簡易檢索 / 詳目顯示

研究生: 林郁哲
Lin, Yu-Che
論文名稱: 精細銅微合金導線顯微組織與拉伸機械及通電性質研究
A Study on Microstructure, Tensile Mechanical and Electrical Properties of Fine Micro-alloyed Copper Wire
指導教授: 洪飛義
Hung, Fei-Yi
學位類別: 碩士
Master
系所名稱: 工學院 - 材料科學及工程學系
Department of Materials Science and Engineering
論文出版年: 2021
畢業學年度: 109
語文別: 中文
論文頁數: 87
中文關鍵詞: 銅微合金導線 、鍍層銅導線 、通電循環 、氯化 、打線接合
外文關鍵詞: Micro-alloyed copper wires (MAC), Au/Pd-coated copper wires, Power cycling, Chlorination, Wire bonding
相關次數: 點閱:162  下載:0 
分享至:
查詢本校圖書館目錄 查詢臺灣博碩士論文知識加值系統 勘誤回報
  • 在早期封裝產業中經常使用金線做為主要的打線接合材料,然而金線與鋁基板進行接合時容易產生介金屬化合物,且金價近年來居高不下,因此便開始探求其他材料來取代金線,常見的導線有銀線與銅線。銀線雖然具有非常優異的導電性及導熱性,但也容易與鋁生成介金屬化合物,且有電遷移的疑慮;而銅線除了有良好導電性與導熱性、成本具競爭力等優勢外,銅與鋁形成介金屬化合物的速率也較金及銀低。因此,本研究以銅基導線為主題進行導線可靠度的探討。
    本研究對銅線添加微量的銀、鈀及金形成創新的銅微合金導線,銀、鈀及金等貴金屬的添加可以提升導線的機械性質與化學穩定性,且微量的添加量可以避免電阻值提升。本研究將藉由機械性質與通電試驗釐清銅微合金導線與目前主流應用的鍍層銅導線在原線材及完成打線接合後的性質差異,並導入氯化試驗評估導線在應用方面的可靠度,透過全方面應用特性比較來評估銅微合金導線能否取代鍍層銅導線。
    機械性質方面,添加微量的合金元素所產生的固溶強化可以提升導線的微硬度及拉伸性質,使銅微合金導線整體的機械性質較鍍層銅導線優異。完成打線接合後,銅微合金導線第一銲點的抗拉強度也較高,顯示出良好的接合強度。
    通電性質方面,銅微合金導線在通電的前段所量測出的動態電阻值較高,這是因為微量合金元素的添加會造成少量電阻值提高,而當電流提高時,鍍層銅導線會受到更多焦耳熱的影響,鍍層的原子會擴散融進銅線材,導致電阻值快速提升,使其在較低的電流便產生熔斷。通電循環方面,鍍層銅導線因為鍍層與線材的熱膨脹係數差異,在反覆通電受熱時容易產生熱疲勞導致導線失效。
    在進行氯化試驗之後,氯離子會沿著銅微合金導線表面的晶界進行攻擊,對導線整體的拉伸性質無明顯影響,但表面的侵蝕會使通電循環壽命下降;鍍層銅導線經過氯化之後則會在表面產生小孔洞,導致拉伸性質劣化,而由於僅在鍍層上產生孔洞,對主要的電子通路影響較小,故通電循環壽命無明顯衰退。
    經過一系列的試驗,銅微合金導線具有良好的性質,在機械性質及通電性質方面都優於鍍層銅導線,具有取代鍍層銅導線的應用價值。

    關鍵字:銅微合金導線、鍍層銅導線、通電循環、氯化、打線接合

    In the early packaging industry, gold wire was often used as the main wire bonding material. However, when the gold wire is bonded to the aluminum substrate, intermetallic compounds are easily generated. In addition, the price of gold has risen in recent years, making the packaging application technology of silver wire and copper wire continue to be reported. Although silver wire has very excellent electrical and thermal conductivity, it is also easy to form intermetallic compounds with aluminum, and there are doubts about electromigration; while copper wire has good mechanical strength, electrical conductivity and thermal conductivity, and the rate of forming intermetallic compounds with aluminum substrates is lower than that of gold wire and silver wire. Therefore, this study takes copper-based wires as the subject to discuss the reliability of wires.
