| 研究生: |
趙家樑 Chao, Chia-Liang |
|---|---|
| 論文名稱: |
以電漿化學氣相離子沉積法成長類鑽碳奈米複合薄膜 Deposition of Diamond-Like Carbon Nanocomposite films by Plasma Chemical Vapor ion Plating Method |
| 指導教授: |
洪昭南
Hong, Chau-Nan Franklin |
| 學位類別: |
碩士 Master |
| 系所名稱: |
工學院 - 化學工程學系 Department of Chemical Engineering |
| 論文出版年: | 2004 |
| 畢業學年度: | 92 |
| 語文別: | 中文 |
| 論文頁數: | 96 |
| 中文關鍵詞: | 類鑽碳 、二氧化鈦 、複合材料 |
| 外文關鍵詞: | nanocomposite, DLC, TiO2 |
| 相關次數: | 點閱:70 下載:1 |
| 分享至: |
| 查詢本校圖書館目錄 查詢臺灣博碩士論文知識加值系統 勘誤回報 |
在類鑽碳奈米複合薄膜的研究方面,主要是針對傳統的類鑽碳薄膜在應用上具有的缺點來進行改良。由於類鑽碳膜具有極佳的物理與化學特性,因此可應用於模具、光學元件與生醫材料等方面。
在本研究中將利用含有Ti-C-O等元素Tetraisoproxide
titanium,TTIP 與O2為反應物進行薄膜的沉積。所使用的系統為RF ICP電漿系統。形成的薄膜以XRD進行奈米粒子的結構鑑定,以 XPS 光譜分析薄膜的鍵結型態,顯示內部具有TiC、TiO2 所組成的奈米粒子,再藉由高解析穿透分析式電子顯微鏡確定該奈米粒子的存在與大小,且利用接觸角量測來進行親水性的變化。
藉由實驗參數的設定,我們可以沉積包含TiO2奈米粒子的類鑽碳奈米複合薄膜。奈米粒子的尺寸約5nm~20nm,且薄膜在紫外光照射下具有高親水性,薄膜的硬度約8Gpa,應力約3Gpa。且由拉曼光譜圖可知薄膜內有較多的sp2碳含量。
TTIP與O2的比例、氣體的壓力及基板偏壓皆影響到膜中奈米粒子的晶形結構,以及奈米複合薄膜受紫外光照射所導致的親水性。在低工作壓力及高偏壓的情形下鍍膜時的奈米粒子具有較佳的晶形結構,在經過紫外光照射後也具有較佳的親水性。
In studying the diamond-like nanocomposite films, the major efforts have been concentrated on overcoming the problems of conventionaldiamond-
like carbon (a-C:H or DLC) films, such as high residual stresses, poor adhesion, etc. DLC films have attracted widespread attention due to their great potentials in high tech tribological industries, optical device and biological materials, etc.
In this study, Ti-C-O organometallic precursor (TTIP) mixed with O2 was employed to deposit TiO2-containing the diamond-like carbon films. XRD and X-ray photoemission spectroscopy (XPS) analysis suggested that nanoparticles were formed embedded in the diamond-like carbon matrices. According to the analysis with high-resolution analytical electron microscopy (HRAEM), we observed crystalline TiC、TiO2 nanoparticles were formed in the diamond-like carbon films.
By modualing the experimental conditions,we can deposite the diamond-like-carbon nanocomposite which has the TiO2 nanoparticles.The nanoparticle size is about 5nm,and the film is very hydrophilic under UV radiation. The hardness of the film is about 8 GPa,and the stress is about 3 GPa .By Raman spectroscopy the film show more sp2 carbon than sp3 carbon.
The gas ratio of TTIP and O2 ,the gas pressure and the substrate bias affect the crystallographic structure and UV-light-induced hydrophilicity of the deposited nanocomposite films. The film deposited at low working pressure and high substrate bias has good UV -induced hydrophilicity.
