| 研究生: |
張宏澤 Zhang, Hong-Ze |
|---|---|
| 論文名稱: |
Sb添加對Sn-1.5Ag-0.7Cu低銀無鉛銲料顯微組織與機械性質影響之研究 Effect of Sb Addition on Microstructure and Mechanical Properties of Low-Ag-content Lead-free Sn-1.5Ag-0.7Cu Solder Joints |
| 指導教授: |
李驊登
Lee, Hwa-Teng |
| 學位類別: |
碩士 Master |
| 系所名稱: |
工學院 - 機械工程學系 Department of Mechanical Engineering |
| 論文出版年: | 2017 |
| 畢業學年度: | 105 |
| 語文別: | 中文 |
| 論文頁數: | 109 |
| 中文關鍵詞: | 低銀無鉛銲料 、Sb添加 、微結構 、界面IMC層 、低週疲勞 |
| 外文關鍵詞: | Low silver lead-free solder, Sb addition, Microstructure, Intermetallic compound, Low cycle fatigue |
| 相關次數: | 點閱:172 下載:3 |
| 分享至: |
| 查詢本校圖書館目錄 查詢臺灣博碩士論文知識加值系統 勘誤回報 |
本研究旨在探討添加Sb元素(0.5、1.0、1.5、2.0wt.%)對Sn-1.5Ag-0.7Cu(SAC157)低銀無鉛銲料熔點、微結構及機械性質的影響。利用高溫熱儲存試驗(150℃,225hrs)對銲料的抗熱性進行評估,並與商業化無鉛銲料Sn-3.0Ag-0.5Cu(SAC305)作比較。
實驗結果顯示,Sn-1.5Ag-0.7Cu-xSb銲料熔點隨著Sb添加量的增多而升高,固液區間亦逐漸上升。添加Sb後,SAC-0.5Sb的微觀結構與SAC157相似仍含有網狀共晶組織且部分Sb會固溶於析出物中形成Ag3(Sn,Sb)和Cu6(Sn,Sb)5。隨著Sb含量增加,網狀共晶組織逐漸瓦解,析出物Ag3(Sn,Sb)的形貌從細長帶狀變為長條板片狀。高溫熱儲存後,Sb的固溶量增加,銲料析出物有所粗大。此外,添加Sb可通過細化晶粒和阻礙Sn原子擴散而減小SAC銲料IMC層的生長。SAC-1.0Sb擁有最小IMC層厚度,而隨著Sb添加量增多IMC層的厚度有所回升。高溫熱儲存後,銲料IMC層厚度有所增加,但添加Sb之銲料增長幅度較小,表明Sb可抑制高溫下SAC銲料IMC層生長。
機械性質方面,銲料的硬度與剪切強度均隨著Sb添加量的增多而升高。高溫熱儲存後,所有銲料的硬度均有所下降,但添加Sb之銲料下降幅度較小,顯示具有較好的抗熱性。在低週疲勞試驗中,SAC-0.5Sb、SAC-1.0Sb的疲勞壽命較SAC305、SAC157有所提升,原因主要為Sb具有固溶強化的作用。此外,當Sb添加量小於1.0wt.%時,銲料IMC層較薄,裂紋主要從銲料內部生長。隨著Sb添加量增多,IMC厚度增加,促使裂紋向IMC層生長形成混合破壞模式或IMC層破壞模式,導致銲料疲勞壽命降低。而高溫熱儲存後,銲料強度降低,IMC層厚度增長,界面粗糙度升高,導致銲料易於IMC層處產生脆性斷裂,降低整體疲勞壽命。
綜合銲料固液區間、微結構、界面層量測與疲勞壽命,研究結果顯示Sb添加量為0.5-1.0wt.%時可提升低銀SAC銲料之性能。
The purpose of this study is to investigate the effect of Sb addition (0.5, 1.0, 1.5, 2.0wt.%) on melting point, microstructure and mechanical properties of Sn-1.5Ag-0.7Cu (SAC157) low silver lead-free solder. Thermal resistance of the solder is evaluated using a thermal storage test (150℃, 225hrs) and compared with commercial lead-free solder Sn-3.0Ag-0.5Cu (SAC305).