    In this study, a trace amount of silver, palladium and gold were added to form innovative micro-alloyed copper wires. Adding noble metal elements can improve the corrosion resistance and oxidation resistance of copper wires, and the content of alloying elements is low, which can avoid the problem of excessive resistance. In this study, the mechanical properties and electrical properties of three micro-alloyed copper wires and the current mainstream coated copper wires were tested to clarify the basic material properties of the original wires and the samples after wire bonding, and then introduce the chlorination test to evaluate the reliability of the wire in application. Evaluate whether micro-alloyed copper wires can replace coated copper wires by comparing all aspects of application characteristics.
    In terms of mechanical properties, the solid solution strengthening produced by adding a small amount of alloying elements can improve the microhardness and tensile properties of the wire, making the overall mechanical properties of the micro-alloyed copper wires better than that of the coated copper wire. After wire bonding, the micro-alloyed copper wires also have higher first bond tensile strength than the coated copper wire.
    In terms of electrical properties, the addition of trace alloying elements increases the resistances slightly, resulting in higher dynamic resistances of the MAC in the early stage of electrification. When the current increases, the CPA is affected by Joule’s heat, and the palladium atoms of the coating layer diffuse into the wire, causing the resistance to increase rapidly, resulting in a lower fusing current. In terms of power cycling test, due to the difference in coefficient of thermal expansion between the coating layer and the wire, CPA are prone to thermal fatigue and lead to failure of the wire.
    After the chlorination test, chloride ions will attack along the grain boundaries on the surface of the micro-alloyed copper wires, which has no obvious effect on the overall tensile properties of the wires, but surface erosion will reduce the electrical fatigue life. After chlorination of the coated copper wire, small holes will be formed on the surface, resulting in deterioration of tensile properties. Since holes are only formed in the plating layer, the main electronic path is less affected, so the electrical fatigue life is not significantly degraded.
    After a series of tests, the micro-alloyed copper wires have good properties and are superior to the coated copper wire in terms of mechanical properties and electrical properties. Therefore, it has the application value of replacing the coated copper wire.

    Keywords: Micro-alloyed copper wires (MAC), Au/Pd-coated copper wires,
    Power cycling, Chlorination, Wire bonding

    中文摘要 I 英文摘要 III 誌謝 XVII 目錄 XIX 圖目錄 XXIII 表目錄 XXVII 第一章 前言 1 第二章 文獻回顧 3 2-1 打線接合製程 3 2-1-1 打線接合型式 3 2-1-2 打線接合技術 4 2-2 放電結球 6 2-2-1 結球氣氛條件 6 2-2-2 結球後微觀組織 6 2-3 影響接合強度之因素 7 2-4 接合導線材料 9 2-4-1 鋁線 9 2-4-2 金線 10 2-4-3 銀基導線 10 2-4-4 銅基導線 11 2-4-5 銅微合金導線 12 2-5 氯化試驗 12 2-6 通電試驗 13 2-7 電熱效應之IMC成長 13 2-8 拉伸機械性質 14 2-9 接合界面破壞機制 14 2-10 研究目的 15 第三章 實驗步驟與方法 22 3-1 放電結球與打線接合 22 3-2 微觀組織與表面形貌觀察 23 3-3 微硬度試驗 23 3-4 拉伸試驗 24 3-4-1 線材拉伸試驗 24 3-4-2 第一銲點拉伸試驗 24 3-5 I-V曲線電性量測 24 3-5-1 線材I-V曲線電性量測 24 3-5-2 接合I-V曲線電性量測 25 3-6 通電循環試驗 25 3-6-1 線材通電循環試驗 26 3-6-2 第一銲點通電循環試驗 26 3-6-3 第二銲點通電循環試驗 26 3-7 氯化試驗 26 3-7-1 線材氯化拉伸試驗 27 3-7-2 線材氯化通電循環試驗 27 第四章 結果與討論 33 4-1 銅微合金導線與鍍層銅導線微觀組織特性 33 4-2 線材拉伸性質探討 33 4-2-1 線材拉伸性質試驗 33 4-2-2 氯化對拉伸性質之影響 34 4-3 線材電性分析 35 4-3-1 線材I-V曲線分析 35 4-3-2 線材通電循環疲勞劣化機制 36 4-3-3 氯化對通電循環之影響 36 4-3-4 通電拉伸破壞機制 37 4-4 打線接合可靠度探討 38 4-4-1 放電結球微觀組織特性 38 4-4-2 第一銲點接合強度分析 39 4-4-3 第一銲點接合電性分析 39 4-4-4 氯化對第一銲點接合電性之影響 41 4-4-5 第二銲點接合電性分析 41 4-4-6 氯化對第二銲點接合電性之影響 42 4-5 銅微合金導線應用性評估 42 第五章 結論 79 參考文獻 81

    [1] G. G. Harman, Wire Bonding in Microelectronics, 3rd ed. McGraw-Hill, 2010.
