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研究生： 王宗立
Wang, Tsung-Li
論文名稱： 半導體業網路式診斷架構與系統妥善率提升機制
An e-Diagnostics Framework and System Availability Enhancing Scheme for the Semiconductor Industry
指導教授： 鄭芳田
Cheng, Fan-Tien
洪敏雄
Hung, Min-Hsiung
學位類別： 博士
Doctor
系所名稱： 電機資訊學院 - 製造工程研究所
Institute of Manufacturing Engineering
論文出版年： 2008
畢業學年度： 96
語文別： 英文
論文頁數： 89
中文關鍵詞： 電子診斷 、Interface C架構 、訊息傳輸最佳化機制 、系統妥善率增進機制 、性能評估器 、近乎零停工期
外文關鍵詞： Performance Evaluator, Near-Zero Downtime, MTOM, System Availability Enhancing Scheme, e-Diagnostics, Interface C Framework
相關次數： 點閱：120  下載：4 
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    • 本博士論文提出一個實現半導體電子診斷介面C (Interface C) 之創新架構，稱為Interface C Framework (ICF)。ICF可解決許多重要課題，例如分散式系統的互操作性、支援多端協同診斷、供應商資料分離、診斷服務與儲存的失效轉移，以及上述機制的安全性措施。而且，為了在電子診斷操作中可以透過網路有效率地自動傳輸大的檔案，本論文也發展了一個植基於網路服務技術的新式資料交換機制，稱為TurboMTOM。綜合利用了網路服務(Web Services)、信息傳輸最佳化機制(MTOM)與多執行緒程式(Multi-Threading Programming)等技術之優點，TurboMTOM除了具備容易與其他系統整合以自動交換資料之能力，在傳輸性能上也優於傳統的資料交換方法。此外，為了考量電子診斷系統的妥善率，本研究也提出了一個系統妥善率強化機制。該機制結合了一個應用叢集服務機制(APCS)及一個效能評估器(PEV)來提升系統的妥善率。APCS擁有失效轉移及狀態回復的能力。PEV則能夠推估電腦由正常進入失效的時間。因此，APCS+PEV能夠使電子診斷系統提供近乎零停工期的服務。相信本研究所研發具有Interface C、TurboMTOM及APCS+PEV等能力的電子診斷架構可以作為建構未來半導體電子診斷系統之有用參考。

    This dissertation proposes a novel e-Diagnostics framework, called Interface C framework (ICF). ICF is a possible solution for implementing Interface C of e-Diagnostics systems. ICF can solve many important issues in Interface C, such as interoperability among distributed systems, supporting remote diagnoses through multi-party collaboration, data isolation for different suppliers, diagnostics service and storage failover for assuring system performance, and the security measures related to the above issues. Besides, for efficiently and automatically transfer large data between distributed systems over network during e-Diagnostics operations, a novel Web-Services-based data exchange scheme, called TurboMTOM, is developed. By leveraging the merits of Web Services, MTOM (Message Transmission Optimization Mechanism), and the multi-threading programming, TurboMTOM not only possesses the ability of easily being integrated with other systems for automatic data exchange but also is superior to traditional data exchange methods in terms of the data transmission performance. Furthermore, for considering the system availability of e-Diagnostics systems, this work also proposes an effective system availability enhancing scheme. This scheme combines an application cluster service (APCS) scheme and a performance evaluator (PEV) to increase the system availability. APCS owns the capabilities of failover and state recovery. PEV can predict time to failure. Thus, the proposed APCS+PEV enable the e-Diagnostics system to provide services with near-zero downtime. It is believed that the developed e-Diagnostics framework with the capabilities of Interface C, TurboMTOM, and APCS+PEV can be a useful reference for implementing future e-Diagnostics systems in the semiconductor industry.

    摘 要 II ABSTRACT III 致 謝 IV ACKNOWLEDGEMENTS V FIGURE CONTENTS VIII TABLE CONTENTS X CHAPTER 1 INTRODUCTION 1 1.1 Background and Motivation 1 1.2 Research Objectives and Contents 6 1.3 Organization 9 CHAPTER 2 DEVELOPMENT OF AN INTERFACE C FRAMEWORK FOR SEMICONDUCTOR E-DIAGNOSTICS SYSTEMS 10 2.1 Architecture Design of the Interface C Framework 10 2.2 System Component Model 13 2.3 Methodologies of Major Mechanisms 15 2.3.1 Supporting N-to-N types of Remote Equipment Operations 16 2.3.2 Data Isolation for Different Suppliers 18 2.3.3 Information Security Measures 19 2.3.4 Mechanisms of Enhancing System Availability 20 2.4 Design and Implementation of System Components 24 2.5 Integration Test Results and Performance Evaluation 25 2.5.1 Integration Test Results 25 2.5.2 Performance Evaluation 28 2.6 Summary 32 CHAPTER 3 DEVELOPMENT OF WEB-SERVICES-BASED DATA EXCHANGE SCHEME FOR EFFICIENTLY TRANSFERRING LARGE DATA 33 3.1 Investigation and Comparison of Existing Data Exchange Mechanisms 33 3.2 THE PROPOSED DATA EXCHANGE SCHEME 38 3.3 Testing Results and Performance Evaluation 44 3.4 Summary 48 CHAPTER 4 A STUDY ON SYSTEM AVAILABILITY ENHANCING SCHEME 49 4.1 APCS Scheme 49 4.1.1 Failover Scheme 50 4.1.2 State Recovery Scheme and Its Software Architecture? 55 4.2 PEV Scheme 61 4.2.1 Data Collector 61 4.2.2 Detection Module 61 4.2.3 Prediction Module 65 4.2.4 Integrating PEV with APCS 69 4.3 Deployment Considerations 70 4.4 Comparisons of APCS+PEV with APCS and MSCS 72 4.5 Availability Analysis for Applying APCS+PEV 73 4.6 Illustrative Example 74 4.7 Summary 77 CHAPTER 5 CONCLUSIONS AND CONTRIBUTIONS 79 5.1 Conclusions 79 5.2 Contributions 81 REFERENCES 83

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