The experimental results show that the melting point of Sn-1.5Ag-0.7Cu-xSb solders increases with the addition of Sb, and the solid-liquid interval increases gradually. After adding Sb, the microstructure of SAC-0.5Sb is similar to that of SAC157, which still contains network eutectic structure, and some Sb will dissolve in precipitates, forming Ag3(Sn,Sb) and Cu6(Sn,Sb)5. With the increase of Sb content, the eutectic structure of the alloy gradually disintegrates, and the morphology of Ag3(Sn,Sb) changes from strip-like to flake-like. After thermal storage, the solid solution of Sb is increased and the precipitates become coarse. Moreover, the addition of Sb can reduce the growth of SAC solder IMC layers by refining the grains and hindering the diffusion of Sn atoms. SAC-1.0Sb has the minimum IMC layer thickness, and as the amount of Sb increases, the thickness of the IMC layer picks up. After thermal storage, the thickness of solder IMC layer increases, but the growth rate of solder with Sb addition is small, indicating that Sb can inhibit the growth of SAC solder IMC layer at high temperature.
In terms of mechanical properties, the hardness and shear strength of solder increase with the addition of Sb. After thermal storage, the hardness of all solders decreases, but solders with Sb addition decrease slightly which show better thermal resistance. In the low cycle fatigue test, the fatigue life of SAC-0.5Sb and SAC-1.0Sb is higher than that of SAC305 and SAC157. The main reason is that Sb has the effect of solid solution strengthening. In addition, when the amount of Sb addition is less than 1.0wt.%, the solder IMC layer is thinner, and the crack mainly grows from the internal solder. As the amount of Sb increases, the thickness of IMC layer increases, which results in the growth of crack in the IMC layer, causing the mixed fracture mode or the IMC fracture mode, depressing the fatigue life of solder. However, after thermal storage, the strength of solder decreases and the thickness of IMC layer, the roughness of the interface increases, which lead the initial crack to the brittle IMC layer, and reduces the overall fatigue life.
Taking all the results into consideration, the addition of Sb at 0.5-1.0wt.% can better improve the properties of low silver SAC lead-free solder.
[1] 姚智卿, "铅对人体健康的危害," 微量元素与健康研究, vol. 28, pp. 67-68, 2011.
[2] I. Roadmap, "A guide for assembly of lead-free electronics," IPC, Northbrook, IL, 2000.
[3] R. Tummala, Fundamentals of microsystems packaging: McGraw Hill Professional, 2001.
[4] Kitco. Available: http://www.kitcosilver.com/
[5] L. Sun and L. Zhang, "Properties and microstructures of Sn-Ag-Cu-X lead-free solder joints in electronic packaging," Advances in Materials Science and Engineering, vol. 2015, 2015.
[6] G. Zeng, S. Xue, L. Zhang, L. Gao, W. Dai, and J. Luo, "A review on the interfacial intermetallic compounds between Sn–Ag–Cu based solders and substrates," Journal of Materials Science: Materials in Electronics, vol. 21, pp. 421-440, 2010.
[7] Y. Gu, X. Zhao, Y. Li, Y. Liu, Y. Wang, and Z. Li, "Effect of nano-Fe2O3 additions on wettability and interfacial intermetallic growth of low-Ag content Sn–Ag–Cu solders on Cu substrates," Journal of Alloys and Compounds, vol. 627, pp. 39-47, 2015.
[8] S. Terashima, Y. Kariya, T. Hosoi, and M. Tanaka, "Effect of silver content on thermal fatigue life of Sn-xAg-0.5Cu flip-chip interconnects," Journal of Electronic Materials, vol. 32, pp. 1527-1533, 2003.
