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研究生: 陳勁丞
Chen, Chin-Chen
論文名稱: 基於深度學習之斜向入射適應性光學系統於快速像差調控與補償
Deep Learning-based Optical Aberration Identification and Control of a Deformable Mirror under Oblique Incidence
指導教授: 張家源
Chang, Chia-Yuan
學位類別: 碩士
Master
系所名稱: 工學院 - 機械工程學系
Department of Mechanical Engineering
論文出版年: 2026
畢業學年度: 114
語文別: 中文
論文頁數: 111
中文關鍵詞: 適應性光學可調變聚焦鏡斜向入射Shack-Hartmann波前感測器Zernike多項式深度學習GPU加速閉迴路控制
外文關鍵詞: adaptive optics, deformable mirror, oblique incidence, Shack-Hartmann wavefront sensor, Zernike polynomial, deep learning, closed-loop control
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  • 適應性光學(adaptive optics,AO)是一種透過控制波前修正元件,以即時修正光束在傳播過程中因環境擾動、介質折射率變化或系統誤差所造成波前畸變之技術,進而提升光束品質、成像解析度與聚焦效果。此技術已廣泛應用於天文觀測、光通信、組織顯微成像以及高精度雷射加工等領域。本論文選用可調變聚焦鏡(deformable mirror,DM)作為波前修正元件,並以Shack-Hartmann波前感測器(Shack-Hartmann wavefront sensor,SHWS)量測波前變化,再透過Zernike多項式作為數學模型描述光學像差組成。
    在傳統AO系統中,通常使光束垂直入射DM,並搭配分光鏡(beam splitter)完成光路分離。然而,分光鏡不僅會增加光學系統配置複雜度,也會造成額外能量損耗,對於高功率雷射或能量效率要求較高之應用將產生明顯限制。因此,本研究採用45度斜向入射DM之光路架構,取代傳統垂直入射搭配分光鏡的設計,以降低光學元件造成之能量損失,並簡化整體系統架構。然而,斜向入射會使DM膜面變形與波前響應之間的對應關係更加複雜,進而引入額外的非線性與模態耦合效應,使傳統鑑別方法[張家源2.1]在建模精度與可辨識項數上受到限制。
    為改善上述問題,本論文導入深度學習(deep learning)技術,建立深度神經網路(deep neural network,DNN)模型,以學習SHWS量測資訊、Zernike像差模態與DM驅動電壓之間的非線性映射關係。首先建立以SHWS影像為輸入之Zernike係數預測模型,直接預測前15項Zernike係數,以簡化傳統重心演算法、斜率計算與擬反矩陣求解之流程。接著進一步建立用於DM控制之DNN模型,透過聚焦點位移矩陣預測對應之DM驅動電壓,使系統能夠在斜向入射架構下完成較高階像差之鑑別與補償。實驗結果顯示,相較於傳統鑑別方法,本研究所提出之DNN鑑別方法可提升DM控制之可辨識範圍,並將Zernike可建模項數由原本8項拓展至15項。
    此外為滿足即時補償需求,本研究透過LabVIEW搭配Python Node[張家源3.1]建構跨平台控制介面,整合SHWS影像擷取、Zernike係數計算、Python模型推論、GPU加速角頻譜法模擬以及DM電壓輸出。由單次閉迴路迭代時間分析可知,整體流程約需33.958 ms,對應更新率約為29.45 Hz,顯示此系統已具備即時補償之基本能力。最後,本研究進一步以熱源與風流作為動態干擾,驗證系統於時變像差條件下之補償效果。結果顯示,所建立之斜向入射DM鑑別與閉迴路控制系統能有效降低熱干擾造成之波前畸變,並改善聚焦點品質,證明本方法應用於即時光學像差補償具有可行性。

    Adaptive optics (AO) is a real-time wavefront correction technique used to improve beam quality, imaging resolution, and focusing performance. In this study, a deformable mirror (DM) and a Shack-Hartmann wavefront sensor (SHWS) are used to measure and correct optical aberrations, which are described by Zernike polynomials. To reduce energy loss and simplify the system, this study adopts a 45-degree oblique-incidence DM configuration instead of the conventional beam-splitter-based structure. However, oblique incidence introduces nonlinear wavefront responses and modal coupling, limiting the performance of the traditional three-step identification method. Therefore, a deep neural network (DNN)-based method is proposed to identify Zernike aberrations and predict the corresponding DM driving voltages. Experimental results show that the identifiable Zernike terms are extended from 8 to 15. A real-time closed-loop control system is further implemented through LabVIEW Python Node, integrating SHWS image acquisition, model inference, GPU-accelerated simulation, and DM voltage output. The system achieves a closed-loop iteration time of 33.958 ms, corresponding to 29.45 Hz. Dynamic thermal disturbance experiments confirm that the proposed system can effectively reduce wavefront distortion and improve focal spot quality.

    摘要i Extended Abstractiii 致謝x 表目錄xiv 圖目錄xv 第一章 緒論1 1-1前言1 1-2文獻回顧3 1-3研究動機5 1-4論文架構6 第二章 波前感測器與修正元件8 2-1 Shack-Hartmann波前感測器8 2-1-1 SHWS元件介紹9 2-2-2波前重建原理12 2-2-3 Zernike多項式14 2-3 SHWS校正方法與實驗設計19 2-3-1傾斜項校正實驗流程與光路架構19 2-3-2實驗結果 21 2-3-3散焦項校正實驗流程與光路架構22 2-3-4實驗結果23 2-4可調變聚焦鏡25 第三章 深度學習神經網路與運算平台效能評估28 3-1深度學習28 3-1-1人工神經網路29 3-1-2卷積神經網路33 3-2硬體加速裝置 36 3-2-1圖形處理裝置36 3-3基於深度學習之Zernike係數預測模型38 3-3-1 SHWS影像之卷積神經網路特徵萃取與分析模型38 3-3-2用於即時控制之DM驅動電壓預測模型42 3-4不同運算平台之數學模型運算效率分析48 3-4-1動態連結函式庫48 3-4-2不同運算平台間之效能分析48 第四章 45度斜向入射之系統鑑別與控制51 4-1基於傳統演算法的三步鑑別51 4-1-1系統架構51 4-1-2建模演算法52 4-1-3利用PI控制器進行殘餘像差校正56 4-1-4線性度測試 58 4-2深度神經網路於系統鑑別之應用61 4-2-1系統架構61 4-2-2基於深度神經網路之閉迴路波前重建與像差補償流程62 4-2-3基於角頻譜法之光場傳播理論建構64 4-2-4利用DM外圍彎曲器對Z1、Z2進行補償69 4-3實驗結果70 4-3-1單一Zernike模態辨識結果70 4-3-2建立多種Zernike模態組合71 4-3-3靜態干擾補償75 4-3-4動態熱干擾補償77 第五章 結論與未來展望80 5-1結果與討論80 5-2未來展望82 5-2-1選用線性響應較佳之可調變聚焦鏡83 5-2-2提升閉迴路系統即時性83 5-2-3整合至實務光學系統之應用83 參考文獻84 附錄88

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