1.翁文毅,成功大學化工所碩士論文,2002
2.宋健民,鑽石合成,全華科技圖書股份有限公司,台北 台灣,2000
3. E. G. Spence, P. H. Schmidt, D. H. Joy, and F. J. Sansalone, Appl.Phys. Lett. 29, 118 (1976).
4. a) J. Robertson, J. Non-Cryst. Solid, 164-166, 1115 (1993); b) C. A.David, Thin Solid Films, 226, 30 (1993); Y. Lifshitz, S. R. Kasi, J.W. Rabalais, and W. Eckstein, Phys. Rev. B, 41(15), 10468 (1990).D. P. Monaghan, D. G. Teer and I. Efeoglu, Surf. coat. Technol., 59(1993)21
5. S. S. Camargo Jr., R. A. Santos, W. Beyer, Diamond and Related Materials 9, 658 (2000).
6. Myeong-Geun Kim, Kwang-Ryeol Lee, Kwang Yong Eun, Surf. & Coat. Technol., 112, 204 (1999).
7. a) Q. F. Huang, S. F. Yoon, Rusli, K. Chew, and J. Ahn, J. Appl.Phys. 90(9), 4520 (2001); b) Ivan R. Videnović, Verena Thommen,and Peter Oelhafen, Daniel Mathys, Marcel Düggelin, abd Richard
Guggenheim, Appl. Phys. Lett. 80(16), 2863 (2002); c) Da-Yung Wnag, Ko-Wei Weng, Shi-Yao Hwang, Diamond and Related Materials 9, 1762 (2000).
8. M. P. Siegal, J. C. Barbour, P. N. Provencio, D. R. Tallant, and T. A. Friedmann, Appl. Phys. Lett. 73(6), 759 (1998).
9 Jianjun Dong and David A. Drabold, Phys. Rev. B 57(24), 15591 (1998).
10.F. Cellier, J. F. Nowak, Diamond and Related Materials, 3, 1112 1994).
11. Throu Hara, Kouichi Yani, Ken Inoue, Shigeaki Nakamura, and Takwshi Murai, Appl. Phys. Lett. 57(16), 1662 (1990).
12. J. Sasaki, K. Hayyashi, K. Sugiyama, O. Ichiko, and Y. HaShiquchi, Surf. & Coat. Technol., 65, 160.(1994).
13. X. Wang, H. Harris, F.Temkin, and S. Gangopadhyay, M. D. Strathman and M. West, Appl. Phys. Lett. 78(20), 3079 (2001).
14. E. Tomasella, C. Meunier, S. Mikhailov, Surf. Coat. Technol. 141,286 (2001).
15. M. Gioti, D. Papadimitriou, S. Logotheridis, Diamond and Related Materials, 9, 741 (2000).
16. S. Logothetidis, Appl. Phys. Lett. 69, 158 (1996).
17.a) Katsuyuki Okada, Shojiro Komatsu, Takamasa Ishigaki, and Seiichiro Matsumoto, Mat. Res. Soc. Symp. Proc. 363, 157 (1995);
b) Hosun Lee and In-Young Kim, S.-S. Han, and B.-S. Bae, M. K. Choi, and In-Sang Yang, J. Appl. Phys. 90(2), 813, (2001)
18. Liang-Yih Chen and Franklin Chau-nan hong, Appl. Phys. Lett. 82(20), 3526 (2003).
19. T. A. Friedmann, K. F. McCarty, J. C. Barbour and M. P. Siegal, Dean C. Dibble, Appl. Phys. Lett. 68(12), 1643 (1996).
20. T. W. Mercer, M. J. Dinardo, J. B. Rothman, M. P. Siegal and T. A.Friedmann, L. J.
Martinez-Miranda, Appl. Phys. Lett. 72(18), 2244
(1998).
