| 研究生: |
蔡正裕 Tsai, Chun-Yu |
|---|---|
| 論文名稱: |
多晶矽薄膜貼底排除方法之比較 Stiction Relief of Polysilicon Thin Film |
| 指導教授: |
高騏
Gau, Chi |
| 學位類別: |
碩士 Master |
| 系所名稱: |
工學院 - 航空太空工程學系 Department of Aeronautics & Astronautics |
| 論文出版年: | 2003 |
| 畢業學年度: | 91 |
| 語文別: | 中文 |
| 論文頁數: | 73 |
| 中文關鍵詞: | 壓力感測器 、面型加工 、微機電系統 、黏著效應 、二氧化碳超臨界法 、薄膜形變 |
| 外文關鍵詞: | stiction, thin film, MEMS |
| 相關次數: | 點閱:67 下載:1 |
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MEMS的面型微細加工,使得半導體製程製作之二維積層薄膜結構,得以產生三維度的懸浮微結構,利用元件結構層與犧牲層材料之間的選擇性蝕刻,將犧牲層去除而留下結構層,此過程則稱之為結構釋放。對於最廣為採用的濕式結構釋放過程,其後通常必須再經歷清洗與乾燥兩個步驟,微結構才可真正懸浮於基底之上,但是過程中卻非常容易發生結構與基底之間的黏著貼底(stiction)現象。此現象通常發生於矽晶材料所形成之立體懸浮或中空結構內,形成原因主要是受到薄膜殘留應力與界面材質的影響。目前此現象的發生已成為壓力感測器面型微細加工技術發展的最大障礙。
本實驗是要探討採用面型微加工技術來製作多晶矽感壓薄膜,其在結構釋放後所遭遇的薄膜形變問題、並提出解決方法。晶片的製作係利用國家奈米元件實驗室(NDL)及國科會南區微機電系統中心的設備進行,利用面型微細加工和犧牲層溼蝕刻技術在晶格方向(100)的p型矽晶圓上一體成型製作出多晶矽感壓薄膜,並利用高溫爐管實施1100℃的退火,以大幅降低薄膜的殘留應力,之後分別利用通入異丙醇與二氧化碳超臨界法來降低水的表面張力的影響。由實驗結果得知,吾人已成功地達到避免薄膜黏著貼底的現象,並獲得十分良好的研究成果。
Surface micromachining is a process to fabricate free standing and freely moving microstructures in a large two dimensional design space. The tick is to deposit and pattern two thin films of materials that can be etched away selectively with respect to each other. After the etch process, the sacrificial layer is removed by etching solvent. When wet etching step is finished and wafer have to be cleaned by DI water, during the drying and evaporation process, the microstructure can be easily ravaged by water capillary force and result in the deformation of structural layer . Stiction phenomenal usually occurs in the hollow construction formed by polysilicon, and its major happening reason is thin film residual stress and different interface material .This phenomenal is becoming the major obstruction in the development of micro-pressure sensors of surface micromachining.
This thesis is discussing thin film diaphragm deformation problems during the fabricating process that when using surface micromachining method to fabricate micro-pressure sensors and proffers some solving methods. The sensing chips are made by fabrication equipment in NDL and STNRC. In order to solve thin film stick problems, we not only apply methods of decreasing water capillary force by irrigating isopropyl alcohol、supercritical drying of CO2 , but also reduce residual stress under the annealing process in the high temperature furnace at 1100℃ .We have already accomplish our expectation successfully and won excellent research result .
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