[9] F. Cheng, F. Gao, J. Zhang, W. Jin, and X. Xiao, "Tensile properties and wettability of SAC0307 and SAC105 low Ag lead-free solder alloys," Journal of materials science, vol. 46, pp. 3424-3429, 2011.
[10] Y. Kariya, T. Hosoi, T. Kimura, S. Terashima, M. Tanaka, and T. Suga, "Fatigue life enhancement of low silver content Sn-Ag-Cu flip-chip interconnects by Ni addition," in Thermal and Thermomechanical Phenomena in Electronic Systems, 2004. ITHERM'04. The Ninth Intersociety Conference on, 2004, pp. 103-108.
[11] L.-W. Lin, J.-M. Song, Y.-S. Lai, Y.-T. Chiu, N.-C. Lee, and J.-Y. Uan, "Alloying modification of Sn–Ag–Cu solders by manganese and titanium," Microelectronics Reliability, vol. 49, pp. 235-241, 2009.
[12] 李昭慶, "Sn-xAg-0.7 Cu 無鉛銲料微結構與低週疲勞研究," 成功大學機械工程學系學位論文, pp. 1-102, 2013.
[13] 汪晨暉, "Sn-xAg-0.7 Cu 無鉛銲料銲點形貌與低週疲勞之研究," 成功大學機械工程學系學位論文, pp. 1-91, 2014.
[14] 林育仙, "Sn-xAg-Cu 無鉛銲料低週疲勞與破壞之研究," 成功大學機械工程學系學位論文, pp. 1-87, 2015.
[15] 陳郁文, "Sn-xAg-0.7 Cu 無鉛銲料銲點時效影響與低週疲勞破壞之研究," 成功大學機械工程學系學位論文, pp. 1-114, 2016.
[16] 陳銀發, "添加 Cu 對 Sn-Ag-Sb 無鉛銲料銲點微結構與剪切強度之影響," 成功大學機械工程學系學位論文, pp. 1-97, 2005.
[17] S. K. Kang, D.-Y. Shih, N. Donald, W. Henderson, T. Gosselin, A. Sarkhel, et al., "Ag3Sn plate formation in the solidification of near-ternary eutectic Sn-Ag-Cu," JOM Journal of the Minerals, Metals and Materials Society, vol. 55, pp. 61-65, 2003.
[18] 饒慧美, "添加 Sb, Cu 對無鉛銲料 Sn-Ag 銲點之機械性質及微結構研究," 國立成功大學機械研究所, 碩士論文, vol. 6, 2000.
[19] 楊傳鏈, "添加 Sb 對 Sn-Ag 無鉛銲料銲點微結構與剪切強度之影響," 成功大學機械工程學系學位論文, pp. 1-80, 2002.
[20] G. Li, B. Chen, and J. Tey, "Reaction of Sn-3.5 Ag-0.7Cu-xSb solder with Cu metallization during reflow soldering," IEEE transactions on electronics packaging manufacturing, vol. 27, pp. 77-85, 2004.
[21] 鍾文仁, IC 封裝製程與 CAE 應用: 全華圖書, 2010.
[22] Universidad Autonoma. Available: http://www.doe.carleton.ca
[23] 薛明阳, "BGA 封装的可靠性模拟与实验验证 [D]," 华南理工大学, 2013.
[24] T. Instruments, "Flip chip ball grid array package reference guide," Literature Number: SPRU811A, 2005.
[25] K. Subramanian, Lead-free solders: materials reliability for electronics vol. 41: John Wiley & Sons, 2012.
[26] Lead-Free Soldering Guide. Available: www.psma.com
[27] H. Baker and H. Okamoto, "ASM handbook," Alloy phase diagrams, vol. 3, p. 2, 1992.
