| 研究生: |
許中興 Xu, Zhong-xing |
|---|---|
| 論文名稱: |
有限元素模擬探針參數之分析 A Simulation Study using Finite Element Method on Probe parametric Analysis |
| 指導教授: |
潘文峰
Pan, Wen-feng |
| 學位類別: |
碩士 Master |
| 系所名稱: |
工學院 - 工程科學系 Department of Engineering Science |
| 論文出版年: | 2009 |
| 畢業學年度: | 97 |
| 語文別: | 中文 |
| 論文頁數: | 69 |
| 中文關鍵詞: | 模擬 、探針 |
| 外文關鍵詞: | simulation, probe |
| 相關次數: | 點閱:96 下載:2 |
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探針和晶元的接觸問題,是晶圓測試的失敗關鍵之一,在測試較薄的銲墊時,是有可能下壓過深破壞晶元的現象,特別是在脆性材質低電性的銲墊測試時。因此,用3D的模型來模擬銲墊的受力與探針的力學行為,從以往到現在就一直是被工業界視為重要的研究主題,模擬分析出來的結果是用來當成探針與銲墊設計的重要前置作業。
本論文是研究主要是探討銲墊的刮痕長度、銲墊的刮痕深度與銲墊所受到的最大應力,而改變的邊界條件有針測行徑、探針的彎曲角度、探針的直徑、探針的針長。本研究成果希望有助於探針卡中探針幾何形狀的設計並提供針測條件之選擇參考。
One of the key failure in wafer testing is the contact problem between the probe and wafer. When the thinner probe pad is tested, the damage of the wafer is found for pressing the probe too deep. Especially, the brittle and low-conductivity material is tested. Therefore, up to now, the 3D model for simulating the mechanical behavior of the probe and probe pad is an important subject for industry. The result from the simulation analysis is used as the pre-operation for the design of the probe and probe pad.
The major purpose of this thesis is to investigate the over-drive, probe angle, probe diameter and probe tip length of the probe pad subjected to maximum stress condition. The changeable boundary conditions are probe paths, probe bending angles, probe diameters and probe tip lengths of the probe pad. The analysis result can hopefully provide the design choice of condition of the probe geometrical shape.
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