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研究生: 陳詩文
Chen, Shi-Wen
論文名稱: 掃描離子電導顯微鏡於鑑別異質表面電荷分布之應用
Characterize Surface Charges with Heterogeneous Distributions Using Pulse Mode Scanning Ion Conductance Microscopy
指導教授: 陳巧貞
Chen, Chiao-Chen
學位類別: 碩士
Master
系所名稱: 理學院 - 化學系
Department of Chemistry
論文出版年: 2021
畢業學年度: 109
語文別: 中文
論文頁數: 148
中文關鍵詞: 掃描式離子電導顯微鏡 、3-氨基丙基三乙氧基矽烷(APTES) 、11-硫醇-1-十一醇(MCU) 、11-硫基十一烷酸(MUA) 、4-氨基苯硫酚(PATP) 、自組裝單分子層(SAM) 、異質表面電荷
外文關鍵詞: SICM, APTES, MCU, MUA, PATP, SAM, heterogeneously charged surface
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  • 掃描離子電導顯微鏡(scanning ion conductance microscopy,SICM)為一種掃描式探針顯微技術(scanning probe microscopy,SPM),使用奈米滴管作為掃描探針,能夠在完全不接觸材料的條件下,對表面進行形貌掃描取得表面結構,採用跳躍回饋模式(hopping mode)進行掃描時,可以防止探針在快速掃描下,觸碰到有著劇烈形貌變化的表面而導致表面損傷。影響界面平衡、表面反應的要素除了材料表面的組成與結構外,表面自身的電荷密度亦扮演重要角色,本實驗使用脈衝式SICM(pulse-mode SICM)對於具有異質電荷密度的材料表面進行掃描,可同時得到形貌圖及歸一化電流(normalized current)掃描圖,藉此判斷出帶電表面的極性。液相環境下進行掃描時,材料會因自身表面電荷於固-液界面形成電雙層(electric double layers,EDLs),當奈米滴管進入此區域,樣品表面電荷與探針離子電流交互作用下,產生表面誘導整流效應(surface induced rectification,SIR),將影響奈米滴管內工作電極(working electrodes)量測到的離子電流值。為了突顯表面電荷對於探針電流值的影響,透過脈衝施加較大偏壓將表面誘導整流效應放大,所量測到的電流值與探針位於本體溶液中但遠離表面,即表面誘導整流效應趨零時,相同脈衝偏壓下取得的基準電流值相除,進行電流訊號歸一化,利用歸一化電流值之變化評估材料表面的電荷差異。
      本實驗使用氣相修飾方式將3-氨基丙基三乙氧基矽烷(APTES)修飾於玻璃基板表面特定區域以創造出單純矽醇基(silanol group)表面及胺基(amino group)表面作為異質表面電荷材料,也分別將11-硫醇-1-十一醇(MCU)、11-硫基十一烷酸(MUA)及4-氨基苯硫酚(PATP)修飾於金薄膜形成自組裝單分子層(self-assembled monolayer,SAM)產生以羥基(hydroxyl group,-OH)、羧基(carboxylic acid,-COOH)及胺基(amino group,-NH2)為主的異質表面電荷材料,藉由SICM同步進行形貌掃描及歸一化電流掃描,並改變脈衝偏壓觀察正電荷表面、負電荷表面及中性電荷表面歸一化電流變化,最後透過調整溶液酸鹼度推測修飾程度。

