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研究生：	葉政諺 Yeh, Cheng-Yen
論文名稱：	極化敏感光學同調斷層掃描術量測雙折射材料光學參數之設計與研究 Measurements for the Optical Parameters of the Birefringent Materials by Using Polarization-Sensitive Optical Coherence Tomography
指導教授：	羅裕龍 Lo, Yu-Lung
學位類別：	碩士 Master
系所名稱：	工學院 - 微機電系統工程研究所 Institute of Micro-Electro-Mechancial-System Engineering
論文出版年：	2006
畢業學年度：	94
語文別：	英文
論文頁數：	131
中文關鍵詞：	主軸、極化干涉、極化敏感光學同調性斷層掃描術、熱光源、雙折射、折射係數、厚度、低同調干涉術
外文關鍵詞：	thermal light, thickness, refractive index, birefringence, optical axis orientation, polarimetry, low coherence interferometry, Polarization-Sensitive Optical Coherence Tomogra
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光學同調斷層掃描術（Optical Coherence Tomography）是一種新興的光學造影技術，其可對樣品提供非侵入式之微米（micrometer）級橫截面影像。在先前的研究中，已經發表了使用光學同調斷層掃描的技術進行厚度與折射係數的量測，且對於均質材料有良好的實驗結果。但實際上許多光學的材料都具有雙折射的特性，而使用上述傳統的光學同調斷層掃描術並沒有能力感測出因材料的雙折射所造成的光之偏振狀態改變的資訊。
極化敏感光學同調斷層掃描(Polarization-Sensitivity Optical Coherence Tomography)是一種以極化干涉術為基礎的雙折射材料量測技術，此技術是以一個已知偏振態的光去探測樣品進而量測光穿透樣品後之光的偏振態變化所造成的干涉信號改變。因此，我們可以藉由從樣品的反射面反射回來的兩個正交的線性極化光之偏振態的關係來求取雙折射值。
本實驗將針對一般的光學同調斷層掃描術的架構加以改良並使用熱光源以提高解析度。此架構也結合極化干涉術，使新的架構除了能夠量測單層樣品的厚度及折射率外，同時也可以量測樣品的雙折射及主軸角度。更進一步的由上述求得的參數彼此之間的關係計算得到尋常光折射率與非尋常光折射率，使得採用低同調干涉術在量測雙折射樣品上有更完整的功能。

Optical coherence tomography is an emerging optical imaging technique that provides micrometer-scale cross-sectional images of tissue structure without invasion. In earlier research, there have been report of the measurement of refractive index (n) and thickness (t) by use of OCT, and the result is good for homogeneous material. However, many optical materials have birefringence property in practice, and this conventional OCT does not have the capability to sense the information in the change of polarization state caused by the birefringence of material.
The PSOCT is a polarimetry-base birefringence measurement technique that uses a light of known polarization state to probe the sample and measures the changes in this state after propagation through the sample. Therefore, we can extract the phase retardation by the change of interferometric signal between orthogonal linear polarization modes at the reflective surface in a birefringence sample.
In this study, we propose a new PSOCT structure by modifying the OCT that we have developed earlier. The new structure combines the polarimetry technique for measurement of the birefringence property and employs the thermal light source for the higher resolution. The new POSCT system can measure the thickness, refractive index, birefringence and optical axis orientation of an optical sample simultaneously. Besides, we can calculate the ne and no from the relationship between above parameters. Thus the system in measuring the birefringence material by use of low coherence interferometry can be more complete in extracting different parameters.

Abstract	I
中文摘要	III
致謝	V
Table of Contents	VI
List of Figures	X
List of Tables	XV
Chapter 1 Introduction	1
1 Historical review	1
1.1 Review of OCT	1
1.2 Review of OCT in Measuring the Refractive Index and Thickness	2
1.3 Review of Ultrahigh-resolution OCT	4
1.4 Review of PSOCT	5
2 The Destination and Motivations for the Research	7
3 Overview of Chapters	7
Chapter 2 Theoretical Analysis	17
1 Polarized Light and Optical Properties of Birefringence	17
1.1 Polarized Light	17
1.2 Optical Properties of Birefringence	19
2 Basic Configuration of PSOCT	23
2.1 Jonse Matrix Calculation of PSOCT	25
2.1.1 Jonse Representation of Light in Reference Arm	25
2.1.2 Jonse Representation of Light in Sample Arm	26
2.1.3 Detection of Interferometric Signal	28
2.2 Resolution of PSOCT System	31
2.2.1 Axial Resolution	31
2.2.2 Lateral Resolution	33
2.3 Sensitivity	34
3 Effects of Light in Bulk Material	35
3.1 Scattering and Absorption	35
3.2 The Effect of Dispersion on PSOCT	37
3.2.1 Dispersion in Refractive Index and Coherence Length	37
3.2.2 Dispersed Light Waves in PSOCT	39
3.3 Discussion	41
4 Determine the Thickness and the Refractive Index of a Single-layer Sample	42
4.1 The Structure of the Measurement System	42
4.2 Principle of Measurement	43
4.3 Discussion	44
Chapter 3 New PSOCT System	55
1 Introduction	55
2 New PSOCT System for Measurement of Optical Parameters	55
2.1 Using the Thermal Light Source	56
2.2 Measurement of the Thickness and the Refractive Index	56
2.3 Measurement of the Phase Retardation and the Optical Axis Orientation	59
2.4 Calculating ne and no	62
3 Discussion	63
Chapter 4 Signal Processing Method	68
1 Signal Modulation and Demodulation Techniques	68
2 The Procedure for Determining the Locations of Peaks of the Interferometric Signal	69
2.1 Demodulation of the Interferometric Signal	69
2.2 Peak Detection	71
2.3 Simulation of the Demodulation Method and the Peak Detection	72
3 The Procedure for Determining the Amplitude and the Phase of the Interferometric Signal	73
3.1 Introduction	73
3.2 Hilbert Transform	74
3.2.1 Analytic Representation	74
3.2.2 Simulation of the Extraction Method of Amplitude and Phase	76
3.3 Discussion	76
Chapter 5 Experiment with New PSOCT System	84
1 Introduction	84
2 Measurement System Set up and Signal Processing	84
2.1 System Configuration	84
2.2 Calibration in the Measurement System	86
2.3 Procedure of Signal Process	88
3 Experiment Steps and Results	89
3.1 Axial Resolution and Dispersive Interferometric Signals	89
3.2 Measurement of the Refractive Index and the Thickness	90
3.3 Measurement of the Phase Retardation and the Optical Axis Orientation	92
3.3.1 Zero-order Quarter-Wave Plate	93
3.3.2 Measurement of the Optical axis Orientation	94
3.3.3 Multi-order Quarter-Wave Plate	95
4 Discussion	97
4.1 Discussion on the Refractive Index and the Thickness	97
4.2 Discussion on the Phase Retardation and the Optical Axis Orientation	98
4.3 Discussion on the Calculated ne and no	99
4.4 Conclusion	100
Chapter 6 Conclusion and Suggestions	120
1 Conclusions	120
2 Suggestions	121
2.1 Compensate the Dispersion by Numerical Method	121
2.2 Combining the New PSOCT with Commercial Microscopy	122
2.3 Powerful Instruments	122
2.4 Full-Field Measurement of our New PSOCT	123
Bibliography	124
Autobiography	131


                                    

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校內：2011-07-26公開
校外：2011-07-26公開

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