簡易檢索 / 詳目顯示

研究生: 黃棋海
hwang, Chi-Hai
論文名稱: 半導體製程機台裝機安全管理之研究
Investigation on Safety Management of Semiconductor Equipments during Installation Process
指導教授: 李國賓
Lee, Guo-Bin
學位類別: 碩士
Master
系所名稱: 工學院 - 工程管理碩士在職專班
Engineering Management Graduate Program(on-the-job class)
論文出版年: 2004
畢業學年度: 92
語文別: 中文
論文頁數: 102
中文關鍵詞: 半導體SEMI製程機台危害分析
外文關鍵詞: Semiconductor, SEMI Standards, Process Tool, Ha
相關次數: 點閱:76下載:4
分享至:
查詢本校圖書館目錄 查詢臺灣博碩士論文知識加值系統 勘誤回報
  •   本研究是針對勞委會安全法規「危險性工作場所審查暨檢查辦法」對於半導體廠製程設備機台,在正式運轉生產前之安全評估方法及機台安裝兩個重要時程之安全管理加以探討。有鑑於現有文獻及參考書籍,鮮少對於半導體廠製程設備機台安裝及現行安全法規「危險性工作場所審查暨檢查辦法」是否合乎時宜深入研究。本研究分為兩大部份:(1)現行安全法規「危險性工作場所審查暨檢查辦法」之適法性(2)運用訪談的方式,針對製程設備機台安裝及運轉有實際經驗之工程師,包括半導體廠、機台供應商與廠務承攬商工程師,綜合不同角度之經驗及看法,制定一套完整的製程設備機台安裝安全檢查管理程序。
      半導體產業具有技術密集、資本密集及高風險的特性。半導體主要製造程序皆在潔淨室內進行,製程中會使用數十種不同具有自燃性、可燃性、毒性、腐蝕與惰性等高危險性質的化學品或氣體。一旦製程單元發生洩漏,將造成工作場所中人員、環境、物料與設備的危害。以往,半導體廠製程設備因為汰舊換新、擴充產能與變換位置等因素裝機,卻在生產壓力下,為縮短影響正常生產時間,未考量整體規劃,這也逐漸增加廠內危害的風險。因此,本研究根據美國斯麥半導體設備和材料國際組織(Semiconductor Equipment and Materials International, SEMI)半導體製程安全評估的方法取代現行方法並結合裝機安全檢核表(Check List)以期望由此改變能使半導體製程機台安全管理更趨完善。

      The present study investigates on validity of safety regulations and procedures set by the ROC Labor Committee which concern inspection and review methods for hazardous workplaces, especially in semiconductor industry. There have been few literatures reporting on safety evaluation methods and equipment move-in procedures, both of which are crucial steps to be undertaken prior to test run operations.
      Most of previous studies in semiconductor industry rarely explore the appropriateness of evaluation and inspection methods of hazardous workplaces with regard to semiconductor equipment move-in and existing safety rules. The current study therefore intends to develop new inspection procedures suitable for state-of-the-art IC industry.
      This study consists of two primary segments:
        1. The validity of existing safety rules for the evaluation and inspection of hazardous workplaces.
        2. Development of a new method based on interviewing semiconductor equipment/tool installers and engineers that are experienced with equipment move-in and test run operations, including semiconductor equipment suppliers and installation subcontractors. The feedback from the personnel involved in different aspects of these operations will facilitate the establishment of the procedures for safety inspections, as well as management of equipment move-in and test run operations.
      The semiconductor industry is characterized as technology/capital intensive as well as high risk. The primary production processes are conducted in a clean room environment. During the manufacture of wafers, numerous kinds of hazardous chemicals and gases are piped into the cleanroom. These chemicals and gases can be combustible, natural, toxic, corrosive or acidic, and definitely require a special cautious procedure.
      For many years production lines have been operated around the clock to meet market demands. At the same time there has been a gradual increase in the risk of hazards due to frequent tool replacement and repositioning in order to expand production capacity to meet market demands. It is quite common that equipments/tools are replaced while production lines are still in operation. Such tool move-in procedure requires precise and rapid installation. Any mistake during installation could result in severe damage to the personnel, the environment, materials or equipment.
      Consequently, the current study intends to further improve tool move-in methods and safety management by replacing existing methods with SEMI (Semiconductor Equipment and Materials International) procedures and use of safety checklists to improve safety during semiconductor tool move-in procedure.

