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研究生: 許永儒
Hsu, Yung-ju
論文名稱: 氮化鎵異質接面光電晶體之特性量測
Characteristics of GaN-based Hetero-junction Photo Transistor
指導教授: 許進恭
Sheu, Jinn-Kong
學位類別: 碩士
Master
系所名稱: 理學院 - 光電科學與工程研究所
Institute of Electro-Optical Science and Engineering
論文出版年: 2007
畢業學年度: 95
語文別: 中文
論文頁數: 96
中文關鍵詞: 氮化鎵偵測器異質接面
外文關鍵詞: GaN, detector, heterojunction
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  • 本論文針對氮化鎵/氮化鋁鎵系列的異質接面光電晶體以作為紫外光偵測器的相關研究與製作,包括成長單側與雙側異質接面光電晶體。
    異質接面光電晶體結合光導體電荷中性的原理以及能帶不連續所造成的電洞累積現象,進而導致高內部增益,可以克服微小光訊號偵測的困難。因此,本論文首先於B-E 接面間成長異質結構,利用異質接面形成的能位障,堆積由B-C 接面所激發的電洞,而由外部電路補償元件注入額外之電子堆積於射極,進而改變BE V 的能位障高度而獲得電流增益。
    緊接著將單側異質接面光電晶體中的B-C 接面改制為異質結構後,其光響應值下降為單側異質接面電晶體的一半。而在雙側異質接面元件中,由於射極與集極為寬能隙材料所組成,皆可作為光子入射的窗口層,因此將單側異質接面元件的結構倒置為集極向上的結構。而此結構的改變,除了使得元件在短波段的吸收效率更好之外,另一方面卻導致元件的光響應值對非主要吸收波段的鑑別度下降。且由於磊晶成長上的不易,因此更在雙側異質接面元件的B-C 接面中穿插一層高阻值的寬能隙材料,而高阻值材料的加入,使得光電晶體的光響應半高寬不隨著偏壓的改變而變化,因此為了維持較低的光響應半高寬值,穿插高阻值材料是可值得考慮。

    This thesis aims at fabricating and characterizing of AlGaN-GaN hetero-junction photo-transistors(HPTs), which were used to detect the ultraviolet light. We have fabricated two kinds of HPTs, including single hetero-junction photo-transistors and double hetero-junction photo-transistors.
    HPTs feature the neutral principle of charges in photoconductors with bending of band discontinuity to acquire high internal gains, which can produce adequate signal levels for the read-out optoelectronic devices. In
    principle, the band discontinuity at the base-emitter
    hetero-junction leads to an accumulation of photo-excited holes originating from the base-collector homo-junction. Thus electrons resulting from external circuit must enter the sample. And then, the excess injected electrons accumulate at Emitter. The free electrons and holes accumulated at the two sides of emitter continuity
    change the band diagram of base-Emitter junction and acquire high internal gain. That is the external photocurrent is due to more than one electron flow
    per absorbed photon.
    In the double hetero-junction photo-transistors, the base-collector
    homojuncion was replaced by heterostructure and the responsibility
    decreased to a half of the single heterojunction photo-transistor. Because the
    collector and emitter were composed of wide band materials in the double
    hetero junction photo transistors, so either collector or emitter could be the
    window layer for the incidence of light. In the double hetero-junction
    photo-transistors, we chose collector to be the window layer allowing more
    lights in short wavelength to be absorbed in the depletion layers.
    Nevertheless, the rejection ratio of peak responsivity to short-wavelength
    responsivity was declined . In addition, a high- resistance layer inserted in
    the base-collector heterojunction could lead to a near constant band width of
    spectral responsibility.

    中文摘要 I 英文摘要 II 致謝 III 目錄 IV 圖目錄 VIII 表目錄 XI 第一章 簡介 1 1-1 研究背景 1 1-2 紫外光偵測器簡介及其種類 2 1-3 P-i-n 紫外光偵測器文獻回顧 4 1-4 研究動機 9 第二章 光電晶體工作原理 12 2-1 光偵測器照光吸收機制 12 2-2 光電晶體光檢測機制 14 2-3 光偵測器量子效率 (Quantum efficiency)與吸收係數 (Absorption coefficient) 17 2-4 光電晶體頻譜響應 (Responsivity)、光增益值(Optical gain)與偵測率(Detectivity) 19 2-5 光電流與暗電流之不理想因素 21 第三章 異質接面光電晶體設計與製作 26 3-1 光電晶體基本設計要求 26 3-1-1 雙極性電晶體(Bipolar junction transistor)基本觀念 26 3-1-2 異質接面電晶體(hetero junction transistor) 27 3-1-3 窗口層(window layer)與 接觸電阻(contact resistance) 28 3-2 Emitter-up 單側異質接面 NPN光電晶體 29 3-2-1 設計動機與元件磊晶結構 29 3-2-2 元件製作流程 30 3-3 Collector-up 雙側異質接面 NPN光電晶體 32 3-3-1 設計動機與元件磊晶結構 32 3-3-2 元件製作流程 33 3-4 異質接面光電晶體量測之 持久性導電率 35 3-5 製程與量測儀器簡介 36 第四章 量測討論 45 4-1 Emitter-up 單側異質接面 NPN光電晶體 45 4-1-1 TLM量測 45 4-1-2 光電流、暗電流量測 46 4-1-2.1 暗電流分析 47 4-1-2.2 光電流分析 48 4-1-3 光響應值分析 50 4-1-3.1 零偏壓之光響應值分析 50 4-1-3.2 不同外加偏壓之光響應值分析 50 4-1-4 結語 52 4-2 Collector-up 雙側異質接面 NPN光電晶體 53 4-2-1 TLM量測 53 4-2-2 光電流、暗電流量測 53 4-2-2.1 暗電流分析 53 4-2-2.2 光電流分析 54 4-2-3 光響應值分析 55 4-2-3.1 零偏壓之光響應值分析 55 4-2-3.2 不同外加偏壓之光響應值分析 56 4-2-4 結語 60 4-3 Emitter-up 單側異質接面與 Collector-up 雙側異質接面 光電晶體之分析比較 61 4-3-1 暗電流分析比較 61 4-3-2 光電流分析比較 62 4-3-3 光響應值分析比較 63 4-3-3.1 零偏壓之光響應值分析比較 63 4-3-3.2 不同偏壓之光響應值分析比較 64 4-3-4 結語 65 第五章 結論與未來展望 85 5-1 結論 85 5-2 未來展望 87 參考資料 89

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