[28] F. Lang, H. Tanaka, O. Munegata, T. Taguchi, and T. Narita, "The effect of strain rate and temperature on the tensile properties of Sn–3.5 Ag solder," Materials characterization, vol. 54, pp. 223-229, 2005.
[29] S. Chada, R. Fournelle, W. Laub, and D. Shangguan, "Copper substrate dissolution in eutectic Sn-Ag solder and its effect on microstructure," Journal of Electronic Materials, vol. 29, pp. 1214-1221, 2000.
[30] K. Zeng and K.-N. Tu, "Six cases of reliability study of Pb-free solder joints in electronic packaging technology," Materials science and engineering: R: reports, vol. 38, pp. 55-105, 2002.
[31] M. McCormack, G. Kammlott, H. Chen, and S. Jin, "New lead‐free, Sn‐Ag‐Zn‐Cu solder alloy with improved mechanical properties," Applied Physics Letters, vol. 65, pp. 1233-1235, 1994.
[32] M. Yeh, "Effects of indium on the mechanical properties of ternary Sn-In-Ag solders," Metallurgical and Materials Transactions A, vol. 34, pp. 361-365, 2003.
[33] F. Guo, J. Lee, S. Choi, J. Lucas, T. Bieler, and K. Subramanian, "Processing and aging characteristics of eutectic Sn-3.5Ag solder reinforced with mechanically incorporated Ni particles," Journal of Electronic Materials, vol. 30, pp. 1073-1082, 2001.
[34] W. Zhai, W. Wang, D. Geng, and B. Wei, "A DSC analysis of thermodynamic properties and solidification characteristics for binary Cu–Sn alloys," Acta Materialia, vol. 60, pp. 6518-6527, 2012.
[35] J.-K. Lin, A. De Silva, D. Frear, Y. Guo, S. Hayes, J.-W. Jang, et al., "Characterization of lead-free solders and under bump metallurgies for flip-chip package," IEEE Transactions on Electronics Packaging Manufacturing, vol. 25, pp. 300-307, 2002.
[36] A. Torres, L. Hernández, and O. Domínguez, "Effect of Antimony Additions on Corrosion and Mechanical Properties of Sn-Bi Eutectic Lead-Free Solder Alloy," 2012.
[37] V. Vassiliev, M. Lelaurain, and J. Hertz, "A new proposal for the binary (Sn, Sb) phase diagram and its thermodynamic properties based on a new emf study," Journal of alloys and compounds, vol. 247, pp. 223-233, 1997.
[38] P. Vianco, K. Erickson, and P. Hopkins, "Solid state intermetallic compound growth between copper and high temperature, tin-rich solders—part I: experimental analysis," Journal of Electronic Materials, vol. 23, pp. 721-727, 1994.
[39] M. Abtew and G. Selvaduray, "Lead-free solders in microelectronics," Materials Science and Engineering: R: Reports, vol. 27, pp. 95-141, 2000.
[40] J.-M. Song and K.-L. Lin, "Double peritectic behavior of Ag–Zn intermetallics in Sn–Zn–Ag solder alloys," Journal of materials research, vol. 19, pp. 2719-2724, 2004.
[41] I. Ohnuma, Y. Cui, X. Liu, Y. Inohana, S. Ishihara, H. Ohtani, et al., "Phase equilibria of Sn-In based micro-soldering alloys," Journal of electronic materials, vol. 29, pp. 1113-1121, 2000.
[42] D. Swenson, "The effects of suppressed beta tin nucleation on the microstructural evolution of lead-free solder joints," Journal of Materials Science: Materials in Electronics, vol. 18, pp. 39-54, 2007.
[43] J. J. Sundelin, S. T. Nurmi, T. K. Lepistö, and E. O. Ristolainen, "Mechanical and microstructural properties of SnAgCu solder joints," Materials Science and Engineering: A, vol. 420, pp. 55-62, 2006.
[44] Metals Handbook, Structures and Phase Diagrams: American Society for Metals, 1976.
