| 研究生: |
阮彥凱 Yuan, Yan-Kai |
|---|---|
| 論文名稱: |
製程參數對直流濺鍍複合電子迴旋共振系統沉積類鑽鍍膜之研究 The research of DLC films deposited by MW-ECR CVD |
| 指導教授: |
李世欽
Lee, Shin-Chin |
| 學位類別: |
碩士 Master |
| 系所名稱: |
工學院 - 材料科學及工程學系 Department of Materials Science and Engineering |
| 論文出版年: | 2002 |
| 畢業學年度: | 90 |
| 語文別: | 中文 |
| 論文頁數: | 97 |
| 中文關鍵詞: | 類鑽碳 、電子迴旋共振 |
| 外文關鍵詞: | ECR-CVD, DLC |
| 相關次數: | 點閱:57 下載:1 |
| 分享至: |
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摘要
類鑽碳膜具有許多的優異性質,如:高硬度外,在室溫下還具有良好的熱傳導性,且絕緣性質高,對酸、鹼、熱有很好的抵抗能力,並且具有對可見光到紅外光波段的穿透性以及生物相容性極佳的特性,在電子、光學、耐熱、耐摩耗與生醫材料等各界是一項的重要材料。然而,由於製程上離子轟擊效應,導致類鑽碳膜產生很高的壓縮應力,造成類鑽碳膜容易與基板剝離,進而產生附著力不佳的缺點。
本研究使用微波電子迴旋共振化學氣相沈積法(MW-ECR CVD)成長類鑽碳膜,以乙炔及氬氣為反應氣體,基材為SKH51鋼材,並透過製程參數上的負偏壓及乙炔流量的改變,來研究類鑽碳膜的性質。由於類鑽碳膜與鋼材的附著性不佳,故本研究採用添加鈦金屬的方式,形成含鈦類鑽碳膜,並量測鍍膜之之種種特性,以瞭解鍍膜之性質。
研究結果顯示,當乙炔流量增加時,鍍層摩擦係數、表面粗糙度、沉積速率、鍍層臨界荷重皆呈現下降趨勢,而電阻率、磨耗壽命、硬度等則表現出上升趨勢,透過拉曼光譜分析其特性峰有往低波數位置偏移現象。
Abstract
Diamond-like carbon films exhibit extreme hardness、high surface smoothness、low friction coefficient and acid- or base-resistance. However, the sp3 bonding of carbon atoms in the amorphous structure are severely distorted and strained, resulting in a large compressive stress within the film.
Amorphous hydrogenated diamond-like carbon films were deposited on the steel by electron cyclotron resonance chemical vapor deposition with magnetron sputtering using C2H2 and Ar as gas sources. The properties of the film were investigated by SEM、Auger electron spectroscopy(AES)、atomic force microscope (AFM)、Raman spectroscopy and pin-on-disk tribometer.
The results reveal that the structure、adhesion、hardness and friction coefficient of the film depend its deposition bias and C2H2 flow rate. With the C2H2 flow rate increasing, the ratio of sp3 to sp2 and hardness is increasing. With the C2H2 flow rate increasing, the friction coefficient of the film is decreasing.
參考資料
1. F.P. Bundy, H.T. Hall, H.M. Strong, and R.H. Wentorf, Nature 176, 51(1955)
2. Z. Ring and T.D. Mantei, J. Vac. Sci. Technol., A13 (1995) 1617
3. Z. Ring and T.D. Mantei, Appl. Phys. Lett., 66 (1995) 3380
4. C.R. Eddy, Jr., D.L. Youchison and B.D. Sartwell, Diamond and Related Materials, 3 (1993) 105
5. R.K. Singh, D. Gilbert, R. Tellshow, P. H. Holloway, R. Ochoa, and J.H. Simmons, Appl. Phys. Lett., 61 (1992) 2863
6. T. Yara, M. Yuasa, M. Shimizu and H. Makita, Jpn. J. Appl. Phys., 33 (1994) 4404
7. M. Ihara, H. Maeno, K. Miyamoto and H. Komiyama, Diamond and Related Materials, 1 (1992) 187
8. S.H. Kim, Y.S. Park and S.K. Jung, J. Vac. Sci. Technol., A13 (1995) 1619
9. I. Watanabe, T. Matsushita and K. Sasahara, Jpn. J. Appl. , Phys. 31 (1992) 1428
10. N. Mutsukuza, S. Tomita and Y. Mizum, Thin Solid Films, 214 (1992) 58
11. C.V. Cooper, P. Holiday and A. Matthews. The Effect of TiN Interlayer on the Indentation Behavior of Diamond-like Carbon Films on Alloy and Compound Substrates, Sur. Coat. Technol. ,63(1994) p.129
12.K.Holmberg,J.Koskinen,H.Ronkainen,J.Vihersalo,J.Phirvonen and J.Likonen, Tribological Characteristics of Hydrogenated and Hydrogen-free Diamond-like Carbon Coatings, Diamond Films Technol.4(1994) p.113
13. E.I. Meleties, A. Erdemir and G.R. Fenske, Tribological Characteristics of DLC Films and Duplex Plasma Nitriding/DLC coating Treatments, Surf.Coat.Technol. 73(1995) p.39
