本論文在LabVIEW(Laboratory Virtual Instrumentation Engineering Workbench，實驗室虛擬儀器工程平台)平台上開發RRAM(Resistive Random-Access Memory，電阻式記憶體)、FET(Field-Effect Transistor，場效電晶體)、TFT(Thin-Film Transistor，薄膜電晶體)等電性量測人機介面，在程式中有各種模式及參數調整，依照使用者的設定完成各式元件的電性量測，並在RRAM透光率實驗中與光功率計同步，實現量測要求；光學量測方面，結合光功率計及光纖載台控制器實現自動化的光纖對光纖、光纖對波導對準系統，並量測頻譜數據，自動化對準程式提高了量測準確度及量測速度，並可以控制光纖掃描模式得到光場強度分布。

Laboratory Virtual Instrument Engineering Workbench or LabVIEW in short, is a graphical programming environment used to develop sophisticated measurement and control systems. All of the programs developed for this thesis are based on the concept of a so-called state machine, which consists of a set of states with a transition function that maps to the next state. For electrical measurements, a comprehensive RRAM/MOSFET/TFT data acquisitions program is designed by interfacing computer with a variety of instruments via GPIB ports using LabVIEW. In RRAM absorption program, Keithley 2612B SourceMeter and Newport 2936R Optical Meter are employed to acquire the electrical and optical signal simultaneously. Measurement programs so designed would provide users with a multifunctional panel to characterize their devices, during which the data are analyzed in order to extract relevant figures of merit. Furthermore, the automated alignment program is devised with an intention to mitigate the difficulties normally encountered during the manual fiber-to-fiber or waveguide-to-fiber alignment. The resulting action has drastically reduced the operating time and enhancing the alignment accuracy.

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