郎摩爾探針普遍被用來探測電離層特性的儀器，但是郎摩爾探針不適合用在奈米/微米衛星上。所以我們使用電子溫度與密度探測器(TeNeP)來量測電離層中的電子溫度和密度。TeNeP 是利用電子溫度探測器(ETP)和阻抗式探針(IP)的原理所製成。TeNeP 具有體積小、重量輕和低功耗的優點，可以符合奈米/微米衛星對儀器的要求。它可以克服郎摩爾探針(Langmuir Probe)在衛星導體面積不夠大的問題。我們發展出一個TeNeP 的系統，它利用微控制器和信號產生晶片來提供TeNeP 所需要的射頻訊號。並建立一個模擬衛星，來探討不同衛星導體表面面積對TeNeP 量測的影響。實驗結果證明TeNeP 的量測結果並不會受到衛星導體面積不夠大問題的影響。所以我們可以把TeNeP 安裝在奈米/微米衛星上來探測電離層的電子溫度與密度。

Langmuir probe is an instrument to measure the plasma characteristics in the ionosphere. But the Langmuir probe is inadequate to be deployed on nano/micro-satellites. To measure the electron temperature (Te) and electron density (Ne) in the ionosphere, we have developed the Electron Temperature and Density Probe (TeNeP). TeNeP combines the functions of the electron temperature probe (ETP) and the planar impedance probe (IP). TeNeP has advantages of small size, light weight and low power consumption and fulfills the instrument requirements onboard nano/micro-satellites. It also overcomes the problem associated with finite satellite/probe surface area ratio for DC Langmuir probes. We have developed TeNeP system by using a microcontroller and signal generator chip to produce the RF driving signal for the TeNeP circuits. We have also built a simulation satellite to investigate the effect of different satellite conductive surface area on the TeNeP measurements. We have demonstrated that the TeNeP measurements are not affected by different satellite conductive surface areas by conducting experiments in the Space Plasma Operation Chamber at the Plasma and Space Science Center of the National Cheng Kung University. Thus, TeNeP can be deployed on nano/micro-satellites to measure the electron temperature and density in the ionosphere.

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