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研究生: 林煜斌
Lin, Yu-Ping
論文名稱: 鎳鈀金PPF釘架銲線製程的研究
Study of wire bonding process for NiPdAu PPF leadframe
指導教授: 周榮華
Chou, Jung-Hua
學位類別: 碩士
Master
系所名稱: 工學院 - 工程科學系碩士在職專班
Department of Engineering Science (on the job class)
論文出版年: 2006
畢業學年度: 94
語文別: 英文
論文頁數: 116
中文關鍵詞: 鎳鈀金PPF,田口實驗設計,變異數分析
外文關鍵詞: analysis of variance, NiPdAu PPF, Taguchi design of experiment
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  • 由於環保意識的抬頭,故目前在半導體工業已廣泛地使用減少塑膠封裝電鍍製程
    的預鍍鎳鈀金基板,作為綠色產品元件。本研究針對半導體構裝中鎳鈀金PPF釘架在
    銲線製程中對釘腳銲線能力的探討,將相關影響銲線能力的鎳鈀金厚度條件、銲針
    (capillary)尺寸、金線、製程條件及參數,使用田口實驗設計及變異數分析,透過實
    驗的過程配合JUMP及MINITAB軟體進行分析,同時分析金線銲線在鎳鈀金釘腳上的
    魚尾銲接形成;再者針對鎳鈀金PPF釘架金屬微結構及表層成份分析,且探討影響釘
    腳銲線能力相關之鎳鈀金PPF釘架表層結構,以了解釘架製造與銲線製程的影響性進
    而評估封裝時釘架品質控管的方法,然後成功得構建出銲線製程最佳組
    合,有助於有效處理其他半導體構裝在鎳鈀金釘架銲線的問題。
    在這研究中得到最佳鎳鈀金金屬層的厚度,金與鈀較大的厚度能有較好的抗氧化能力, 銲線參數使用大的接觸力量和小的超音波能量,相對硬的金線, 和14°的FA(face angle)和OR(outer radius) 0.5µm的銲針尺寸在鎳鈀金PPF釘架上均有較佳的銲線強度。針對魚尾的接觸形成在鎳鈀金預鍍釘架上,它發生在金魚尾銲點與鎳鈀金薄金層上。

    Because of the growing environmental consciousness, NiPdAu PPF leadframe that eliminates plating process of plastic package is already used widely in semiconductor industry at present, as a green products component. The research is to study crescent bonding bondability on the inner finger of NiPdAu PPF leadframe. Through Taguchi methods and analysis of variance are used to evaluate related matters that influence crescent bonding bondability including thickness condition of NiPdAu, capillary dimension, gold wire type, process condition, bonding parameter. The software packages JUMP and MINITAB are used to analyze through the course of the experiment. In the mean time, the bonding formation of gold crescent bond on the inner finger of NiPdAu PPF leadframe is also examined. Thus, metal microstructure and surface morphology of NiPdAu PPF leadframe which might influence crescent bonding bondability on the inner finger can be understood. Through this study, an optimized bonding process to achieve good crescent bond bondability is obtained.