    [2] Y. H. Tian, C. Q. Wang, I. Lum, M. Mayer, J. P. Jung and Y. Zhou, "Investigation of Ultrasonic Copper Wire Wedge Bonding on Au/Ni Plated Cu Substrates at Ambient Temperature", Journal of Materials Processing Technology, 208(1), pp. 179-186, 2008.
    [3] J. L. Chen and Y. C. Lin, "A New Approach in Free Air Ball Formation Process Parameters Analysis", IEEE Transactions on Electronics Packaging Manufacturing, 23(2), pp. 116-122, 2000.
    [4] H. K. Charles, "Advanced Wire Bonding Technology: Materials, Methods, and Testing". In D. Lu, C. Wong (eds) Materials for Advanced Packaging, pp.131-198, Springer, Cham, 2017.
    [5] J. Krzanowski and N. Murdeshwar, "Deformation and Bonding Processes in Aluminum Ultrasonic Wire Wedge Bonding", Journal of Electronic Materials, 19(9), pp. 919-928, 1990.
    [6] I. Qin, A. Shah, C. Huynh and M. Meyer, "Effect of Process Parameters on Pad Damage during Au and Cu Ball Bonding Processes", Electronics Packaging Technology Conference (EPTC) on IEEE, pp. 573-578, 2009.
    [7] B. Langenecker, "Effects of Ultrasound on Deformation Characteristics of Metals", IEEE Transactions on Sonics and Ultrasonics, 13(1), pp. 1-8, 1966.
    [8] S. Murali, N. Srikanth, Y. M. Wong and C. J. Vath, "Fundamentals of Thermo-sonic Copper Wire Bonding in Microelectronics Packaging", Journal of Materials Science, 42(2), pp. 615-623, 2007.
    [9] H. Zhang, F. Wang, D. Zhang, L. Wang, Y. Hou, T. Xi, "A New Automatic Resonance Frequency Tracking Method For Piezoelectric Ultrasonic Transducers Used in Thermosonic Wire Bonding", Sensors and Actuators A: Physical, 235, pp. 140-150, 2015.
    [10] P. Liu, Li. Tong, J. Wang, L. Shi, H. Tang, "Challenges and Developments of Copper Wire Bonding Technology", Microelectronics Reliability, 52( 6), pp. 1092-1098, 2012.
    [11] S. Kaimori, T. Nonaka and A. Mizoguchi, "The Development of Cu Bonding Wire with Oxidation-Resistant Metal Coating", IEEE Transactions on Advanced Packaging, 29(2), pp. 227-231, 2006.
    [12] A. Pequegnat, H. J. Kim, M. Mayer, Y. Zhou, J. Persic and J. T. Moon, "Effect of Gas Type and Flow Rate on Cu Free Air Ball Formation in Thermosonic Wire Bonding", Microelectronics Reliability, 51, pp. 43-52, 2011.
