簡易檢索 / 詳目顯示

研究生: 許哲瑋
Hsu, Che-Wei
論文名稱: 不同熱儲存參數下La添加對Sn-Ag-Sb無鉛銲料抗熱性與剪切強度之研究
Effect of Lanthanum Addition on Thermal Resistance and Shear Strength of Lead-Free Sn-Ag-Sb Solder Joints with Different Aging Parameters
指導教授: 李驊登
Lee, Hwa-Teng
學位類別: 碩士
Master
系所名稱: 工學院 - 機械工程學系
Department of Mechanical Engineering
論文出版年: 2010
畢業學年度: 98
語文別: 中文
論文頁數: 115
中文關鍵詞: 無鉛銲料潤濕性抗熱性剪切強度微結構界面IMC
外文關鍵詞: lead-free solder, wettability, thermal resistance, shear strength, microstructure, interfacial IMC layer
相關次數: 點閱:130下載:2
分享至:
查詢本校圖書館目錄 查詢臺灣博碩士論文知識加值系統 勘誤回報
  • 本研究之目的為探討在Sn-3Ag-2Sb無鉛銲料中添加微量的稀土元素鑭(La, 0.05, 0.1, 0.5, 1.0 wt.%)對其潤濕性、微結構、銲點剪切強度與破壞模式之影響;同時亦透過150、200℃高溫儲存至400小時,測試評估La添加量與銲點抗熱性之關係與影響。
    研究結果顯示Sn-3Ag-2Sb-xLa銲料在La元素之添加達0.05wt.%時其潤濕效果最佳,超過0.05wt.%La添加量時,其潤濕效果並沒有跟著提升;微結構方面,Sn-3Ag-2Sb-xLa主要是由β-Sn、Ag3Sn與微量LaSb化合物所構成,而隨著La添加量增加至0.5 wt.%時,基地中有LaSb化合物出現。未熱儲存下,以SAS-0.05La之微結構表現最為緻密。經150、200℃熱儲存400小時後,Sn-3.5Ag粗大化之情況最為嚴重,SAS-0.05La依保持著部份Ag3Sn散佈強化效果存在。IMC層經高溫熱儲存後之觀察結果發現,有添加La之界面IMC層,經400小時高溫熱儲存皆有抑制且較薄的現象。剪切強度方面,as-soldered情況下發現Sn-3Ag-2Sb添加La後剪切強度與延性下降,SAS-1.0La強度明顯下降最多。其主要原因在於大量LaSb化合物存在於基地使其接合性較差,於剪切試驗時裂紋易由這些應力不連續處形成,而此裂紋為造成強度與延性下降之主因。熱儲存後,斜口韌窩相較於as-soldered條件呈現較大且延展較廣,其主要是由於銲料內部軟化所致。銲料經熱儲存後其破斷模式由銲料模式轉變為混合模式,甚至在SAS-1.0La中有發現IMC破斷模式。La的添加明顯可以抑制界面層的成長,但添加至0.5wt.%La以上時, LaSb化合物之存在所造成的負面影響大於其抑制效果。因此Sn-3Ag-2Sb-xLa中, La不適合過量添加,就目前研究結果0.05 wt.%La添加量有較佳的表現。

    This study investigates the effects of trace amounts of rare earth element La addition on the wettability 、microstructure、shear strength and fracture behavior of Sn-3Ag-2Sb based solder joints. Sn-3Ag-2Sb-xLa quaternary alloy solder joints are prepared by adding 0~1.0wt% La to Sn-3Ag-2Sb alloy and then using the resulting solders to join two pure Cu rods. Those solder joints are stored isothermally at 150、200°C for up to 400 h, and the relation between the amount of La additions and the thermal resistance were also investigated.