21. M. Chhowalla, C. A. Davis, M. Weiler, B. Kleinsorge, and G. A. J.Amaratunga, J. Appl. Phys. 79, 2237 (1996).
22. D. R. McKenzie, D. Muller, and B. A. Pailthorpe, Phys. Rev. Lett.67(6), 773 (1991
23.T. Hioki, K. Okumura, Y. Ltoh, S. Hibi and S. Noda, Surf. Coat.Technol. 65, 106 (1994).
24. N. Takada, K. Shibagaki, K. Sasaki, and K. Kadota, K.-I. Oyama, J.Vac. Sci. Technol. A 19(2), 689 (2001).
25. W. D. Kingery, H. K. Bowen, and D. R. Uhlmann, Introduction to Ceramics, Chapter 2, John Wiley & Sons, Canada, 1991林原誌,奈米壓痕儀之原理及操作簡介,2000,4月。
26. 余樹貞,晶體之結構與性質,第十二章,渤海堂文化公司,台北台灣,1993張瑞發, 化工資訊, 4 (1993) 68。
27.J. C. Angus, and C. C. Hayman, Science 241, 913 (1998)
28.J.Robertson, Surf. Coat. Technol. 50, 185 (1992)
29.張瑞發, 化工資訊, 4, 68 (1993)
30.C. D. Martino, F. Demichelis, and A.Tagliaferro, Diamond Relat. Mater. 4, 1210 (1995)
31.D.R. McKenzie, D. Muller, and B.A. Pailthorpe, Phys. Rev. Lett., 67 (1991) 773
32.C. D. Martino, F.Demichelis and A.Tagliaferro,“Determination of the sp3/sp2 Ratio in a-C:H Films by Infrared Spectrometry Analysis,” Diamond Relat. Mater.4.1210-1215(1995).
33.I. Garnev and V. Orlinov,“Evaluation and Parametric Modeling of Abrasive Wear Resistance of Ion-Plated Thin DLC films,” Diamond Relat.Mater.4. 1041-1045(1995).
34. J. J. Cuomo, D. L. Pappas, J. Bruley, J. P. Doyle and K. L. Saenger, “Vapor Deposition
Processes for Amorphous Carbon Films with sp3 Fractions Approaching Diamond,” J. Appl. Phys., 70 [3] 1706-1711 (1991).
35. P. C. Kelires, C. H. Lee and W. R. Lambrecht, “Structural Studies and Electronic Properties of Diamond-Like Amorphous Carbon,” J. Non-Cryst. Solids, 164/166 1131-1134 (1993).
36. J. Robertson, “Deposition Mechanism of Cubic Boron Nitride,” Diamond Relat. Mater., 5 519-524 (1996).
37. J. Robertson, “The Deposition Mechanism of Diamond-Like a-C and a-C:H,” Diamond Relat. Mater., 3 361-368 (1994).
38. J. Robertson, “Deposition Mechanism of a-C and a-C:H,” J. Non-Cryst. Solids, 164/166 1115-1118 (1993).
39. C. Venkatraman, D.Kester, A. Goel, D. Bray, ASM Materials Week,October, 1995.
40. C. Z. Wang and K. M. Ho, “Structure, Dynamics, and Electronic Properties of Diamondlike Amorphous Carbon,” Phys. Re v. Lett., 71 [8] 1184-1187 (1993).
41. D. Neerinck, P. Persoone, A. Goel, C. Venkatraman, D.Kester,C. Halter, D. Bray, in:Proc. Trends Applications Thin Films ’96,
Apil,1996,Colmar,France, p. 67.
42. Xing-zhao Din*, Fu-min Zhang, Xiang-Huai Liu et al, Thin Solid Films, 346(1992) 82-85.
43. D. Neerinck, P. Persoone, M. Sercu, A. Goel, C. Venkatraman, D. Kester, C. Halter, P. Swab, D. Bray, Thin Solid Films, 317(1998) 402-404.