    [13] S. Kumar, H. Kwon, Y. I. Heo, S. H. Kim, J. S. Hwang and J. T. Moon, "Thermosonic Ball Bonding Behavior and Reliability Study of Ag Alloy Wire," Electronic Packaging Technology Conference (EPTC) on IEEE, pp. 254-259, 2013.
    [14] P. S. Chauhan, A. Choubey, Z. Zhong, M. G. Pecht. Copper Wire Bonding, Springer, pp. 39-40, 2014.
    [15] 林宜璋,不同退火條件之銅導線經放電結球前後之機械性質與織構分析,國立成功大學材料科學與工程系碩士論文,民國九十六年。
    [16] 鄭傑勻,濺鍍金之銅導線成球性及打線接合可靠度研究,成功大學材料科學及工程學系碩士論文,民國一百零四年七月。
    [17] Z. W. Zhong, "Overview of Wire Bonding Using Copper Wire or Insulated Wire", Microelectronics Reliability, 51, pp. 4-12, 2011.
    [18] C. J. Hang, W. H. Song, I. Lum, M. Mayer, Y. Zhou, C. Q. Wang, J. T. Moon and J. Persic, "Effect of Electronic Flame Off Parameters on Copper Bonding Wire: Free-Air Ball Deformability, Heat Affected Zone Length, Heat Affected Zone Breaking Force", Microelectronic Engineering, 86, pp. 2094-2103, 2009.
    [19] A.B.Y. Lim, A.C.K. Chang, O. Yauw, B. Chylak, C.L. Gan, Z.Chen, "Ultra-Fine Pitch Palladium-Coated Copper Wire Bonding: Effect of Bonding Parameters", Microelectronics Reliability, 54(11), pp. 2555-2563, 2014.
    [20] G. Hu, "Comparison of Copper, Silver and Gold Wire Bonding on Interconnect Metallization", 2012 13th International Conference on Electronic Packaging Technology & High Density Packaging, Guilin, pp. 529-533, 2012.
    [21] 朱冠銘,具奈米鍍鋅層精細鋁矽導線之放電成球機制及打線接合可靠度研究,成功大學材料科學及工程學系學位論文,民國一百零五年。
    [22] H. Xu, C. Liu, V. V. Silberschmidtb, S. S. Pramanac, T. J. White, Z. Chen, and V. L. Acoff, "Intermetallic Phase Transformations in Au-Al Wire Bonds", Intermetallics, 19, pp. 1808-1816, 2011.
    [23] C. D. Breach and F. Wulff, "New Observations on Intermetallic Compound Formation in Gold Ball Bonds: General Growth Patterns and Identification of Two Forms of Au4Al", Microelectronics Reliability, 44, pp. 973-981, 2004.
    [24] M. Guerdane, "Self-Diffusion in Intermetallic Au4Al: Molecular Dynamics Study Down to Temperatures Relevant to Wire Bonding", Computational Materials Science, 29, pp. 13-23, 2017.
    [25] Y. C. Jang, S. Park, H. D. Kim, Y. C. Ko, K. W. Koo, M. R. Choi, H. G. Kim, N. K. Cho, I.T. Kang, J. H. Yee, and S. H. Lim, "Study of Intermetallic Compound Growth and Failure Mechanisms in Long Term Reliability of Silver Bonding Wire", 2014 IEEE 16th Electronics Packaging Technology Conference (EPTC), Singapore, pp. 704-708, 2014.
    [26] Y. H. Wu, F. Y. Hung, T. S. Lui and L. H. Chen, " Study of Wire Bonding Reliability of Ag-Pd-Au Alloy Wire with Flash-Gold after Chlorination and Sulfidation", Microelectronics Reliability, 99, pp. 186-196, 2019.
    [27] H. W. Hsueh, F. Y. Hung, T. S. Lui, L. H. Chen and K. J. Chen, "Intermetallic Phase on the Interface of Ag-Au-Pd/Al Structure", Advances in Materials Science and Engineering, 2014.
    [28] K. A. Yoo, C. Uhm, T. J. Kwon, J. S. Cho and J. T. Moon, "Reliability Study of Low Cost Alternative Ag bonding Wire with Various Bond Pad Materials", Electronics Packaging Technology Conference (EPTC) on IEEE, pp. 851-857, 2009.
