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研究生: 孫偉豪
Sun, Wei-Hao
論文名稱: 水熱法沉積羥基氧化鐵在n型氮化鎵上作為光陽極之光電化學水分解特性分析
The study of photoelectrochemical water splitting using n-GaN with FeOOH deposited by hydrothermal as the photoanodes
指導教授: 許進恭
Sheu, Jinn-Kong
學位類別: 碩士
Master
系所名稱: 理學院 - 光電科學與工程學系
Department of Photonics
論文出版年: 2021
畢業學年度: 109
語文別: 中文
論文頁數: 141
中文關鍵詞: 光電化學氮化鎵光腐蝕羥基氧化鐵
外文關鍵詞: Photoelectrochemical, GaN, photo-corrosion, FeOOH
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  • 此研究使用的半導體為 n 型氮化鎵,由於氮化鎵在常溫下不易與酸或者是鹼反應,且具有低電阻、能帶橫跨水的氧化還原電位等特性,因此十分合適當作光電解水的工作電極,但礙於其分解電位的位置,使氮化鎵在實驗中容易發生光腐蝕,導致元件的損耗。
    在本碩論研究中,利用水熱法沉積羥基氧化鐵或是羥基氧化鐵摻雜鎳化合物來當作催化劑並沉積在氮化鎵上,結果證實了羥基氧化鐵的沉積可提升表面反應動力,並從 SEM 觀察到氮化鎵腐蝕的情況確實被抑制。

    Photoelectrochemical solar water splitting is a promising approach to transform light energy into hydrogen energy. Since gallium nitride(GaN) is quite stable at room temperature and its energy band position straddles the redox potential of water, it is very suitable as a working electrode for photoelectrochemical water splitting. However, gallium nitride has photo-corrosion in the experiment, resulting in the decay of lifetime. In this study, we discussed the characteristics and photoelectrochemical (PEC) performance of FeOOH and Ni:FeOOH respectively which deposited by hydrothermal method on n-type gallium nitride substrate. The results showed that the deposition of FeOOH on gallium nitride could increase the interfacial reaction kinetics. We also observed that the corrosion of gallium nitride was improved, and finally enhanced the lifetime.

    摘要 I 致謝 VII 目 錄 VIII 表目錄 XI 圖目錄 XII 第一章 緒論 1 1-1前言 1 1-2研究動機與目的 2 1-3文獻回顧與研究內容 3 第二章 理論 8 2-1氫氣析出反應(hydrogen evolution reaction,HER)、氧氣析出反應(oxygen evolution reaction ,OER)機制 8 2-2液半接面 10 2-3準費米能階 14 2-4光催化劑 16 2-5助催化劑(cocatalyst) 21 2-6光腐蝕效應(Photocorrosion) 25 2-7光電化學系統運作原理 29 2-8轉換效率 32 第三章 試片製備、實驗設計 36 3-1工作電極製備 36 3-2光電化學量測系統介紹 41 3-3使用儀器與藥品 43 第四章 羥基氧化鐵實驗 45 4-1試片命名與結構示意圖 45 4-2 羥基氧化鐵分析大綱 47 4-3羥基氧化鐵-光學特性 48 4-4羥基氧化鐵-光電化學實驗前之表面形貌 50 4-5光電化學實驗-Mott Schottky 量測 54 4-6光電化學實驗-循環伏安法(cyclic voltammetry, CV) 56 4-7光電化學實驗-開路電位 (Open-circuit potential, OCP) 量測 60 4-8光電化學實驗-Tafel量測 64 4-9光電化學實驗-化學阻抗頻譜分析(Electrochemical Impedance Spectroscopy, EIS) 68 4-10光電化學實驗-線性掃描伏安法(Linear sweep voltammetry, LSV) 73 4-11光電化學實驗-穩定性量測、ABPE效率比較 80 4-12光電化學實驗-IPCE量測 82 4-13羥基氧化鐵-光電化學實驗後之表面形貌 84 4-14羥基氧化鐵-光電化學實驗前後之XPS量測 88 第五章 羥基氧化鐵摻鎳實驗 92 5-1引言 92 5-2試片命名與結構示意圖 92 5-3羥基氧化鐵摻鎳分析大綱 95 5-4羥基氧化鐵摻雜鎳-光學特性 96 5-5羥基氧化鐵摻雜鎳-光電化學實驗前之表面形貌 97 5-6光電化學實驗-Mott Schottky 量測 101 5-7光電化學實驗-循環伏安法(cyclic voltammetry, CV) 102 5-8光電化學實驗-開路電位 (Open-circuit potential, OCP) 量測 104 5-9光電化學實驗-Tafel量測 106 5-10光電化學實驗-化學阻抗頻譜分析(Electrochemical Impedance Spectroscopy, EIS) 110 5-11光電化學實驗-線性掃描伏安法(Linear sweep voltammetry, LSV) 114 5-12光電化學實驗-穩定性量測 120 5-13光電化學實驗-IPCE量測 121 5-14羥基氧化鐵摻雜鎳-光電化學實驗後之表面形貌 123 5-15羥基氧化鐵摻雜鎳-光電化學實驗前後之XPS量測 128 第六章 結論與未來展望 134 6-1結論 134 6-2未來展望 135 參考文獻 136

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