44. C. -T. Lin, F. Li, and T. D. Mantel, J. Vac. Sci. Technol. A 17(3), May/Jun 1999,735-740.
45. V.F. Dorfman, B.N. Pypkin, Surf. Coatings Technol. 48 (1991) 193.
46. M.Grischke, A.Hieke, F. Morgenweck, H.Dimigen, Diamond and Related Materials 7 (1998) 454-458.
47. T. Hioki, K. Okumura, Y. Itoh, S.Hibi and S. Noda, Surf. Coatings Technol. 65 (1994) 106-111.
48. 陳力俊,材料電子顯微鏡學,第十一章,行政院國家科學委員會精密儀器發展中心,新竹台灣,1984。
49. Chalker, P.R., Bull, S.J. and Rickerby, D.S., “A review of the methods for the evaluation of coatings-substrate adhesion,” Material Science Engineering A,Vol.140, 1991,pp583-592.
50. Chiang, S.S., Marshall, D.B. and Evans, A.G., pask and A.G.Evans(ed.),Surface and Interfaces in Ceramic-metal System,Plenum,N.Y.1981, p.603.
51. Jindal, P.C., Quinto, D.T. and Wolfe, G.J., “Adhesion measurements of chemically vapor deposited hard coatings on WC-Co substrate,”Thin Solid Films, Vol.154,1987,pp.361-375.
52. V. F. Dorfman, Thin Solid Films, 212, 267 (1992).
53. B. Dorfman, M. Abraizov, Fred H. Pollak, D. Yan, M. Strongin, X.-Q.Yang and Z.-Y. Rong, Mat. Res. Soc. Symp. Proc. 349, 547 (1994).
54. V. F. Dorfman, A. Bozhko, B. N. Pypkin, R. T. Borra, A. R. Srivatsa,H. Zhang, T. A. Skotheim, J. Khan, D. Rodichev, and G. Kirpilenko,Thin Solid Films, 212, 274 (1992).
55. B. Dorfman, M. Abraizov, B. Prpkin, M. Strongin, X.-Q. Yang, D.Yan, Fred H. Pollak, J. Grow and R. Levy, Mat. Res. Soc. Symp.Proc. 351, 43 (1994).
56. Xing-Zhao Ding, Fu-Min Zhang, Xiang-Huai Liu, P. W. Wnag, W. G.Durrer, W. Y. Cheung, S. P. Wong, I. H. Wilson, Thin Solid Films,346, 82 (1999).
57. Ling-Yih Chen and Franklin Chau-Nan Hong, Diamond and RelatedMaterials, 10, 1058 (2000).
58. V. V. Voevodin, S. V. Peasas, and J. S. Zabinski, J. Appl. Phys.82(2), 855 (1997).
59. V. V. Voevodin, M. A. Capano, A. J. Safriet, M. S. Donley, and J. S.Zabinski, Appl. Phys. Lett. 69(2), 188 (1996).
60. V. V. Voevodin, J. P. O’Neill, J. S. Zabinski, Surf. & Coat. Technol.116-119, 36 (1999).
61. G. A. J. Amaratunga, M. Chhowalla, C. J. Kiely, I. Alexandrou, R.Aharonov, and R. M. Devenish, Nature, 383, 321 (1996).
62. M. P. Siegal, P. N. Provencio, D. R. Tallant, and R. L. Simpson, B. Kleinsorge and W. I. Milne, Appl. Phys. Lett. 76(15), 2047 (2000).
63. T. A. Friedmann, J. P. Sullivan, J. A. Knapp, D. R. Tallant, and D. M. Follstaedt, D. L. Medlin, and P. B. Mirkarimi, Appl. Phys. Lett.
71(26), 3820 (1997).
64 M. P. Siegal, J. C. Barbour, P. N. Provencio, D. R. Tallant, and T. A. friedmann, Appl. Phys. Lett. 73(6), 759 (1998).
