽膜臨界厚度10 nm以上時,隨著退火溫度上升到900℃時,將形成3.25~7.25×1010 crystals/cm2高密度分佈SiC的奈米顆粒且SiC粒徑介於10~30 nm之間;並在複合結構Si/C/C=25/100/50 nm參數中,得到最佳的熱穩定性;隨著基質所包覆的SiC奈米粒子的粒徑越小,顆粒尺寸顆徑小於40 nm,則硬度值越高,熱穩定性越佳。

    Abstract
    In this research, the layer-by-layer carbon/silicon nanocomposite films are deposited by ultra high vacuum ion beam sputtering system (UHV-IBS) at room temperature together with post vacuum annealing. Then, it’s used nano-indentation technical to proceed the inspection of mechanical properties of silicon, carbon, silicon/carbon/silicon composite films. The relations between deposition procedures, rapid thermal temperature, micro structure of composite films of mechanical properties and residual stresses are established after process and material analysis in this thesis.
    In the two-layer structure, when the critical thickness of carbon film reaches 100 nm, carbon/silicon composite strength will be originally greater than single carbons. The silicon involves the activity of the carbon atom backward in the interface in a situation that the strain rate is small, expansion of the limiting DLC carbon films. So total thickness of silicon films thick, the DLC films of suppressing strain result the better.
    When temperature of annealing up to 750℃ in temperature, amorphous carbon and complete response with poly-crystalline silicon films. The high density of SiC particles were separated. While acting as above layer of silicon film of critical thickness 10 nm was rised to 900℃ that will be form nano-particles that 3.25~7.25×1010 crystals/cm2 high density distribution Sic and the particle size between 10 nm and 30 nm. In composite structure parament of Si/C/Si=25/100/25 nm can get the best thermal stability. As SiC wrapped up and covered of base carbon of nano-particles is the smaller than 40 nm for the size of particle, then the higher hardness is, the better thermal stability is.

    目錄 論 文 摘 要 I Abstract II 誌謝 III 目錄 IV 表目錄 VI 圖目錄 VII 第一章 緒論 1 1-1 前言 1 1-2 研究目的與動機 4 第二章 文獻回顧及基本理論 6 2-1 奈米複合薄膜發展技術 6 2-1-1 薄膜沉積之組成 6 2-1-2 奈米複合結構的強化機制 7 2-2 碳/矽-碳化矽複合薄膜之研究進展 9 2-3 奈米壓痕技術應用於機械性質檢測 10 2-4 薄膜殘留應力與機械性質之間的關係 12 第三章 實驗製程與方法 14 3-1 實驗目的 14 3-2 薄膜鍍製 15 3-2-1材料製備 15 3-2-2 鍍膜參數條件 17 3-3 實驗設備 21 3-3-1高真空離子濺鍍系統 (UHV-IBS) 21 3-3-2 理論基礎 22 3-3-3電子迴旋共振(ECR) 23 3-3-4 微波(Microwave)原理 25 3-4 薄膜分析儀器基本原理 27 3-4-1 殘留應力及理論研究 27 3-4-2 薄膜奈米壓痕檢測-連續剛性量測(CSM) 31 3-4-3 原子力顯微鏡 (AFM) 37 3-4-4 掃描式電子顯微鏡 (SEM) 40 3-4-5 抵掠角X-ray光譜儀 (GIXRD) 43 3-4-6 拉曼光譜分析 (Raman Spectroscopy) 46 第四章 結果與討論 49 4-1 碳膜與矽膜奈米結構 49 4-1-1沉積速率與直流加速電壓影響 49 4-1-2 表面形貌特性 51 4-1-2-1 AFM分析 51 4-1-2-2 SEM分析 53 4-1-3 機械性質檢測與殘留應力分析 55 4-1-3-1 單、雙層奈米複合薄膜 55 4-1-3-2奈米複合薄膜三明治結構-PartΙ 57 4-1-3-2奈米複合薄膜三明治結構-PartΠ 60 4-1-4 化學鍵結與微結構分析 62 4-2 碳/矽奈米複合薄膜結構 63 4-2-1 薄膜熱製程反應機制 63 4-2-2 表面形貌特性 65 4-2-2-1 AFM分析 65 4-2-2-2 SEM分析 68 4-2-3 熱穩定性分析 71 4-2-4 化學鍵結與微結構分析 76 4-3 複合薄膜之結果討論 80 4-3-1 碳化矽結晶析出的密度 80 4-3-2 奈米薄膜析出反應的機制 86 4-3-3 碳/矽薄膜厚度/層數/反應溫度關係 88 第五章 結論與未來展望 90 5-1 結論 90 5-1-1 矽、碳結構與矽/碳/矽複合薄膜機械性質與殘留應力關係 90 5-1-2 複合薄膜熱穩定性與SiC奈米顆粒析出反應 91 5-2 未來展望 95 參考文獻 97

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