    Experimental results show that the wettability has weak correlation with the increasing La, only the 0.05wt.% La addition shows the best wettability. In as-soldered state, the microstructure of SAS-0.05La presents the finest. After aged at 150℃ and 200℃ for 400h, the SA structure showed the most coarsened among the test samples, SAS-0.05La however, remains partial of its strength due to the existing of Ag3Sn dispersion hardening. With La addition, the growth of interfacial IMC layer of solder joints was apparently retarded. great restrained in contrast with those without La addition by isothermal aging for 400h. Shear test fracture observation of the 0.5, 1.0La samples showed the appearance of LaSb IMCs partial dispersed in the bottom of fractured dimples which lowered the shear strength and ductility, also excess of La addition lead to the formation of LaSb compound more easily, so that it contradicted the solid-solution strengthening effect of Sb. Base on experimental results, the 0.05wt.% La addition is recommend in Sn-3Ag-2Sb solder.

    摘要 I Abstract II 誌謝 III 總目錄 IV 表目錄 VI 圖目錄 VII 一、前言 1 二、文獻回顧 5 2-1無鉛銲錫發展概況 7 2-2 Sn-Ag- X 三元合金銲料 15 2-3潤濕性質試驗 24 2-4可靠度的定義與可靠度測試之目的[49] 29 2-5銲點剪切強度試驗文獻回顧 31 2-6稀土元素相關文獻回顧 35 2-7實驗目的與動機: 37 三、實驗步驟與方法 38 3-1實驗規劃 38 3-2試件製備: 41 3-3實驗內容 45 四、結果與討論 49 4-1不同合金比例之銲料主要成份相(XRD繞射分析) 49 4-2 Sn-Ag-Sb-xLa 銲料之潤濕性 55 4-3銲點微結構 61 4-3-1界面IMC層成長與形貌變化 77 4-4 Sn-Ag-Sb-xLa銲點之機械性質 86 4-4-1 Sn-Ag-Sb-xLa銲料微硬度 86 4-4-2剪切強度測試 90 4-4-3銲點破壞模式分析 98 五、結論 106 六、建議與未來方向 108 七、參考文獻 109

    1. D. Rys and P. Cox, "Directive 2002/95/EC of the European Parliament and of the Council of 27 January 2003 on the Restriction of the Use of Certain Hazardous Substances in Electrical and Electronic Equipment," Official Journal of the European Union, 2003
    2. 饒慧美, "添加Sb、Cu 對無鉛銲料Sn-Ag 銲點之機械性質及微結構研究," 國立成功大學機械研究所, 碩士論文, 2000.6
    3. 廖天龍, "添加Sb 對Sn-Ag 無鉛銲料之銲點剪切強度影響," 國立成功大學機械研究所, 碩士論文, 2001.6
    4. 楊傳鏈, "添加Sb 對Sn-Ag 無鉛銲料銲點微結構與剪切強度之影響," 國立成功大學機械研究所, 碩士論文, 2002.6
    5. 李政賢, "Sn-Ag-xSb 無鉛錫銲接點微結構與低週疲勞之研究," 國立成功大學機械研究所", 碩士論文, 2003.6
    6. 胡順源"Sn-Ag-xSb 無鉛錫銲接點與Au/Ni-P/Cu 金屬層之界面微結構與剪切強度研究"碩士論文,2003.6
    7. 宋立文, "冷卻速率及Cu/Ni-P/Au 金屬層對Sn-Ag-xSb 無鉛錫銲接點之剪切強度特性及界面微結構的影響”,2004.6
    8. X. Ma, Y. Qian, and F. Yoshida, "Effect of La on the Cu–Sn intermetallic compound (IMC) growth and solder joint reliability", Journal of Alloys and Compounds, Vol.334, 2002, pp.224-227.
    9. C.M. Wu, D.Q. Yu, C.M. Law, and L.Wang, "Microstructure and Mechanical Properties of New Lead-Free Sn-Cu-RE Solder Alloys", Journal of Electronic Materials, Vol.31, 2002, No. 9.,pp.928-932
    10. C. M. Wu, "A Promising Lead-free Material for Flip-Chip Bumping:Sn-Cu-Re", Smoienice Castle, pp.14-16.
    11. Xin Ma, Yiyu Qian , Fusahito Yoshida "Strengthening Sn60–Pb40 solder alloy by adding trace amount of La",Materials Letters Volume 52, Issues 4-5, February 2002, pp.319-322
    12. C.M.T. Law and C.M.L. Wu, " Microstructure Evolution and Shear Strength of Sn-3.5Ag-RE Lead-free BGA Solder Balls”, High Density Microsystem Design and Packaging and Component Failure Analysis, HDP '04. Proceeding of the Sixth IEEE CPMT Conference, 2004.