65. L. J. Martinez-Miranda, M. P. Siegal, amd P. P. Provencio, Appl.Phys. Lett. 79(4), 542 (2001).
66. a) M. P. Siegal and D. R. Tallant, L. J. Martinez-Miranda, J. C.Barbour, R. L. Simpson, and D. L .Overmyer, Phys. Rev. B 61(15),10451 (2000); b) M. P. Siegal, D. R. Tallant, P. N. Provencio, D. L.Overmyer, and R. L. Simpson, L. J.
Martinez-Miranda, Appl. Phys.Lett. 76(21), 3052 (2000).
67. J. Musil, J. Vlček, Thin Solid Films, 343-344, 47 (1999)
68. C. Mitterer, P. H. Mayrhofer, M. Beschkiesser, P. Losbichler, P.
Warbichler, F. Hofer, P. N. Gibson, W. Gissler, H. Hruby, J. Musil,
J. Vl ček, Surface & Coat. Technol., 120-121, 405 (1999).
69. J. Musil, Surface & Coat. Technol., 125, 322 (2000).
70. 曾煥華,電漿的世界,第一章,銀禾文化事業有限公司,台北台灣,1987
71. Brian Chapman, Glow Discharge Processes, John Wiley & Sons, Inc, United State of America, 1980, Chapter 5
72. 洪昭南,電漿反應器,化工技術,第三卷,第三期,124,1995
73. J. R. Roth, Industrial Plasma Engineering-Volume 1: Principles, Institute of Physics Publishing, London, 1995
74. T.Tagkagi, J.Vac. Sci. Technol., A2 (1984) 382
75. K. Morikawa, Heat Treatment (Japanese), 31 (1987) 3.
76.艾啟峰,真空科技
77. Oleg A. Popov, High Density Plasma sources Design, Physics and performance, Noyes Publication, New Jersey, U.S.A.
78.陳熹,高週波基礎理論與應用,第三篇,全華科技股份有限公司,台北台灣,1995。
79. A. Sclafani, J. H. Herrmann, J. Phys. Chem. , 100 , 13655-13661
(1996)
80. A. Sclafani, L. Palmisano, M. Schiavello, J. Phys. Chem. , 94 ,
829 (1990)
81. A. Fujishima, T. N. Rao, and D. A. Tryk, J. Phochem. Potobiol. C:
Photochem review 1 (2000) 1-21.
82. A. Heller, Acc. Chem. Res. 14 (1981) 154-162.
83. R. W. Mattews, J. Phys. Chem. 91 (1987) 3328-3333.
84. M. A. Fox, and M.Y. Dulay, Chem. Rev. 93(1) (1993) 341-357
85. J. Willetts, L. C. Chen, J. F. Graefe, and R.W. Wood, Life Science
Including Pharmacology Letters 57 (15) (1995) 225-230.
86. A. Fernandez, G. Lassaletta, V. M. Jimenez, A. Justo, A. R. Gonzalez-Elipe, J-M. Herrmann, H, Tahri, and Y. Ait-Ichou, Applied Catalysis B: Environmental 7 (1995) 49-63.
87.Merta I. Litter, Applied Catalysis B: Environmental 23 (1999) 89-114.
88.Merta I. Litter, Applied Catalysis B: Environmental 23 (1999) 89-114.
89.D. Dumitriu, A.R. Bally, C. Ballif, P. Hones, P. E Schmid, R. Sanjinés, and F. Lévy, Applied Catalysis B: Environmental 25 2-3 (2000) 83-92.
