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研究生: 林峻範
Lin, Jyun-Fan
論文名稱: 多元金屬硫族化合物之合成鑑定與物理性質探討
Syntheses, Characterizations and Physical Properties of Multinary Metal Chalcogenides
指導教授: 許桂芳
Hsu, Kuei-Fang
學位類別: 碩士
Master
系所名稱: 理學院 - 化學系
Department of Chemistry
論文出版年: 2012
畢業學年度: 100
語文別: 中文
論文頁數: 102
中文關鍵詞: 助熔長晶法非線性兆赫波
外文關鍵詞: solid state, non-linear optical, terahertz
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  • 本論文以助熔長晶法,合成出兩種不同結構系統之八個金屬硫族化合物。分別為第一個系統六個化和第二系統兩個化合物。
    第一個系統六個化合物皆為等結構,其晶系屬於非中心對稱空間群,且因置換元素不同致晶格大小有所差異。由化合物的能隙、紅外-可見光區的穿透度及拉曼光譜圖顯示出此化合物在紅外光區具有非線性應用潛力。
    第二系統兩個化合物亦為等結構。由能隙和兆赫波時域光譜儀發現在兆赫波段有良好穿透度,搭配其窄能隙對應於長程光通訊波段,期望能應用於此波段中兆赫波源發射器上的光電導元件。

    Eight new compounds have been synthesized through solid state reactions using a KBr flux to promote crystal growth.
    Six compounds of first system all are isostructures crystallizing in the non-centrosymmetric space group. The characterizations of band gap, transmission in the uv-vis-ir range, and raman spectroscopy support that these compounds have the potential application as the non-linear optical crystals applied in the infrared ranges.
    Both 5 and 6 adopt same three-dimensional structure. The band gap of 5 and 6 characterized by UV-Vis-NIR spectrum. At last, we prove compound 5 have good transmission in 0.1~0.5 THz region by Terahertz Time-Domain Spectroscopy and expect it can be used to in optical communications.

    摘要 II Abstract III 致謝 IV 目錄 V 表目錄 VIII 圖目錄 X 第一章 非線性硫族化合物系統之合成與鑑定 1 1.1 前言 1 1.2 實驗部分 7 1.2.1 合成方法 7 1.2.2 單晶X光繞射分析 (Single Crystal X-ray Diffraction Analysis) 9 1.2.3 能量散佈光譜儀(Energy Dispersive Spectrometer, EDS) 12 1.2.4 粉末X光繞射分析(Powder X-ray Diffraction Analysis) 13 1.2.5 紫外-可見-近紅外光光譜儀 (UV-Vis and near IR reflection spectrometer) 14 1.2.6 紅外光光譜分析(IR Reflection Spectroscopy) 15 1.2.7 顯微拉曼散射光譜分析(Microscopes Raman Scattering Spectroscopy) 16 1.3 結構描述 18 1.4 物理性質 32 1.4.1 純相鑑定 32 1.4.2 固溶體(Solid Solution)現象 34 1.4.3 能隙測量 40 1.4.4 透光範圍檢測 42 1.4.5 拉曼光譜分析 43 第二章 兆赫波硫族化合物系統合成與鑑定 48 2.1 前言 48 2.2 實驗部分 52 2.2.1 合成方法 53 2.2.2 單晶X光繞射分析 (Single Crystal X-ray Diffraction Analysis) 54 2.2.3 能量散佈光譜儀(Energy Dispersive Spectrometer, EDS) 56 2.2.4 粉末X光繞射分析(Powder X-ray Diffraction Analysis) 57 2.2.5 紫外-可見-近紅外光光譜儀 (UV-Vis and near IR reflection spectrometer) 57 2.2.6 兆赫波時域光譜儀(Terahertz Time-Domain Spectroscopy) 58 2.3 結構描述 59 2.4 物理性質 67 2.4.1 純相鑑定 67 2.4.2 能隙測量 68 2.4.3 兆赫波性質測量 69 第三章 結論 74 參考文獻 76 附錄 79

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