    [29] E. Sancaktar, P. Rajput and A. Khanolkar, "Correlation of Silver Migration to the Pull Out Strength of Silver Wire Embedded in an Adhesive Matrix", IEEE Transactions on Components and Packaging Technologies, 28(4), pp. 771-780, 2005.
    [30] N. Srikanth, J. Premkumar, M. Sivakumar, Y. M. Wong and C. J. Vath, "Effect of Wire Purity on Copper Wire Bonding", Electronics Packaging Technology Conference (EPTC) on IEEE, pp. 755-759, 2007.
    [31] Z. W. Zhong, H. M. Ho, Y. C. Tan, W. C. Tan, H. M. Goh, B. H. Toh, and J. Tan, "Study of Factors Affecting the Hardness of Ball Bonds in Copper Wire Bonding", Microelectronic Engineering, 84(2), pp. 368-374, 2007.
    [32] P. Chauhan, Z.W. Zhong, and M. Pecht, "Copper Wire Bonding Concerns and Best Practices", Journal of Electronic Materials, 42(8), pp. 2415-2434, 2013.
    [33] C. Lu, "The Challenges of Copper Wire Bonding", International Microsystems Packaging Assembly and Circuits Technology Conference (IMPACT) on IEEE, pp. 1-4, 2010.
    [34] 張哲豪,鍍金鈀層精細銅導線氯化及通電破壞機制研究,成功大學材料科學及工程學系碩士論文,民國一百零九年。
    [35] D. A. Scott, Metallography and Microstructure of Ancient and Historic Metals, Marina del Rey, 1991.
    [36] P. R. Subramanian and D. E. Laughlin, " Cu-Pd (Copper-Palladium) ", Journal of Phase Equilibria, 12(2), pp. 231–243, 1991.
    [37] H. W. Hsueh, F. Y. Hung and T. S. Lui, "A Study on Electromigration-Inducing Intergranular Fracture of Fine Silver Alloy Wires", Applied Physics Letters, 110, 031902, 2017.
    [38] M. Braunovic and N. Alexandrov, "Intermetallic Compounds at Aluminum-to-Copper Electrical Interfaces: Effect of Temperature and Electric Current", IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A, 17(1), pp. 78-85, 1994.
    [39] 陳眉瑜,Ø20µm Ag-2Pd合金導線放電結球特性及打線接合界面通電效應探討,成功大學材料科學及工程學系碩士論文,民國一百零二年。
    [40] E. Salahinejad, R. E. Farsani, and L. Tayebi, "Synergistic Galvanic-Pitting Corrosion of Copper Electrical Pads Treated with Electroless Nickel-Phosphorus/Immersion Gold Surface Finish", Engineering Failure Analysis, 77, pp. 138-145, 2017.
    [41] C. S. Lee, T. Tran, D. Boyne, L. Higgins, and A. Mawer, "Copper versus Palladium Coated Copper Wire Process and Reliability Differences", 2014 IEEE 64th Electronic Components and Technology Conference (ECTC), pp. 1539-1548, 2014.
    [42] A. Y. Volkov, O. S. Novikova, A. E. Kostina, and B. D. Antonov, "Effect of Alloying with Palladium on the Electrical and Mechanical Properties of Copper", Phys. Metals Metallogr. 117(9), pp. 945–954, 2016.
    [43] H. Xu, C. Liu, V. V. Silberschmidt, S. S. Pramana, T. J. White, Z. Chen, and V. L. Acoff, "Behavior of Aluminum Oxide, Intermetallics and Voids in Cu–Al Wire Bonds", Acta Materialia, 59(14), pp. 5661-5673, 2011.
    [44] T. H. Yang, Y. M. Lin and F. Y. Ouyang, "Joule-Heating-Induced Damage in Cu-Al Wedge Bonds under Current Stressing", Journal of Electronic Materials, 43(1), pp. 270-276, 2014.

    下載圖示
    2026-07-10公開
    QR CODE