    Scanning ion conductance microscopy (SICM) is a form of scanning probe microscopy (SPM) that uses a nanopipette filled with electrolyte solution as probe to obtain noncontact image of surface topography at nanometer scale resolution. In hopping mode, one of feedback mode in SICM, is adopted in complex surface features scanning to avoid substrate damage because the nanopipette is withdrawn and repositioned at next pixel after approaching above substrate surface to take topographical information. In addition to surface structure and atomic arrangement, surface charge density is known to play a key role in interfacial processes and chemical reaction such as colloidal science, crystal growth and nutrients uptaking in living cell surface. The trifunctional aminosilane (3-aminopropyltriethoxysilane, APTES) is modified on specific area of glass by vapor deposition to synthesize heterogeneously charged substrate which amino group is on one side and silanol group is on the other side. Self-assembly monolayer of 11-mercapto-1-undecanol (MCU) and 11-mercaptoundecanoic acid (MUA) are coated on gold thin film respectively to produce hydroxyl group (-OH) and carboxylic group (-COOH) heterogeneously charged surface. When a substrate is immersed in electrolyte solution, charged surface attracts counter ions to form an electrical double layers (EDLs). Once the nanopipette is located at the close point of charged surface, a potential pulse would be applied to amplify the ionic current response influenced by the surface-induced rectification (SIR) phenomena. Normalize the current of substrate and bulk solution pulse current, we can analyze the surface charge polarity. In this study, we demonstrate the pulse-mode measurements could record substrate topographical image and surface charge density mapping simultaneously.

    中文摘要 I Extended Abstracts III 誌謝 XV 目錄 XVII 圖目錄 XX 表目錄 XXXII 第1章 緒論與研究動機 1 第2章 文獻回顧 2 2.1 奈米滴管離子電流整流效應(ICR) 2 2.1.1 電雙層(EDLs) 2 2.1.2 奈米孔洞幾何形狀 7 2.1.3 奈米孔洞在溶液中的表面電荷 12 2.2 表面誘導整流效應與表面電荷探測 17 2.3 掃描式離子電導顯微鏡(SICM)技術與發展 21 2.3.1 探針結構 22 2.3.2 離子電流(Ion Current) 24 2.3.3 回饋控制模式(Feedback mode) 25 2.3.4 SICM之優勢與應用 30 第3章 實驗方法與材料 34 3.1 檢測探針的製備與鑑定 34 3.1.1 毛細管前處理與電解液製備 34 3.1.2 拉針參數設定及調整 36 3.1.3 將電解液填入奈米滴管 43 3.1.4 電化學鑑定方式 44 3.2 檢測樣品製備 48 3.2.1 聚二甲基矽氧烷(PDMS)翻模製備 48 3.2.2 3-氨基丙基三乙氧基矽烷(APTES)氣相沉積 48 3.2.3 11-硫醇-1-十一醇(MCU)自組裝之製備 51 3.2.4 11-硫基十一烷酸(MUA)自組裝之製備 51 3.3 檢測儀器 53 3.3.1 掃描式電子顯微鏡(SEM) 53 3.3.2 掃描式穿透式電子顯微鏡(STEM) 56 3.3.3 原子力顯微鏡(AFM) 58 3.3.4 X射線光電子能譜學(XPS) 60 3.4 掃描式離子電導顯微鏡 61 3.4.1 奈米滴管(探針)、樣品組裝與架設 62 3.4.2 材料表面形貌掃描 63 3.4.3 同步進行材料表面形貌及表面電荷掃描 65 3.4.4 接近曲線 67 第4章 結果與討論 70 4.1 奈米滴管尖端幾何形狀及電化學特性 70 4.1.1 奈米滴管尖端以STEM鑑定幾何形狀 70 4.1.2 奈米滴管以CHI鑑定電化學特性 77 4.2 異質表面電荷樣品鑑定 82 4.2.1 3-氨基丙基三乙氧基矽烷(APTES)氣相修飾之鑑定 82 4.2.2 11-硫醇-1-十一醇(MCU)自組裝之鑑定 87 4.2.3 11-硫基十一烷酸(MUA)自組裝之鑑定 91 4.3 掃描式離子電導顯微鏡對於表面形貌之探測 95 4.4 帶電表面之歸一化電流探測 99 4.4.1 單一電荷密度樣品歸一化電流探測 99 4.4.2 異質電荷材料表面之歸一化電流探測 101 4.4.2.1 以KCl作為電解質溶液 101 4.4.2.2 以PBS作為電解質溶液並調整環境pH 109 第5章 結論 140 第6章 參考文獻 141

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