    13. Zhiding Xia, Zhigang Chen, Yaowu Shi, Nan Mu, and Na Sun, " Effect of Rare Earth Element Additions on the Microstructure and Mechanical Properties of Tin-Silver-Bismuth Solder", Journal of Electronic Materials, Vol. 31, No. 6, 2002,pp.564-567
    14. C.M.L. Wu, D.Q. Yu, C.M.T. Law,and L. Wang, "I Properties of lead-free solder alloys with rare earth element additions", Material Science and Engineering, R44, 2004, pp.1-44.
    15. 電子與材料編輯室, "無鉛焊接的開發動向," 電子與材料, 第一期, 1999,pp.78-84
    16. S. Jin, "Developing Lead-Free Solders: A Challenge and Opportunity," JOM: the Journal of the Minerals, Metals & Materials Society, Vol.45, 1993.7, pp.13
    17. N.C. Lee, "Getting Ready for Lead-free Solder," Soldering and Surface Mount Technology, Vol.26, No.2, 1997, pp.65-68
    18. 陳信文, "無鉛銲料簡介," 電子與材料, 第一期, 1999, pp.74-77
    19. David Suraski and Karl Seelig, "The Current Status of Lead-Free Solder Alloys," IEEE Transactions on Electronics Package Manufacturing, Vol.24, No.4, 2001,pp.244-248
    20. Dennis R. Olsen, Keith G. Spanjer, United State Patent, Patent Number :4,170,472, 1979
    21. C.L. Lin, J.L. Ou, H.C. Chen and R.K. Shiue, "The Study of Sn-Zn Based Lead-Free Solders on Au/Ni/Cu Substrate," 2002 材料年會論文集, 台灣, 台灣大學, 2002.11
    22. J.K. Lin, Ananda De Silva, Darrel Fear and Yifan Guo, "Characterization of Lead-Free Solders and Under Bimp Metallurgies for Flip-Chip Package," IEEE 2001 Electronic Components and Technology Conference, 2001
    23. Wenge Yang, Lawwrence E. Felton, Robert W. Messler, JR., "The Effect of Soldering Process Variable on the Microstructure and Mechanical Properties of Eutectic Sn-Ag/Cu Solder Joints," Journal of Electronic Materials, Vol.24, Issue 10, 1995, pp.1465-1472
    24. Mulugeta Abtew, Guna Selvaduray, "Lead-Free Solders in Microelectronics,"Materials Science and Engineering: R: Reports, Vol.27, Issue 5-6, 2000.6,pp.95-141
    25. Y. Miyazawa ,T. Ariga, "Microstructural Change and Hardness of Lead Free Solder Alloys," Environmentally Conscious Design and Inverse Manufacturing,1999. Proceedings. EcoDesign '99: First International Symposium, 1999, pp.616-619
    26. K. Zeng, K.N. Tu, "Six Case of Reliability Study of Pb-Free Solder Joient in 92 Electronic Packaging Technology," Materials Science and Engineering R, Vol.38, 2002, pp.55-105
    27. Y. Miyazawa and T. Ariga, "Influences of Aging Treatment on Microstructure and Hardness of Sn-(Ag,Bi,Zn) Eutectic Solder Alloys," Materials Transactions,Vol. 42, No.5, 2001, pp.776-782
    28. M. McCormack, H. S. Chen, G. W. Kammlott, S. Jin, "Significantly Improved Mechanical Properties of Bi-Sn Solder Alloys by Ag-Doping," Journal of Electronic Materials, Vol. 26, Issue 8, 1997, pp.954-958
    29. T.Y. Lee, W.J. Choi, and K.N. Tu, "Morphology, Kinetics, and Thermodynamics of Solid-state Aging of Eutectic SnPb and Pb-Free solders (Sn-3.5Ag, Sn-3.8Ag-0.7Cu and Sn-0.7Cu) on Cu," Journal of Materials Research, Vol.17, No.2, 2002, pp.291-301
