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研究生: 呂佳玲
Lu, Chia-Ling
論文名稱: 運用『改良式標識再捕法』於需求文件瑕疵檢測流程中的瑕疵數估算之研究
A Defect Estimation Approach for Sequential Inspection Using a Modified Capture-Recapture Model in Requirement Documents
指導教授: 朱治平
Chu, Chih-Ping
學位類別: 碩士
Master
系所名稱: 電機資訊學院 - 資訊工程學系
Department of Computer Science and Information Engineering
論文出版年: 2005
畢業學年度: 93
語文別: 英文
論文頁數: 46
中文關鍵詞: 再補法瑕疵數估計瑕疵數曲線變量預測法
外文關鍵詞: defect estimation, capture-recapture model, detection profile method
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  •   在軟體系統發展過程中,當瑕疵或錯誤愈早被發現,更正此錯誤所付出的成本就愈少。反之,如果在整個軟體系統已經接近完成,常需要付出巨大的成本,來修復錯誤或瑕疵。也因此,儘可能在設計階段找出錯誤,是相當軟體發展中相當重要的一環。而本研究提供一個預測需求文件的瑕疵數的方法。藉著估計出瑕疵數,可以保證需求文件的品質。品質不良文件,需要重新被設計;瑕疵數較少的文件,則可以進入實作系統的階段。瑕疵數的估計,更可以提供管理階層,決策文件品質時的依據。

      估計文件瑕疵數的數學模型主要可分成兩大類:1)標幟再捕法(capture-recapture model);2)瑕疵找出曲線模型(detection profile method)。本研究提出一改良式標幟再捕法,運用標幟再捕法的基本假設。藉著兩次的標幟再捕法,增加估計所需的資訊。用最大概似估計量(Maximum Likelihood Estimator,MLE)的數學方法,求得當瑕疵數為多少時,使前後兩次同時發生機率為最大值。

      參與實驗的人員是,成功大學資訊工程系物件導向軟體工程的修課學生,實驗所用的文件是NASA的自動提款機(automated teller machine ,ATM)文件。在實驗結果中,我們與未改良前的標幟再捕法,及其他的數學模型相比較,觀察在相對誤差(Relative Error ,RE)和整體的變異性(Variability)上的優劣。都可以清楚看出,改良式標幟再捕法有著不錯的表現。

     Defect prediction is an important process in the evaluation of software quality. Software defect estimation plays an important role for evaluating the quality of work products. Many defect estimation models have been proposed to increase the accuracy of the estimation, but it is not a easy job for project manager to decide if the work product reach the required quality, and can be passed to the next stage. To accurately predict the rate of software defects can not only facilitate software review decisions, but can also improve software quality. In this paper, we have provided a defect estimation approach, which uses defective data from sequential inspections to increase the accuracy of estimating defects. To demonstrate potential improvements, the results of our approach were compared to those of two other popular estimation approaches, the Capture-Recapture model and the Re-inspection model. By using the proposed approach, software organizations may increase the accuracy of their defect predictions and reduce the effort of subsequent inspections. By applying this estimation model, an estimation framework based in the model will be presented at the end of this paper. The framework can be used to develop a defect estimation system to estimate the number of defects in any kind of work products. The information provided by this system not only facilitates the defect estimation process for the project manager, but also increase the accuracy of the results.

    Contents Chapter 1 Introduction 1 1.1 Motivation 1 1.2 Overview 2 1.2.1 Sequential Model 2 1.2.2 Defect Estimate System 3 1.3 Thesis Organization 4 Chapter 2 Background 6 2.1 Capture-recapture Methods 6 2.1.1 Model M0 11 2.1.2 Model Mh 12 2.1.3 Model Mt 14 2.1.4 Model Mth (Chao Heterogeneity-Time Estimator) 15 2.2 Detection Profile Method 16 2.3 Re-inspection Model 17 Chapter 3 Sequential re-inspection model 20 3.1 Modified capture-recapture model with M0 (MLE) 20 3.2 Evaluation Criteria 23 Chapter 4 Description of Experiment 24 4.1 Inspectors 24 4.2 Software Artifacts 25 4.3 Reading Technique 26 4.3.1 The Goal of Reading Technique 26 4.3.2 The Category of Reading Technique 27 4.4 Experimental Procedures 28 Chapter 5 Simulation Result and Performance Evaluation32 5.1 Semantics of boxplot 32 5.2 Evaluation of bias and variability 33 Chapter 6 Framework of Defect Estimation 38 Chapter 7 Discussion and Future Work 41 7.1 Discussion 41 7.2 Future Work 42 References 43

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