90. I. Watanabe, T. Matsushita and K. Sasahara, Jpn. J. Appl., Phys. 31, 1428 (1992)
91. R. Nonogaki, S. Yamada, T. Araki, and T. Wada, J. Vac. Sci. Technol. A 17(3), 731 (1999)
92. F.Tuinstra and J.L. Koenig, J. Chem. Phys. 53(3), 1126 (1970)
93. S.A. Solin, Physica B 99, 443 (1980)
94. M. A. Capano, N. T. McDeutt, R. K. Singh, and F. Qian, J. Vac. Sci. Technol. A, 14(2), 431 (1996)
95. M. A. Tamor and W. C. Vassel, J. Appl. Phys., 76(6), 3823 (1994)
96. H. C. Tasi, D. B. Bogy, M. K. Kundmann, D. K. Veirs, M. R. Hilton and S. T. Mayer, J. Vac. Sci. Technol. A 6(4), 307 (1998)
97. 何主亮,常挽瀾,陳育智,真空科技,第9卷,第二期,34,1996
98. S. Prawer, K. W. Nugent, Y. Lifshitz, G. D. Lempert, E. Grossman, J. Kulik, I. Avigal, and R. Kalish, Diamond Relat. Mater. 5, 433 (2996)
99. F. Tuinstra and J. L. Koening, J. Chem. Phys. 53, 1126 (1970)
100. C. Mapelli, C. Casiglioni, C. Zerbi, and K. Mullen, Phys. Rev. B 60, 12710 (1999)]
101. R. O. Dillon, J. A. Woollam, and V. Katkanant, Phys. Rev. B 29, 3482 (1984)
102. R. J. Nemanich, J. T. Glass, G. Lucovsky, and R. E. Shroder, J. Vac. Sci. Technol. A 6, 1783
(1988)
103. J. R. Shi, X. Shi, Z. Sun, E. Liu, B. K. Tay, S. P. Lau, Thin Solid Films 366, 169 (2000)
104. L. K. Cheeh, X. Shi, E. Liu, B. K. Tay, J. R. Shi, and Z. Sun, Phil. Mag. B 79, 1647 (1999)
105. B. Kleinsorge, S. E. Rodil, G. Adamopoulos, J. Robertson, D. Grambole, and W. Fukarek, Diamond Relat. Mater. 10,965 (2001)
106. Stan Veprek,J. Vac. Sci. Technol. A 17(5), 2401 (1999)
107. 林原誌,奈米壓痕儀之原理及操作簡介,交通大學材料系郭正次老師研究室講義,台灣,2000
108..A.A. Voevodin, M.A. Capano, S.J.P.Laube,M.S.Donley,J.S.S.Zabinski“Design of a Ti/TiC/DLC functionally gradient coating based on studies of structural transitions in Ti-C thin films”Thin solid films 298(1997)107-115
109.Anouk Schroeder, Gilbert Francz, Arend Bruinink, Roland Hauert, Joerg Mayer,Erich Wintermantel“ Titauium containing amorohous hydrogenated carbon films (a-C:H/Ti):surface analysis and evaluation of cellular reactions using bone marrow cell culture in vitro”Biomaterials 21(2000)449-456 110.Moulder JF,Stickle WF Sobol PE,Bomben KD,Handbook of X-ray photoelectron spectroscopy, Eden Prarie, Minnesota(USA), Perkinp-Elmer Corporation,Physical Electronics Division 1992.p213-248
111.Schier V,Michel HJ,Halbritter J,Fresenius J.ARXPS-analysis of Sputter TiC,SiC and Ti0.5Si0.5C layers,J Anal Chem 1993;346:227-32
112.Ramqvist L,Hamrin K,Johansson G ,Fahlman A,Nordling C.Charge transfer in transition metal cabides and related Compounds studies by ESCA. J Phys Chem Solid 1969;30:1835-47
113.Wagner CD,Zatko DA,Raymond RH. Use of the oxygen KLL auger lines in identification of surface chemical states by electron spectroscopy for chemical analysis.Anal Chem 1980;52:1445-51
114.Masatoshi Nakamura,Toru Aoki,Yoshinori Hatanaka,Dariusz Korzec,Jurgen Engemann“Comparsion of hydrophilic properties of amorphous TiOX films obtained by radio frequency sputtering and plasma-enhanced chemical vapor deposition.”