    30. C. F. Chen(Motorola), S.K. Lahiri(SMA), P.Yuan(Motorola) and J.B.H.HOW(Motorola),"An Intermetallic Study Joints with Sn-Ag-Cu Lead-Free Solder,"Electronics Packing Technology Conference, 2000
    31. Yoshiharu Kariya and Masahisa Otsuka, "Mechanical Fatigue Characteristics of Sn-3.5Ag-X (X=Bi, Cu, Zn and In) Solder Alloy," Journal of Electronic Materials, Vol. 27, No. 11, 1998, pp. 1229-1235
    32. S. W. Yoon, C. J. Park, S. H. Hong, J. T. Moon, I. S. Park and H. S. Chun, "Interfacial Reaction and Solder Joint Reliability of Pb-Free Solders in Lead Frame Chip Scale Packages (LF-CSP)," Journal of Electronic Materials, Vol. 29, No. 10, 2000, pp. 1233-1240
    33. D. R. Frear, J. W. Jang, J. K. Lin and C. Zhang, "Pb-Free Solder for Flip-Chip Interconnects," JOM, 2001
    34. K.S. Kim , S.H. Huh , K. Suganuma, "Effects of Intermetallic Compounds on Properties of Sn–Ag–Cu Lead-Free Soldered Joints,"Journal of Alloys and Compounds Vol.352 ,2003, pp.226–236
    35. Yoshiharu Kariya and Masahisa Otsuka, "Effect of Bismuth on the Isothermal Fatigue Properties of Sn-3.5mass%Ag Solder Alloy," Journal of Electronic aterials, Vol. 27, No. 7, 1998, pp. 866-870
    36. Yoshiharu Kariya and Masahisa Otsuka, "Mechanical Fatigue Characteristics of Sn-3.5Ag-X (X=Bi, Cu, Zn and In) Solder Alloy," Journal of Electronic Materials,Vol. 27, No. 11, 1998, pp. 1229-1235
    37. S. W. Yoon, C. J. Park, S. H. Hong, J. T. Moon, I. S. Park and H. S. Chun, "Interfacial Reaction and Solder Joint Reliability of Pb-Free Solders in Lead Frame Chip Scale Packages (LF-CSP)," Journal of Electronic Materials, Vol. 29, No. 10, 2000, pp. 1233-1240
    38. Rodney J. Maccabe and Morris E.Fine, "Creep of Tin, Sb-Solution- Strengthened Tin, and SbSn-Precipitate-Strengthened Tin," Metallurgical and Materials Transaction A, Vol.33, 2002, pp.1531-1539
    39. B. Predel and W. Schwermann, "Constitution and Thermodynamics of the Antimony-Tin System," Journal of the Institute of Metals, Vol. 99, 1971, pp. 169-173
    40. G. Petzow and G. Effenberg edit, "Ternary Alloys Vol. 2," VCH Verlagsgesellschaft, 1988
    41. D. Bruce Masson and Brink K. Kirkpatrick, "Equilibrium Solidification of Sn-Ag-Sb Thermal Fatigue-Resistant Solder Alloys," Journal of Electronic Materials, Vol. 15, No. 6, 1986
    42. 許媛婷,李驊登, "利用Sn/Sb 及Sn3.5Ag/Sb 擴散實驗研究Sb 在無鉛銲料系Sn-Ag 系統中之行為, " 專題研究, 2004.7
    43. 陳明宏, 李驊登, 饒慧美, 廖天龍, "界面金屬間化合物對錫銲接點破壞行為之影響," 第七屆破壞科學研討會, 墾丁福華, 2002
    44. 1997 CERCLA Priority List of Hazardous Substances, USA
    45. http://www.nist.gov/
    46. Howard H. Manko, "Solders and soldering," McGraw-Hill Book Company, U.S.A., 1964
    47. 黃貴偉, "錫銦銀無鉛銲錫與銅及鎳基板之界面反應研究," 國立台灣大學材料科學與工程研究所, 碩士論文, 2001.6
    48. John H. Lau, "Solder Joint Reliability – Theory and Applications," Van Nostrand Reinhold, New York, 1991
    49. BJohn H. Lau, Solder Joint Reliability of Flip Chip and Plastic Ball Grid Array Assemblies Under Thermal, Mechanical and Vibration Conditions. IEEE Transaction on Components, Packaging and Manufacturing Technology PartB, Vol.19, No.4, November 1996