    TABLE OF CONTENTS Page Content I List of Tables V List of Figures VIII 中文介紹 一 第一章 背景與動機 一 第二章 文獻探討 三 第三章 設計與方法 四 第四章 結果與討論 五 第五章 結論與建議 七 Chapter 1 Introduction 1 1.1 Background and Motivations 1 1.1.1 NiPdAu PPF leadframe process versus silver plating leadframe 2 1.1.2 Crescent bond failure mechanisms 7 1.2 Objectives 15 1.3 Process 15 1.3.1 Comparison of material analysis for three suppliers of NiPdAu PPF leadframe 16 2 Literature Review 21 3 Design and Methodology 26 3.1 Wire bond process 26 3.2 Bond pull test 31 3.3 DOE (Design of experiment) 33 3.4 ANOVA (Analysis of Variance) 36 3.5 Material and surface morphology analysis 39 4 Results and Discussion 41 4.1 Evaluate wire-bonding bondability for the thickenss of metal layer of NiPdAu PPF leadframe through design of experiment method 41 4.1.1 1st time DOE implementation for NiPdAu PPF leadframe 42 4.1.2 2nd time DOE implementation 46 4.2 Evaluation of bonding parameter and heat treatment 56 4.2.1 Evaluation result of bonding parameter effect on the crescent bonding bondability for Ag plated and NiPdAu PPF L/F run on K&S 1488 bonder with and without heat treatment 59 4.2.2 Evaluation result of heat treatment effect on the crescent bonding bondability for Ag plated and NiPdAu PPF L/F run on K&S 1488 bonder 64 4.2.3 Evaluation result of bonding parameter effect on the crescent bonding bondability for Ag plated and NiPdAu PPF L/F run on K&S 8028 bonder with and without heat treatment 68 4.2.4 Evaluation result of heat treatment effect on the crescent bonding bondability for Ag plated and NiPdAu PPF L/F run on K&S 8028 bonder 74 4.2.5 Evaluation result of bonding parameter effect on the crescent bonding bondability for Ag plated and NiPdAu PPF L/F run on ASM AB339 bonder with and without heat treatment 77 4.2.6 Evaluation result of heat treatment effect on the crescent bonding bondability for Ag plated and NiPdAu PPF L/F run on ASM AB339 bonder 82 4.2.7 Verification of the reason of the variation of bonding bondability of NiPdAu PPF inner finger without and with heat treatment at 200°C, 1 hour, through surface analysis of EDS for 28L SSOP 160*180mm 86 4.3 Evaluate wire-bonding bondability for capillary dimension through design of experiment method 87 4.3.1 Capillary comparison of PCC and ECC capillary 88 4.3.2 DOE result for PCC capillary 90 4.3.3 DOE result for ECC capillary 91 4.3.4 Dimension measurement of crescent bond 93 4.3.5 Reconfirmation run for PCC and ECC capillary 96 4.4 The effect of bonding bondability for different kinds of gold wire 99 4.5 Contact formation analysis for crescent bond on NiPdAu PPF leadframe through metal microstructure and surface morphology analysis 104 5 Conclusions and Suggestions 113 Reference 115 LIST OF TABLES Table Page 1-1 Impurities that lead to weak bonds 10 1-2 Microhardness of each metal layers for different leadframe manufactures 18 3-1 Wire bonding cycle 27 3-2 Taguchi’s Orthogonal Array L18 (21 × 37) 34 3-3 S/N ratio definition 35 3-4 ANOVA table 37 4-1 Main variable factors and its level 42 4-2 Noise factor definition for 1st time DOE 42 4-3 DOE matrix and mean pull strength for 1st time DOE 43 4-4 Mean and SN ratio for 1st time DOE 43 4-5 Optimized thickness composition for 1st time DOE 44 4-6 Noise factor definition for 2nd time DOE 46 4-7 DOE matrix and mean pull strength without heat treatment for 2nd time DOE 46 4-8 DOE matrix and mean pull strength with heat treatment for 2nd time DOE 47 4-9 Mean and SN ratio without heat treatment for 2nd time DOE 47 4-10 Mean and SN ratio with heat treatment for 2nd time DOE 48 4-11 Optimized thickness composition without heat treatment for 2nd DOE 49 4-12 Optimized thickness composition with heat treatment for 2nd DOE 49 4-13 Comparison between reconfirmation run and predicted data 52 4-14 Bonding parameter defined 57 4-15 Actual bonding parameter defined for each bonder type 57 4-16 Summary for one-way ANOVA result of Ag plated leadframe 58 4-17 