    目 錄 授權書 II 中文摘要 III 英文摘要 V 目 錄 VIII 表 目 錄 X 圖 目 錄 XI 符號說明 XII 第一章 緒論 14 1-1 研究背景與動機 14 1-2 研究目的 15 1-3 半導體製程簡介 16 1-3-1 清洗 21 1-3-2 薄膜沈積 21 1-3-3 黃光微影 22 1-3-4 摻雜 22 1-3-5 蝕刻 23 1-4 研究架構與範圍 24 1-5 研究方法 25 第二章 文獻回顧 27 2-1 美國斯麥半導體設備和材料國際組織之安全指引 27 2-3 半導體產業危害特性 28 2-3 製程安全評估的方法 33 2-3-1 初步危害分析 34 2-3-2 檢核表分析 35 2-3-3 假設狀況分析 42 2-3-4 危害與可操作性分析 43 2-3-5 失誤模式與影響分析 45 2-3-6 故障樹分析 46 第三章 半導體製程設備機台安全管理 48 3-1 半導體製程設備機台安全評估現況 48 3-1-1 危害與可操作性(HAZOP)分析說明 50 3-1-2 危害與可操作性(HAZOP)的分析程序 57 3-2 半導體製程設備機台安全評估改善方法 58 3-3 半導體製程設備機台裝機安全檢核表製作 67 第四章 結果與討論 92 第五章 結論與展望 98 參考文獻 101

    [1] 陳清文,“半導體產業訊息觀瞻“,2003,pp.69~70.
    [2] 工研院經資中心,”ITIS計畫”,2000,pp.45.
    [3] 侯璿, “半導體製程設備拆移機風險管理研究“,交通大學研究所碩士論
    文,2003,pp.6~8.
    [4] 台灣積體電路公司簡介,2000.
    [5] 台南科學園區作業環境測定報告書,2003,pp.34~36.
    [6] 侯璿,“半導體製程設備拆移機風險管理研究“,交通大學研究所碩士論文,2003,pp.6~8
    [7] 莊達人,”VLSI製造技術、高利圖書有限公司”,1995,pp.266~267.
    [8] Semiconductor Equipment and Materials International,”Facility Standards and
    Guidelines”,1997.
    [9] 行政院勞工委員會勞工安全衛生研究所,“半導體作業安全衛生危害之探討、SEMI安全指
    引與國內法規比較”,1998,pp.2~3.
    [10] 陳政任,”半導體廠火災原因探討與風險管理策略”,2001,pp.3~4.
    [11] Factory Mutual Global 7-7,” Property Loss Prevention Data Sheets
    Semiconductor Fabrication Facilities”,2001,pp.121
    [12] 經濟部工業局,”半導體業安全衛生實務指南”,1996,pp.24~26.
    [13] 行政院勞委會,“危險物及有害物通識規則”,2002,pp.1033~1041.
    [14] 葉春陽,”半導體廠製程設備移機安全管理程序建構”,中華大學管理科學研究
    所碩士論文,2002,pp.19~20.
    [15] Electronic Industry Association of Japan,“Past accidents by
    process”,1980-2000,pp.84~85
    [16] 林瑞玉、王世煌、林敬凱、張福慶、繆慧娟,“半導體與光電製程危害分析診斷模組知
    識庫建置與應用”,pp.1~4.
    [17] 張一岑,”化工製程安全管理”,1995,pp.32~34.
    [18] 行政院勞委會,“勞工安全管理師訓練教材”,1999,pp.632~638.
    [19] 葉春陽,”半導體廠製程設備移機安全管理程序建構”,中華大學管理科學研究所碩士論
    文,2002,pp.32~33.
    [20] 行政院勞委會,“危險物有害物危險性工作場所審查及檢查研討會資料”,2000,pp.41.
    [21] 行政院勞委會,“勞工安全管理師訓練教材”,1999,pp.632~638.
    [22] 行政院勞委會,“甲類危險性工作場所審查暨檢查辦”,pp.17~18.
    [23] 工研院環安衛中心,“危險性工作場所製程安全評估(半導體班)訓練教
    材”,2003,pp.4-1~4-7.
    [24] Semiconductor Equipment and Materials International,”SEMI S10-96、Safety
    Guideline for Risk Assessment”,1996
    [25] Semiconductor Equipment and Materials International,
    “SEMI-0200, Safety Guidelines for Semiconductor Manufacturing
    Equipment”,2000.
    [26] 行政院勞工委員會,”工業安全衛生標示設置準則”,1998,pp.41.
    [27] 行政院勞工委員會,”勞工安全衛生法”,1991,pp.151~157.
    [28] 行政院勞工委員會勞工安全衛生研究所,“半導體作業安全衛生危害之探討、SEMI安全
    指引與國內法規比較”,1998,pp.48~65.

    下載圖示 校內:立即公開
    校外:2004-06-16公開
    QR CODE