提出一種提高了生物感測的新方法-surface plasmon resonance（SPR）棱鏡耦合結合史托克 - 穆勒矩陣偏光法，耦合器在偏振光和史托克偏振方法(測量在六個有效橢圓參數的變化)下產生亮度，圓雙折射（CB）的值和圓二色性（CD）的值作為耦合器暴露在具有不同折射率的感測樣本下的結果。進行理論分析，檢測到的感測介質之有效橢圓參數、CB 、CD值中折射率的靈敏度。藉由比較實驗結果中的靈敏度與CB 、CD值中有效的橢偏參數來證明該方法的有效性。結果表明該技術的靈敏度分別為1x10-3和1x10-5 degree/RIU（折射率單位）在CB / CD / DOP為感測和氣體感測。結果表明該技術的分辨性分別為1x10-5和1x10-7 degree/RIU（折射率單位）在CB / CD / DOP為感測和氣體感測。在一般情況下，此研究的結果顯示所測量的有效-橢圓參數、CB、 CD值在於偏振掃描角度擁有高度的敏感性。因此，確認了偏振光掃描橢偏在高分辨率生物檢測的發展可能性。
薄膜在粗糙表面上在物理和光學特性的應用中，使用分解去極化矩陣模型被提出來表徵各向異性薄膜具有粗糙表面的光學和物理性能。其折射率和薄膜的厚度是使用純極化逆矩陣求得，而膜的表面粗糙度是使用偏振矩陣來表示。所提出的有效性方法藉由比較實驗結果中薄膜的有效橢圓參數分析結果折射率和厚度。結果表明所提出的方法是提供了薄膜的細或粗糙表面的光學和物理特性的可靠手段。重要地，所提出的方法不僅能夠在一個非接觸式光學方式來確定薄膜樣品的粗糙表面的粗糙度，而且還提供了比大家所知的更有效介質近似（EMA）模型通用的方法，此方法被限制能表徵低表面粗糙度的樣品。

A novel method for enhanced biological sensing is proposed based on a surface plasmon resonance (SPR) prism coupler and Stokes-Mueller matrix polarimetry technique. The coupler is illuminated with polarized light and a Stokes polarimetry approach is used to measure the change in effective ellipsometric parameters, circular birefringence (CB) values, circular dichroism (CD) values and depolarization (Dep.) as the coupler is exposed to sensing samples with different refractive indices. The theoretical analysis is performed to investigate the sensitivity of the effective ellipsometric parameters/CB/CD values to the refractive index of the detected sensing medium. The validity of the proposed method is confirmed by comparing the experimental results for the sensitivity of the effective-ellipsometric-parameters/CB/CD values with the analytical results. The results show that the sensitivity of the proposed technique was 1x10-3 degree/RIU (refractive index unit) and 1x10-5 degree/RIU for CB/CD/Dep. sensing and gas sensing, respectively. The resolutions of the proposed technique were 1x10-5 and 1x10-7 RIU for CB/CD/Dep. sensing and gas sensing, respectively. In generall, the results obtained in this study show that the measured effective-ellipsometric-parameters/CB/CD values are highly sensitive to the polarization scanning angle. Consequently, the potential of polarization scanning ellipsometry for high-resolution biological detection in confirmed.
In addition, A Mueller matrix decomposition model with depolarization matrix is proposed to characterize the optical and physical properties of anisotropic thin films with rough surfaces. The refractive index and thickness of the thin film are inversely extracted using a pure polarization matrix, and the surface roughness of the film is characterized using a depolarization matrix. The validity of the proposed method is demonstrated by comparing the experimental results for the refractive index and thickness of a thin film with the analytical results obtained using the effective ellipsometric parameters of the film. The results show that the proposed method provides a reliable means of obtaining the optical and physical properties of thin films with fine or coarse rough surfaces. Importantly, the proposed method not only enables the coarse surface roughness of thin-film samples to be determined in a non-contact optical manner, but also provides a more versatile approach than the well-known effective medium approximation (EMA) model, which is restricted to the characterization of samples with low surface roughness.

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