Summary for one-way ANOVA result of NiPdAu PPF leadframe 58 4-18 SEM photo of crescent bond profile without heat treatment on K&S 1488 bonder 61 4-19 SEM photo of crescent bond profile with heat treatment on K&S 1488 bonder 64 4-20 SEM photo of crescent bond profile without heat treatment on K&S 8028 bonder 70 4-21 SEM photo of crescent bond profile with heat treatment on K&S 8028 bonder 73 4-22 SEM photo of crescent bond profile without heat treatment on ASM AB339 bonder 79 4-23 SEM photo of crescent bond profile with heat treatment on ASM AB339 bonder 82 4-24 Material analysis result of leadframe between with and without heat treatment 86 4-25 Main variable factor and its level 88 4-26 Noise factor definition 88 4-27 Comparison result between PCC and ECC capillary 89 4-28 DOE matrix and result for PCC capillary 90 4-29 DOE matrix and result for ECC capillary 91 4-30 Thickness and width of crescent bond for each cell 94 4-31 Reconfirmation data for different bonder and capillary 97 4-32 Bonding parameter of K&S 8028 bonder 99 4-33 Mechanical characteristic of gold wire 99 4-34 Measurement of mechanical characteristic for gold wire 100 4-35 One-way ANOVA analysis for different kinds of gold wire 102 4-36 Thickness range of NiPdAu leadframe 105 4-37 FIB positions of different wire bonder 105 4-38 Results of metal layer measurement for ASM AB339 bonder 107 4-39 Results of metal layer measurement for K&S 1488 bonder 107 4-40 Results of metal layer measurement for K&S 8028 bonder 107 LIST OF FIGURES Figure Page 1-1 Leadframe manufacture process for slivers plating and NiPdAu pre-plating leadframes 2 1-2 IC assembly process for Ag plating and NiPdAu pre-plating leadframes .3 1-3 Comparison of plating layers structures between Sn finished and NiPdAu PPF packages 4 1-4 Palladium based PPF leadframe structures 5 1-5 Function of each metal layer 5 1-6 Typical lift crescent bond that the whole heel has been removed from the leadframe surface 8 1-7 Typical heel break failure with the rim of gold left on the finger 8 1-8 Build-up on capillary 9 1-9 Crescent bond due to inner lead plating peeling photos by SEM 10 1-10 (a) SEM photo showing a Pd-plating peeling on inner lead and (b) EDS result validates the exposed Nickel element 11 1-11 (a) Optical photos showing the dull appearance of NiPdAu leadframe samples that would generate poor bondability. SEM photos (b), (c), (d) showing bad surface condition. (e) EDS result revealed the presence of element Nickel at inner lead surface 11 1-12 (a) affected silver plated leadframe, (b) ESCA result of good bonding, (c) ESCA result of poor bonding 13 1-13 ESCA result between (a) good and (b) poor bonding on NiPdAu leadframe 14 1-14 (a) poor and (b) good bonding surface of sliver-plated leadframe by SEM 14 1-15 Crescent bond on the inner lead of NiPdAu PPF leadframe each direction for 16L TSSOP package 15 1-16 Bond pull strength on crescent bond for three kinds of leadframe manufacturer 16 1-17 Energy Dispersive Spectrometer (EDS) analysis: (a) element weight and (b) atomic concentration ratio (sputtering energy: 5KV and 15KV) 17 1-18 SEM photo of surface morphology of (a) S-700Q (b) Q-400F (c) A-100M 17 1-19 Comparison of each metal thickness of NiPdAu PPF leadframes from different manufacturers 19 1-20 The flow chart of this research 20 2-1 Bond quality at 1100K bond Cu and PPF 22 2-2 Pull test method 23 2-3 Comparison of second bond pull strength on various plated leadframes (1) Pd/Ni, (2) Au/Pd/Ni, (3) Ag 24 2-4 Analysis charts and elements conditions on their surface by AES after heating at 300°C for 30 min 24 3-1 Wire bonding mechanism 26 3-2 Wire bonding profile including 1st bond, 2nd (crescent bond), wire loop 30 3-3 Wire bonders used and their ultrasonic energy frequencies 30 3-4 Capillary features 31 3-5 Pull test profile 32 3-6 Pull position close to crescent bond 32 3-7 Broken position definition 33 3-8 Procedure of Taguchi’s design 36 4-1 Flow chart of