14. S. J. Harris, A.M. Weiner , S.C.Tung, S.J. Simko and M.C.Militello, Diamond-like Films for Wear Protection of Steel, Surf.Coat.Technol.62(1993)p.550
15. Maurice H.Francombe, Plasma Sources For Thin Film Deposition and Etching, Phsics of Thin FilmS 18(1994)
16. 胡一貫,電子迴旋共振等離子技術, 半導體技術 n.6 v.12(1991)
17. 丁兆元,任兆杏, 電子迴旋共振等離子體的研究與應用,物理學進展,第12卷第1期(1992)
18. 甄澤生, 微波電子迴旋共振等離子技術及其應用,真空科學技術,第13卷第2期(1993)
19. J. Robertson, Diamond Relat. Mater., 3 (1994) 361
20. J. Schwan, S. Ulrich, V. Batori, H. Ehrhardt and S.R.P. Silva, J. Appl. Phys., 80 (1996) 440
21. J. Robertson,The deposition mechanism of diamond-like a-C and a-C:H, Diamond Relat.Mater.,3(1994)p.61
22. D.R. Mckenzie, D. Muller and B.A. Pailthorpe, Phys. Rev. Lett., 67 (1991) 773
23. C. Weissmantel, Thin Solid Films, 92 (1982) 55
24. Y. Lifshitz, S.R. Kasi and J.W. Rabelais, phys. Rev. B, 41 (1990) 1046
25. B.A. Pailthorpe, J. Appl. Phys., 70 (1991) 543
26. H.P. Kaukonen and R.M. Nieminen, Phys. Rev. Lett., 68 (1992) 620
27. J.J. Cuomo, D.L. Pappas, J. Bruley, J.P. Doyle and K.L. Saenger, J. Appl. Phys., 70 (1991) 1706
28. P.C. Kelires, C.H. Lee and W.R. Lambrecht, J. Non-Cryst. Solids, 164/166 (1993) 1131
29. J. Robertson, Diamond Relat. Mater., 3 (1994) 361
30. J. Robertson, J. Non-Cryst. Solids, 164/166 (1993) 1115
31. J. Robertson, Surf. Coat. Technol., 50 (1992) 185
32. J. Robertson, Surf. Coat. Technol., 50 (1992) 185
33. A. Grill, Wear, 168 (1993) 143
34. C.Y. Hsu, L.Y. Chen and F.C.N. Hong, Diamond Relat. Mater., in press
35. J. J. Cuomo, D.L. Pappas, J. Bruley, J.P. Doyle and K.L. Saenger, J. Appl. Phys., 70 (1991) 1706
36. A. Grill and V. Patel, Diamond Relat. Mater., 2 (1993) 597
37. S.S. Camargo, Jr, A.L. Baia Neto, R.A. Santos, F.L. Freire, Jr, R. Carius, F. Finger, Diamond and Related Materials, 7 (1998) 1155
38. Weng-Jin Wu, Min-Hsiung Hon, Surface and Coating Technology, 111 (1999) 134
39. H.L. Bai, E.Y. Jiang, Thin Solid Films, 353 (1999) 157
40. D.R. Tallant, J.E. Parmeter, M.P. Siegal, R.L. Sompson, Diamond Relat. Mater. 4 (1995) 191
41. G.R. Rao, E.H. Lee, R. Bhattacharya and A.W. McCormick, J. Mater. Res., 10 (1995) 190
42. C.M. Chan, T.M. Ko and H. Hiraoka, Surf. Sci. Rep., 24 (1996) 241
43. Maurice H. Francombe, Phsics of Thin Films, 18 (1994)
44. J. Asmussen, J. Vac. Sci. Technol. A7(3) (1989) 883
45. P.J.Burnett and D.S. Rickerby,The Relationship between hardness and scratch adhesion , Thin Soild Films, 154 (1987) 404
46. P.J.Burnett and D.S. Rickerby,The Relationship between hardness and scratch adhesion , Thin Soild Films, 154 (1987) 404
47. F. Tuinstra and J.L. Koenig, J. Chem. Phys., 53 (1970) 1126
48. S.A. Solin, Physica B, 99 (1980) 443
49. M.A. Capano, N.T. McDeutt, R.K. Singh and F. Qian, J. Vac. Sci. Technol. A, 14 (1996) 431
50. M.A. Tamor and W.C. Vassel, J. Appl. Phys., 76 (1994) 3923
51. H.C. Tsai, D.B. Bogy, M.K. Kundmann, D.K. Veirs, M.R. Hilton and S.T. Mayer, J. Vac. Sci. Technol. A, 6 (1998) 2307
52. J. Schwan, S. Ulrich, V. Batori, H. Ehrhardt and S.R.P. Silva, J. Appl. Phys., 80 (1996) 440
53. R. Vuppuladium, H.E. Jackson and R.L.C., J. Appl. Pphys., 77 (1995) 2714
54. JIS B 7726
55. JIS B 7727