[45] D. B. Masson and B. K. Kirkpatrick, "Equilibrium solidification of Sn-Ag-Sb thermal fatigue-resistant solder alloys," Journal of Electronic Materials, vol. 15, pp. 349-353, 1986.
[46] Y. Kariya, T. Morihata, E. Hazawa, and M. Otsuka, "Assessment of low-cycle fatigue life of Sn-3.5 mass% Ag-X (X= Bi or Cu) alloy by strain range partitioning approach," Journal of Electronic Materials, vol. 30, p. 1184, 2001.
[47] Y. Jee, J. Yu, and Y. Ko, "Effects of Zn addition on the drop reliability of Sn–3.5 Ag–xZn/Ni (P) solder joints," Journal of Materials Research, vol. 22, pp. 2776-2784, 2007.
[48] J. Wu, S.-b. Xue, J.-w. Wang, S. Liu, Y.-l. Han, and L.-j. Wang, "Recent progress of Sn–Ag–Cu lead-free solders bearing alloy elements and nanoparticles in electronic packaging," Journal of Materials Science: Materials in Electronics, vol. 27, pp. 12729-12763, 2016.
[49] A. El-Daly, A. Hammad, A. Fawzy, and D. Nasrallh, "Microstructure, mechanical properties, and deformation behavior of Sn–1.0 Ag–0.5 Cu solder after Ni and Sb additions," Materials & Design, vol. 43, pp. 40-49, 2013.
[50] D. A.-A. Shnawah, S. B. M. Said, M. F. M. Sabri, I. A. Badruddin, and F. X. Che, "Microstructure, mechanical, and thermal properties of the Sn–1Ag–0.5 Cu solder alloy bearing Fe for electronics applications," Materials Science and Engineering: A, vol. 551, pp. 160-168, 2012.
[51] A. El-Daly, H. El-Hosainy, T. Elmosalami, and W. Desoky, "Microstructural modifications and properties of low-Ag-content Sn–Ag–Cu solder joints induced by Zn alloying," Journal of Alloys and Compounds, vol. 653, pp. 402-410, 2015.
[52] 謝喻丞, "Ni 添加對 Sn-1.5 Ag-0.7 Cu 低銀無鉛銲料顯微組織與機械性質影響之研究," 成功大學機械工程學系學位論文, pp. 1-85, 2016.
[53] J. Son, Y. Lee, S. Hong, I. Im, J. Lee, H. Kim, et al., "Study on the characteristics of various dopants in Sn-1Ag-0.8 Cu solder," in Electronics Packaging Technology Conference (EPTC), 2011 IEEE 13th, 2011, pp. 231-235.
[54] L. Zhang, X.-y. Fan, Y.-h. Guo, and C.-w. He, "Microstructures and fatigue life of SnAgCu solder joints bearing Nano-Al particles in QFP devices," Electronic Materials Letters, vol. 10, pp. 645-647, 2014.
[55] B. Chen and G. Li, "Influence of Sb on IMC growth in Sn–Ag–Cu–Sb Pb-free solder joints in reflow process," Thin Solid Films, vol. 462, pp. 395-401, 2004.
[56] J. H. Pang, K. H. Tan, X. Shi, and Z. Wang, "Thermal cycling aging effects on microstructural and mechanical properties of a single PBGA solder joint specimen," IEEE Transactions on Components and Packaging Technologies, vol. 24, pp. 10-15, 2001.
[57] C. Kanchanomai and Y. Mutoh, "Effect of temperature on isothermal low cycle fatigue properties of Sn–Ag eutectic solder," Materials Science and Engineering: A, vol. 381, pp. 113-120, 2004.
[58] C. Kanchanomai, Y. Miyashita, Y. Mutoh, and S. Mannan, "Influence of frequency on low cycle fatigue behavior of Pb-free solder 96.5 Sn–3.5 Ag," Materials Science and Engineering: A, vol. 345, pp. 90-98, 2003.