experiment 41 4-2 Response profile for 1st time DOE 43 4-3 Mean predicted plot for 1st time DOE 44 4-4 Analysis of variance for response mean for 1st time DOE 44 4-5 Effect test for response mean for 1st time DOE 44 4-6 SN predicted plot for 1st time DOE 45 4-7 Analysis of variance for response SN for 1st time DOE 45 4-8 Effect test for response SN for 1st time DOE 45 4-9 Response profile without heat treatment for 2nd time DOE 48 4-10 Response profile with heat treatment for 2nd time DOE 48 4-11 Mean predicted plot without heat treatment for 2nd time DOE 49 4-12 Mean predicted plot with heat treatment for 2nd time DOE 49 4-13 ANOVA for response mean without heat treatment for 2nd time DOE 50 4-14 ANOVA for response mean with heat treatment for 2nd time DOE 50 4-15 Effect test for response mean without heat treatment for 2nd time DOE 50 4-16 Effect test for response mean with heat treatment for 2nd time DOE 50 4-17 SN predicted plot without heat treatment for 2nd time DOE 51 4-18 SN predicted plot with heat treatment for 2nd time DOE 51 4-19 Analysis of variance for response SN without heat treatment for 2nd time DOE 51 4-20 Analysis of variance for response SN with heat treatment for 2nd time DOE 51 4-21 Effect test for response SN without heat treatment for 2nd time DOE 52 4-22 Effect test for response SN with heat treatment for 2nd time DOE 52 4-23 Descriptive statistics of reconfirmation run of NiPdAu thickness DOE 53 4-24 SEM photo of crescent bond profile of NiPdAu PPF leadframes without heat treatment, (a) before pull test and (b) after pull test, for K&S 1488 bonder 54 4-25 SEM photo of crescent bond profile of NiPdAu PPF leadframes with heat treatment, (a) before pull test and (b) after pull test, for K&S 1488 bonder 54 4-26 SEM photo of crescent bond profile of NiPdAu PPF leadframes without heat treatment, (a) before pull test and (b) after pull test, for K&S 8028 bonder 54 4-27 SEM photo of crescent bond profile of NiPdAu PPF leadframes with heat treatment, (a) before pull test and (b) after pull test, for K&S 8028 bonder 55 4-28 SEM photo of crescent bond profile of NiPdAu PPF leadframes without heat treatment, (a) before pull test and (b) after pull test, for ASM AB339 bonder 55 4-29 SEM photo of crescent bond profile of NiPdAu PPF leadframes with heat treatment, (a) before pull test and (b) after pull test, for ASM AB339 bonder 55 4-30 Bonding mechanism of crescent bond 56 4-31 One-way analysis of bonding parameter for Ag plated L/F without heat treatment on K&S 1488 bonder 59 4-32 Broken point distribution for Ag plated L/F without heat treatment on K&S 1488 bonder 60 4-33 One-way analysis of bonding parameter for NiPdAu PPF L/F without heat treatment on K&S 1488 bonder 60 4-34 Broken point distribution for NiPdAu PPF L/F without heat treatment on K&S 1488 bonder 61 4-35 One-way analysis of bonding parameter for Ag plated L/F with heat treatment on K&S 1488 bonder 62 4-36 Broken point distribution for Ag plated L/F with heat treatment on K&S 1488 bonder 62 4-37 One-way analysis of bonding parameter for NiPdAu PPF L/F with heat treatment on K&S 1488 bonder 63 4-38 Broken point distribution for NiPdAu PPF L/F with heat treatment on K&S 1488 bonder 63 4-39 One-way analysis of pull strength, (a), (b) and (c) for Ag plated L/F with and without heat treatment on K&S 1488 bonder 65 4-40 One-way analysis of pull strength, (a), (b) and (c) for NiPdAu PPF L/F with and without heat treatment on K&S 1488 bonder 66 4-41 One-way analysis of bonding parameter for Ag plated L/F without heat treatment on K&S 8028 bonder 68 4-42 Broken point distribution for Ag plated L/F without heat treatment on K&S 8028 bonder 69 4-43 One-way analysis of bonding parameter for NiPdAu PPF L/F without heat treatment on K&S 8028 bonder 69 4-44 Broken point distribution for NiPdAu PPF L/F without heat treatment on K&S 8028 bonder 70 4-45 One-way analysis of bonding parameter for Ag plated L/F with heat treatment on K&S 