    50. 王照中, "電子產品之溫度循環試驗規範簡介," 電子檢測與品管, No.42,2000.4, pp.44-48
    51. N. Iosipescu, “New Accurate Procedure for Single Shear Testing of Metals,” Journal of Materials, Vol. 3, No. 2, 1967, pp.537-567
    52. ASTM Standard D5379/D5379M-98, “Standard Test Method for Shear properties of Composite Materials by the V-Notched Beam Method,” American Society for Testing of Materials, 1998
    53. ASTM Standard C1292-00, “Standard Test Method for Shear strength of Continuous Fiber-Reinforced Advanced Ceramics at Ambient Temperature,” American Society for testing of Materials American Society for Testing of Materials, 2000
    54. J. S Hwang, Z.Guo and G. Lucey, “Strengthened Solder Materials for Electronic Packaging,” Surface Mount International Conference held at San Jose, California, USA, in Auguet/September, 1993, pp.45-51
    55. Peter L. Hacke and et al., “Modeling of Thermomechanical Fatigue of 63Sn-37Pb Alloy”, Thermomechanical Fatigue Behavior of Materials Vol.1, Huseyin Sehitoglu Edit, ASTM STP 1186, 1993
    56. Z. Guo and et al., “Plastic Deformation Kinetics of Eutectic Pb-Sn Solder Joints in Monotonic Loading and Low-Cycle Fatigue,”Transactions of ASME-Journal of Electronic Packaging, Vol. 114, 1992.6, pp.112-117
    57. D. J. Barnard and I. E. Anderson, “A Shear Test Method to Measure Shear Strength of Metallic Materials and Solder Joints Using Small Specimens,” Scripta Materialia. Vol. 40. No. 3. 1999, pp.271-276
    58. Dennis R. Olsen, Keith G. Spanjer, United State Patent, Patent Number : 4,170,472, 1979
    59. Tac-Sang Park and Soon-Bok Lee, "Mechanical Fatigue Tests of Solder Joint under Mixed-mode Loading Cases," IEEE, Intel Symposium on Electronic Materials and Packaging, 2001, ASTM F1269-89
    60. "Test Methods for Destructive Shear Testing of Ball Bonds," American Society for testing of Materials, 1995
    61. ASTM F1269-89, "Test Methods for Destructive Shear Testing of Ball Bonds," American Society for testing of Materials, 1995
    62. M.O. Alam, Y.C. Chan and K.C. Hung, "Reliability Study of The Electroless Ni-P Layer Against Solder Alloy," Microelectronics Reliability, Vol.42, 2002, pp.1065-1073
    63. 2009-2012年中國稀土市場投資分析及前景預測報告,2009.05
    64. ZHIGANG CHEN, YAOWU SHI, ZHIDONG XIA, and YANFU YAN, "Properties of Lead-Free Solder SnAgCu Containing Minute Amounts of Rare Earth",Journal of ELECTRONIC MATERIALS, Vol. 32, No. 4, 2003
    65. Giles Humpston and David M. Jacobson, "Principles of Soldering and Brazing," ASM International, U.S.A., 1996
    66. 陳明宏, "添加Sb 對 Sn-Ag 無鉛銲料銲點冶金性質與機械性質之研究," 國立成功大學機械研究所, 博士論文, 2003.7
    67. Z. Mei, A. J. Sunwoo, and J. W. Morris, Jr., "Analysis of Low-Temperature Intermetallic Growth in Copper-Tin Diffusion Couples," Metallurgical Transactions A, Vol. 23A, 1992.3, pp.857-864
    68. D.R. Frear, S.N. Burchett, H.S. Morgan and J.H. Lau, "The Mechanics of Solder Alloy Interconnects," Van Nostrand Reinhold, New York, 1994

    無法下載圖示 校內:2015-07-06公開
    校外:不公開
    電子論文尚未授權公開,紙本請查館藏目錄
    QR CODE