[59] Z. JIS, "3198-5, Test Methods for Lead-Free Solders," Japanese Industrial Standards Committee, 2003.
[60] R. E. Reed-Hill and R. Abbaschian, Physical metallurgy principles: Brooks/Cole Engineering Division Monterey, Calif, USA, 1973.
[61] H.-T. Lee, M.-H. Chen, H.-M. Jao, and C.-J. Hsu, "Effect of adding Sb on microstructure and adhesive strength of Sn-Ag solder joints," Journal of electronic materials, vol. 33, pp. 1048-1054, 2004.
[62] J.-H. Lee, J.-H. Park, Y.-H. Lee, Y.-S. Kim, and D. H. Shin, "Stability of channels at a scalloplike Cu6Sn5 layer in solder interconnections," Journal of Materials Research, vol. 16, pp. 1227-1230, 2001.
[63] G.-T. Lim, B.-J. Kim, K. Lee, J. Kim, Y.-C. Joo, and Y.-B. Park, "Temperature effect on intermetallic compound growth kinetics of Cu pillar/Sn bumps," Journal of electronic materials, vol. 38, pp. 2228-2233, 2009.
[64] J. Chen, J. Beraun, and D. Tzou, "A dual-phase-lag diffusion model for interfacial layer growth in metal matrix composites," Journal of materials science, vol. 34, pp. 6183-6187, 1999.
[65] J. H. Yao, K. Elder, H. Guo, and M. Grant, "Ostwald ripening in two and three dimensions," Physical Review B, vol. 45, p. 8173, 1992.
[66] B. Murty, S. Kori, and M. Chakraborty, "Grain refinement of aluminium and its alloys by heterogeneous nucleation and alloying," International Materials Reviews, vol. 47, pp. 3-29, 2002.
[67] K. Lee, J. Yu, T. Park, and S. Lee, "Effects of pad metallization on the low cycle fatigue characteristics of Sn-based solder joints," International Journal of Fatigue, vol. 48, pp. 1-8, 2013.
[68] C. Kanchanomai, Y. Miyashita, and Y. Mutoh, "Low-cycle fatigue behavior and mechanisms of a lead-free solder 96.5 Sn/3.5 Ag," Journal of Electronic Materials, vol. 31, pp. 142-151, 2002.
[69] J. H. Pang, B. Xiong, and T. Low, "Low cycle fatigue study of lead free 99.3 Sn–0.7 Cu solder alloy," International Journal of Fatigue, vol. 26, pp. 865-872, 2004.
[70] Z. Mei, M. Ahmad, M. Hu, and G. Ramakrishna, "Kirkendall voids at Cu/solder interface and their effects on solder joint reliability," in Electronic Components and Technology Conference, 2005. Proceedings. 55th, 2005, pp. 415-420.
[71] X. Liu and W. Plumbridge, "Thermomechanical fatigue of Sn–37 wt.% Pb model solder joints," Materials Science and Engineering: A, vol. 362, pp. 309-321, 2003.
[72] H. Guo, J. Guo, and J. Shang, "Influence of thermal cycling on the thermal resistance of solder interfaces," Journal of electronic materials, vol. 38, pp. 2470-2478, 2009.
[73] T. Mattila and J. Kivilahti, "Reliability of lead-free interconnections under consecutive thermal and mechanical loadings," Journal of Electronic Materials, vol. 35, pp. 250-256, 2006.
[74] F. Che and J. H. Pang, "Vibration reliability test and finite element analysis for flip chip solder joints," Microelectronics reliability, vol. 49, pp. 754-760, 2009.
[75] Y.-L. Shen and K. Aluru, "Numerical study of ductile failure morphology in solder joints under fast loading conditions," Microelectronics Reliability, vol. 50, pp. 2059-2070, 2010.
校內:2022-08-01公開