8028 bonder 71 4-46 Broken point distribution for Ag plated L/F with heat treatment on K&S 8028 bonder 72 4-47 One-way analysis of bonding parameter for NiPdAu PPF L/F with heat treatment on K&S 8028 bonder 72 4-48 Broken point distribution for NiPdAu PPF L/F with heat treatment on K&S 8028 bonder 73 4-49 One-way analysis of pull strength, (a), (b) and (c) for Ag plated L/F with and without heat treatment on K&S 8028 bonder 74 4-50 One-way analysis of pull strength, (a), (b) and (c) for NiPdAu PPF L/F with and without heat treatment on K&S 8028 bonder 75 4-51 One-way analysis of bonding parameter for Ag plated L/F without heat treatment on ASM AB339 bonder 77 4-52 Broken point distribution for Ag plated L/F without heat treatment on ASM AB339 bonder 78 4-53 One-way analysis of bonding parameter for NiPdAu PPF L/F without heat treatment on ASM AB339 bonder 78 4-54 Broken point distribution for NiPdAu PPF L/F without heat treatment on ASM AB339 bonder 79 4-55 One-way analysis of bonding parameter for Ag plated L/F with heat treatment on ASM AB339 bonder 80 4-56 Broken point distribution for Ag plated L/F with heat treatment on ASM AB339 bonder 80 4-57 One-way analysis of bonding parameter for NiPdAu PPF L/F with heat treatment on ASM AB339 bonder 81 4-58 Broken point distribution for NiPdAu PPF L/F with heat treatment on ASM AB339 bonder 81 4-59 One-way analysis of pull strength, (a), (b) and (c) for Ag plated L/F with and without heat treatment on ASM AB339 bonder 83 4-60 One-way analysis of pull strength, (a), (b) and (c) for NiPdAu PPF L/F with and without heat treatment on ASM AB339 bonder 84 4-61 Flow of the experiment 87 4-62 Capillary dimension definition 88 4-63 Main effects plot of means for PCC capillary 90 4-64 Interaction plot of means for PCC capillary 90 4-65 Main effects plot of S/N ratio for PCC capillary 91 4-66 Interaction plot of S/N ratio for PCC capillary 91 4-67 Main effects plot of means for ECC capillary 92 4-68 Interaction plot of means for ECC capillary 92 4-69 Main effects plot of S/N ratio for ECC capillary 92 4-70 Interaction plot of S/N ratio for ECC capillary 93 4-71 Measurement dimension defined 93 4-72 SEM photo of crescent bond on ASM AB339 bonder 94 4-73 SEM photo of crescent bond on K&S 1488 bonder 95 4-74 SEM photo of crescent bond on K&S 8028 bonder 95 4-75 Optimized capillary dimension 96 4-76 Descriptive statistic of pull strength for PCC capillary 97 4-77 Descriptive statistic of pull strength for ECC capillary 98 4-78 SEM photo of crescent bond for optimized dimension of capillary (a), (b), (c) 98 4-79 Tensile stress-strain curves tested by Instron 5542 tensile tester machine for wire diameter 25µm 100 4-80 Comparison of heat affect zone for different kinds of gold wire K1>Y1>NT5 101 4-81 Box plot of bond pull strength for different kinds of gold wire 102 4-82 Crescent bond profile for NT5 gold wire 103 4-83 Crescent bond profile for T1 gold wire 103 4-84 Crescent bond profile for K1 gold wire 104 4-85 Thickness of Pd-layer 106 4-86 Thickness of Ni-layer 106 4-87 SEM photo of the contact interface of sample 339 with magnification: X30000 (a)339-3 (b)339-6 (c)339-9 (d)339-12 107 4-88 SEM photo of the contact interface of sample 339 with magnification: X50000 (a)339-3 (b)339-6 (c)339-9 (d)339-12 108 4-89 SEM photo of the contact interface of sample 1488 with magnification: X30000 (a)1488-3 (b)1488-6 (c)1488-9 (d)1488-12 109 4-90 SEM photo of the contact interface of sample 1488 with magnification: X50000 (a)1488-3 (b)1488-6 (c)1488-9 (d)1488-12 109 4-91 SEM photo of the contact interface of sample 8028 with magnification: X30000 (a)8028-3 (b)8028-6 (c)8028-9 (d)8028-12 110 4-92 SEM photo of the contact interface of sample 8028 with magnification: X50000 (a)8028-3 (b)8028-6 (c)8028-9 (d)8028-12 110 4-93 SEM photo of contact formation with magnification: X15000K 111 4-94 TEM photo of contact formation 112

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